Showing 1 - 3 results of 3 for search 'O. Golenkov', query time: 0.01s Refine Results
  1. 1
    Measuring system for testing electrical parameters of EMCCDs of various formats
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  2. 2
    Carrier decay lifetimes in the narrow-gap Hg1 – xCdxTe at the interband and intraband excitations
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  3. 3
    Carrier decay lifetimes in the narrow-gap Hg1 – xCdxTe at the interband and intraband excitations
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