Influence of the surface roughness and oxide surface layer onto Si optical constants measured by the ellipsometry technique

by T. S. Rozouvan, L. V. Poperenko, I. A. Shaykevich
Published 2015

London forces in highly oriented pyrolytic graphite

by L. V. Poperenko, S. G. Rozouvan, I. A. Shaykevich
Published 2017

Optical properties of graphene film growing on a thin copper layer

by T. S. Rozouvan, L. V. Poperenko, V. G. Kravets, I. A. Shaykevich
Published 2016

Optical properties of thin films of titanium with transient layers on them

by V. V. Lendel, O. V. Lomakina, Yu. Melnychenko, I. A. Shaykevich
Published 2010

The role of magnetic component of a strong light field in electrostrictive effect

by L. V. Poperenko, V. V. Prorok, S. G. Rozouvan, I. A. Shaykevich
Published 2018

Ellipsometry and optical spectroscopy of low-dimensional family TMDs

by V. G. Kravets, V. V. Prorok, L. V. Poperenko, I. A. Shaykevich
Published 2017