Showing 1 - 2 results of 2 for search 'Ibrahim, K.', query time: 0.01s Refine Results
  1. 1
    Characterization of MOS structure using low-k dielectric methylsilsesquioxane with evaporated and sputtered aluminium gate
    by Aw, K.C., Ibrahim, K.
    Published 2002
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  2. 2
    Dual model describing effects of evaporated metal gate on low-k dielectric methylsilsesquioxane in metal oxide semiconductor capacitor structure
    by Aw, K.C., Ibrahim, K.
    Published 2003
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