Integral multiparameter diffractometry of nanosystems on the basis of effects of multiplicity of diffuse scattering

by A. P. Shpak, M. V. Kovalchuk, V. B. Molodkin, V. L. Nosik, S. V. Dmitriev, E. G. Len, S. I. Olikhovskij, A. I. Nizkova, V. V. Molodkin, E. V. Pervak, A. A. Katasonov, L. I. Ninichuk, A. V. Melnik
Published 2009