On application of X-ray aproximation method for studying the substructure of sufficiently perfect samples

von Malykhin, S.V., Garkusha, I.E., Makhlay, V.A., Surovitsky, S.V., Reshetnyak, M.V., Borisova, S.S.
Veröffentlicht 2017

The methodology for X-ray diffraction investigation of icosahedral quasicrystals substructure

von Bazdyreva, S.V., Fedchuk, N.V., Malykhin, S.V., Pugachov, A.T., Reshetnyak, M.V., Zubarev, E.N.
Veröffentlicht 2013

Growth and structure of WC/Si multilayer x-ray mirror

von Pershyn, Y.P., Chumak, V.S., Shypkova, I.G., Mamon, V.V., Devizenko, A.Yu., Kondratenko, V.V., Reshetnyak, M.V., Zubarev, E.N.
Veröffentlicht 2018