Depairing critical currents and self-magnetic field effects in submicron YBa₂Cu₃O₇₋δ microbridges and bicrystal junctions

von Ivanov, Z.G., Fogel, N.Ya., Yuzephovich, O.I., Stepantsov, E.A., Tzalenchuk, A.Ya.
Veröffentlicht 2004