Experimental analysis of the effects of potential-induced degradation on photovoltaic module performance parameters
Introduction. Photovoltaic (PV) power plants are subject to various forms of degradation that can impair their performance and lead to significant faults within PV systems. Among these, Potential-Induced Degradation (PID) stands out as one of the most severe, impacting the efficiency and output of P...
Збережено в:
| Дата: | 2025 |
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| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
National Technical University "Kharkiv Polytechnic Institute" and Аnatolii Pidhornyi Institute of Power Machines and Systems of NAS of Ukraine
2025
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| Теми: | |
| Онлайн доступ: | http://eie.khpi.edu.ua/article/view/316529 |
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| Назва журналу: | Electrical Engineering & Electromechanics |
Репозитарії
Electrical Engineering & Electromechanics| Резюме: | Introduction. Photovoltaic (PV) power plants are subject to various forms of degradation that can impair their performance and lead to significant faults within PV systems. Among these, Potential-Induced Degradation (PID) stands out as one of the most severe, impacting the efficiency and output of PV generators while shortening their lifespan. Problem. This phenomenon is the result of a decrease in the shunt resistance of the cells encapsulated within the PV module, directly associated with a reduction in its insulation resistance. Although extensive research has been conducted in this area, our understanding of the factors contributing to PID, as well as its detection and effects on PV systems, remains incomplete. The goal of this work is to investigate the variations in insulation resistance at the module’s glass and frame, and to map the changes in shunt resistance at the module level to identify the most vulnerable areas, characterized by lower insulation resistance values and significantly affected by PID. Methodology. This study utilizes a comparative experimental method to investigate the behavior of two identical PV modules under similar climatic conditions, where one module is exposed to voltage stress while the other remains unstressed. A high-voltage insulation resistance tester was employed to apply voltage stress between the terminals of the stressed module and its metal frame, with insulation resistance systematically measured at various points to analyze changes in electrical properties. The originality of this study lies in the estimation of the shunt resistance based on the operating voltage of the PV string, which depends on the types of grounding, climatic conditions such as temperature and humidity, as well as the position of the cell within the PV module. This estimation is correlated with the I-V characteristic curves of two PV modules, one of which is subjected to operating voltages under well-controlled environmental conditions. The results reveal that an increase in the test voltage leads to a reduction in insulation resistance, a phenomenon that becomes more pronounced in humid environments. This highlights the vulnerability of PV modules to PID, which can significantly affect their lifespan and performance, particularly through the reduction of shunt resistance and the distortion of the characteristic curve of the stressed module affected by this phenomenon, thereby causing increased difficulty in extracting its maximum power. References 30, table 3, figures 17. |
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