The mechanism of current transport in the structure Al-p-CdTe-Mo with different thickness of the base
In this paper the mechanism of current’s transport in the structure Al-p-CdTe-Mo is studied, when the thickness of the base w ≤ 10 μm. The results of study of current-voltage characteristics of the structure Al-p-Cd-Te-Mo with different thicknesses of the base and the influence of the thickness of t...
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Datum: | 2015 |
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Hauptverfasser: | Mirsagatov, Sh.A., Uteniyazov, A.K. |
Format: | Artikel |
Sprache: | English |
Veröffentlicht: |
Науковий фізико-технологічний центр МОН та НАН України
2015
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Schriftenreihe: | Физическая инженерия поверхности |
Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/108760 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Zitieren: | The mechanism of current transport in the structure Al-p-CdTe-Mo with different thickness of the base / Sh.A. Mirsagatov, A.K. Uteniyazov // Физическая инженерия поверхности. — 2015. — Т. 13, № 3. — С. 325-329. — Бібліогр.: 15 назв. — англ. |
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