Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation
The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence from pressure was designed. The radiation maximum corresponded to argon pressure...
Збережено в:
| Дата: | 2008 |
|---|---|
| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2008
|
| Назва видання: | Вопросы атомной науки и техники |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/111026 |
| Теги: |
Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
|
| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 222-224. — Бібліогр.: 2 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-111026 |
|---|---|
| record_format |
dspace |
| spelling |
irk-123456789-1110262017-01-08T03:03:54Z Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation Eliseev, S.P. Nikulin, V.Ya. Silin, P.V. Plasma diagnostics The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence from pressure was designed. The radiation maximum corresponded to argon pressure equals to 2 Torr. The full width at half-maximum of the pulse at this pressure and a voltage of 12 kV was 5 ns. The SXR radiation dependence was investigated from the capacitor banks voltage (8-14 kV) in the two ranges of energy 1.2-1.8 and 2.9-3.5 keV. At the voltage of 14 kV and an argon pressure of 2 Torr the quantity of radiation quanta was estimated about 8·10¹⁴, the total radiation energy ~ 0.2 J and power ~ 7·10⁶ W in 4π geometry. За допомогою швидкодіючих напівпровідникових детекторів типу СППД11-04 проведені виміри м'якого рентгенівського випромінювання (МРВ) з часовим дозволом 1.5 нс. Здійснено спостереження під кутами 45 і 90˚ до вертикальної осі системи. Досліджено залежність інтенсивності МРВ від тиску газу. Максимум випромінювання відповідав тискові аргону 2 Торр. Ширина рентгенівського імпульсу по напіввисоті при даному тиску і напрузі 12 кВ дорівнювала 5 нс. Була досліджена залежність МРВ від напруги конденсаторної батареї (8-14 кВ) у двох енергетичних діапазонах квантів 1.2-1.8 і 2.9-3.5 кеВ. Для даних діапазонів при напрузі 14 кВ і тиску аргону 2 Торр оцінені повна кількість квантів 8·10¹⁴, повна енергія ~ 0.2 Дж і потужність випромінювання ~ 7·10⁶ Вт у 4π. С помощью быстродействующих полупроводниковых детекторов типа СППД11-04 проведены измерения мягкого рентгеновского излучения (МРИ) с временным разрешением 1.5 нс. Осуществлено наблюдение под углами 45 и 90˚ к вертикальной оси системы. Исследована зависимость интенсивности МРИ от давления газа. Максимум излучения соответствовал давлению аргона 2 Торр. Ширина рентгеновского импульса по полувысоте при данном давлении и напряжении 12 кВ равнялась 5 нс. Была исследована зависимость МРИ от напряжения конденсаторной батареи (8-14 кВ) в двух энергетических диапазонах квантов 1.2-1.8 и 2.9-3.5 кэВ. Для данных диапазонах при напряжении 14 кВ и давлении аргона 2 Торр оценены полное количество квантов 8·10¹⁴, полная энергия ~ 0.2 Дж и мощность излучения ~ 7·10⁶ Вт в 4π. 2008 Article Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 222-224. — Бібліогр.: 2 назв. — англ. 1562-6016 PACS: 52.58.Lq, 52.59.Hq, 52.70.-m, 52.70.La http://dspace.nbuv.gov.ua/handle/123456789/111026 en Вопросы атомной науки и техники Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| topic |
Plasma diagnostics Plasma diagnostics |
| spellingShingle |
Plasma diagnostics Plasma diagnostics Eliseev, S.P. Nikulin, V.Ya. Silin, P.V. Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation Вопросы атомной науки и техники |
| description |
The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence from pressure was designed. The radiation maximum corresponded to argon pressure equals to 2 Torr. The full width at half-maximum of the pulse at this pressure and a voltage of 12 kV was 5 ns. The SXR radiation dependence was investigated from the capacitor banks voltage (8-14 kV) in the two ranges of energy 1.2-1.8 and 2.9-3.5 keV. At the voltage of 14 kV and an argon pressure of 2 Torr the quantity of radiation quanta was estimated about 8·10¹⁴, the total radiation energy ~ 0.2 J and power ~ 7·10⁶ W in 4π geometry. |
| format |
Article |
| author |
Eliseev, S.P. Nikulin, V.Ya. Silin, P.V. |
| author_facet |
Eliseev, S.P. Nikulin, V.Ya. Silin, P.V. |
| author_sort |
Eliseev, S.P. |
| title |
Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation |
| title_short |
Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation |
| title_full |
Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation |
| title_fullStr |
Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation |
| title_full_unstemmed |
Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation |
| title_sort |
soft x-ray measurement by sppd11-04 detectors on the pf “tulip” installation |
| publisher |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| publishDate |
2008 |
| topic_facet |
Plasma diagnostics |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/111026 |
| citation_txt |
Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 222-224. — Бібліогр.: 2 назв. — англ. |
| series |
Вопросы атомной науки и техники |
| work_keys_str_mv |
AT eliseevsp softxraymeasurementbysppd1104detectorsonthepftulipinstallation AT nikulinvya softxraymeasurementbysppd1104detectorsonthepftulipinstallation AT silinpv softxraymeasurementbysppd1104detectorsonthepftulipinstallation |
| first_indexed |
2025-07-08T01:31:34Z |
| last_indexed |
2025-07-08T01:31:34Z |
| _version_ |
1837040450016378880 |
| fulltext |
SOFT X-RAY MEASUREMENT BY SPPD11-04 DETECTORS
ON THE PF “TULIP” INSTALLATION
S.P. Eliseev, V.Ya. Nikulin, P.V. Silin
P.N. Lebedev Physical Institute of RAS, Moscow, Russia
The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with
exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence from
pressure was designed. The radiation maximum corresponded to argon pressure equals to 2 Torr. The full width at half-
maximum of the pulse at this pressure and a voltage of 12 kV was 5 ns. The SXR radiation dependence was
investigated from the capacitor banks voltage (8-14 kV) in the two ranges of energy 1.2-1.8 and 2.9-3.5 keV. At the
voltage of 14 kV and an argon pressure of 2 Torr the quantity of radiation quanta was estimated about 8·1014, the total
radiation energy ~ 0.2 J and power ~ 7·106 W in 4π geometry.
PACS: 52.58.Lq, 52.59.Hq, 52.70.-m, 52.70.La
1. INTRODUCTION
High-temperature plasma in the plasma focus has
attracted renewed interest in the view of the potential
applications as a high-brightness source for lithography
and soft x-ray microscopy, as a plasma fluxes source for
material properties modification [1], fast electron beams,
hard X-ray for radiography [2]. For the optimization of
plasma radiation parameters it is necessary to study the
dynamic processes in hot plasma and found the optimal
installation settings and operation factors.
X-ray methods of plasma diagnostics by the fast
semiconductor detectors are introduced in this report.
2. APPARATUS
A Mather type plasma focus device with a cylindrical
outer electrode was employed to generate soft X-rays.
The coaxial electrode diameters were 30 mm and 53 mm,
respectively. The length of anode (inner electrode) was
60 mm and cathode length was 55 mm. The W-Cu
composite material was used as an anode tip insertion to
reduce the anode SXR radiation. Condenser bank
consisted of 4x12 μF, 25 kV capacitors. All capacitors
were switched by a reduced pressure air gap. The device
was operated at the bank voltage of 8-14 kV and argon
pressure of 0.6-3.1 Torr.
Fig.1 shows a Plasma Focus with diagnostic equipment.
Fig.1. Schematic diagram of the experimental
arrangement
The evolution of the soft X-ray emission was
monitored using the SPPD11-04 PIN diode sensitive in a
range of 0.4 - 40 keV and accuracy 1.5 ns. The aperture
diameters of the detectors were equal 2.5 mm. The PIN
diode signal was recorded by 500 MHz oscillograph
(TDS-304B).
In the experiments with different voltages and
constant pressure before detectors the 15, 50 and 115
thick Be filters were used. Observation directions formed
angles 45° and 90° with respect to the chamber axis. In
the experiments with a variable argon pressure and a
constant condenser bank voltage of 12 kV (total energy of
3.6 kJ) was used a 100 μm Be filter. The vertical axis and
the observation direction were separated by 90˚.
3. RESULTS AND DISCUSSION
3.1. SXR MEASUREMENTS FROM ARGON
PRESSURE
A moment of the soft X-ray appearance with
experimental accuracy (± 10 ns) always coincided with
the maximum of the current derivative peculiarity.
Duration of the current derivative peculiarity impulse was
about 50 ns. Fig. 2 shows the dependence of the soft X-
ray intensity in the Plasma Focus from argon pressure at a
voltage of 12 kV.
0,5 1,0 1,5 2,0 2,5 3,0 3,5
0
5
10
15
20
25
R
ad
ia
tio
n
in
te
ns
ity
, *
10
-3
J
Argon pressure,Torr
I
Fig.2. Soft X-ray intensity of plasma focus discharge as a
function of argon pressure at a voltage of 12 kV and
100 μm Be filter
The amplitude of the soft X-ray signal was monotonic
rising at an argon pressure from 0.6 to 1.9 Torr. Duration
of the bell-shaped soft X-ray pulse was about 5 ns
(Fig.3a, b). After that at a following pressure rising in
spite of the amplitude decreasing, duration of the signal
began increasing. At the same time at first, we observed
two-humped shape of the signal (at 2.5 Torr the second
peak was less than the first peak Fig.3c) and then, there
was many-humped shape (at 3.1 Torr Fig.3 d). The signal
duration amounted to 50 – 70 ns.
222 PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY. 2008. № 6.
Series: Plasma Physics (14), p. 222-224.
a b
c d
Fig.3. Oscillograph traces of the current derivative in
the peculiarity region (1) and PIN diode behind 100 μm
Be filter signals (2) at voltage 12 kV and argon pressure
a) 0.6, b) 1.9, c) 2.5, d)3.1 Torr
As a result at a constant condenser bank voltage and
changeable gas pressure the radiation intensity maximum
was received about at 2 Torr argon pressure. We explain
this fact by arriving the discharge circuit and the dynamic
plasma load optimal correspondence i.e. coincidence of
the current maximum with the moment of the maximum
plasma compression. The total yield of the soft X-ray
radiation is equal about 25 mJ in 4π geometry.
3.2. SXR RADIATION IN TWO ENERGETIC
RANGES AT A DIFFERENT CONDENSER
BANK VOLTAGES
Two mutually calibrated detectors with 15 and 50 μm
Be filters were used in this experiment. The spectral
response of these filters is given in Fig. 4. We considered
that the transmission cutoffs of these filters are 1.2 and
1.8 keV respectively (energy corresponded to the filter
transition at a level 1/e). The capacitors battery voltage
was changing from 9 to 14 kV.
0 500 1000 1500 2000 2500 3000
0,0
0,2
0,4
0,6
0,8
1,0
Sp
ec
tra
l r
es
po
ns
e
Energy, eV
Be15mkm
Be50mkm
Fig.4. Spectral response of the 15 and 50 μm Be filters
In the radiation energy range more 1.2 keV the SXR
signal had compressed two-humped shape and the
duration > 10 ns. At the voltage increasing from 9 kV
(Fig. 5a,3) to 14 kV (Fig. 5d,3), the SXR signal changed
mainly due to the trailing edge broadening. At the same
time the second hump was getting more distinct and
removed from the fist one (Fig. 5b,3 and c,3). The
amplitude growth took place most of all for the second
hump.
In the radiation energy range more 1.8 keV the SXR
impulse at a voltage of 9 kV usually consisted of one
narrow (~5 ns) peak (Fig. 5.a.2). At a voltage of 11 kV
the second peak appeared (Fig. 5.b.2), it was remaining
less amplitude than the first one at all voltages. As shown
in Fig. 5.c the second peak of the channel 2 almost
amounted to the corresponded signal of the channel 3 at a
voltage of 12 kV. At a following voltage increasing the
signal broadened to 15 ns at a 14 kV (Fig. 5.d.2) and
obtained careless many-humped shape.
a b
c d
Fig.5. 1– current derivative signal in the peculiarity
region; 2 and 3 – the signals of PIN diodes, where
detector 2 was protected from plasma by 50 μm Be filter
and 3 - by 15 μm Be filter. The argon pressure was
equaled to 2.1 Torr in all experiments. a) voltage 9 kV,
b) 11 kV, c) 12 kV, d) 14 kV
At a voltage > 10 keV the beginning of the X-ray
signal is more energetic than another radiation and it pass
through the filters with little losses. The following part of
the signal, with 2-4 times more duration, always consists
of less energetic quanta and is fully absorbed by 50 μm
Be foil. This registered soft X-ray radiation lies in the
energy range 1.2-1.8 keV (7-10 Å). Its intensity is greatly
rising at a voltage increasing. The duration of this
radiation is changing from 5 to 40-60 ns when condenser
bank voltage is increased from 9 to 14 kV.
Fig.6 shows the diagram of the total SXR energy for
range Е (1.2 - 1.8) keV from the applied voltage. The
evolution of the total number of quanta N ≈ 7.5·1014, the
total energy Е = 0.18 J and the power of radiation
Р = 3.5·106 W emitted in 4π geometry was carried out for
this energy range at a voltage of 14 kV.
9 10 11 12 13 14
0
2
4
6
8
10
12
14
16
R
ad
ia
tio
n
en
er
gy
, *
10
-2
J
in
th
e
qu
an
ta
ra
ng
e
(1
.2
; 1
.8
) k
eV
Voltage, kV
I
223
Fig.6. Soft X-ray radiation intensity- applied voltage
diagram for the quanta energy range 1.2-1.8 keV
9 10 11 12 13 14
5
10
15
20
25
30
35
40
R
ad
ia
nt
e
ne
rg
y,
1
0-3
J
, K
α
Voltage, kV
I
Fig.7. Soft X-ray radiation intensity- applied voltage
diagram for the quanta energy range 2.9-3.5 keV
The radiation with the quanta energy > 2.5 keV
always passed ahead of the radiation with smaller quanta
energy and had duration from 5 to 12 ns. The amplitude
of this radiation was changing significantly at a voltage
rising from 8 to 10 kV only and then almost didn’t
increase. The fulfilled experiments with 115 μm Be filters
showed that at a voltages > 10 kV the radiation intensity
passed through 50 μm Be filters was 2-5 times as large
the radiation intensity passed through 115 μm Be filters.
This fact shows that the quanta energy was less than
3.5 keV. The radiation apparently corresponds to Ar Kα
and another Ar lines and lies in the spectral range 2.9-
3.5 keV (3.6 - 4.2 Å). For this energy range at a voltage of
14 kV the evaluation of the total number of quanta N ≈
1.2·1014, the total energy Е = 36 mJ and the power of
radiation Р = 3.5·106 W emitted in 4π geometry was
carried out. The diagram of the SXR total energy as a
function of the applied voltage for this quanta energy
range is showed in Fig. 7.
CONCLUSION
Measurements of the SXR radiation in the quanta
energy ranges 1.2-1.8 and 2.9-3.5 keV dependence on
applied voltage and argon pressure were carried out. The
optimal argon pressure about 2 Torr corresponded to the
signal duration of 5 ns was detected. The monotonic
growth of emission yield in the different energetic ranges
was observed. The evaluation of the total number of
quanta, the total energy and the power of radiation
emitted in 4π geometry was carried out for this energy
ranges at a voltage of 14 kV and argon pressure of 2 Torr.
As a result of these experiments, it can be drawn a
conclusion, that under some conditions, it is possible to
use plasma focus as the intense nanosecond spectral
switched source of the soft X-ray radiation for different
applications.
REFERENCES
1. L.I. Ivanov, A.I. Dedyurin, I.V. Borovitskaya,
O.N. Krokhin V.Ya. Nikulin, S.N. Polukhin,
A.A. Tikhomirov // Proc. of the 31st EPS Conference on
Plasma Physics, London. ECA. 2004, v. 28G, P-4.151.
2. S. Hussian, M. Shafig, R. Ahmad, A. Waheed,
M. Zakaullah // Plasma Sources. Sci. Technol. 2005,
v. 14, p. 61-69.
Article received 23.09.08.
ИЗМЕРЕНИЕ МЯГКОГО РЕНТГЕНОВСКОГО ИЗЛУЧЕНИЯ С ПОМОЩЬЮ ДЕТЕКТОРОВ
СППД11-04 НА УСТАНОВКЕ ПЛАЗМЕННЫЙ ФОКУС (ТЮЛЬПАН)
С.П. Елисеев, В.Я. Никулин, П.В. Силин
С помощью быстродействующих полупроводниковых детекторов типа СППД11-04 проведены измерения
мягкого рентгеновского излучения (МРИ) с временным разрешением 1.5 нс. Осуществлено наблюдение под
углами 45 и 90˚ к вертикальной оси системы. Исследована зависимость интенсивности МРИ от давления газа.
Максимум излучения соответствовал давлению аргона 2 Торр. Ширина рентгеновского импульса по
полувысоте при данном давлении и напряжении 12 кВ равнялась 5 нс. Была исследована зависимость МРИ от
напряжения конденсаторной батареи (8-14 кВ) в двух энергетических диапазонах квантов 1.2-1.8 и 2.9-3.5 кэВ.
Для данных диапазонах при напряжении 14 кВ и давлении аргона 2 Торр оценены полное количество квантов
8·1014, полная энергия ~ 0.2 Дж и мощность излучения ~ 7·106 Вт в 4π.
ВИМІР М'ЯКОГО РЕНТГЕНІВСЬКОГО ВИПРОМІНЮВАННЯ ЗА ДОПОМОГОЮ ДЕТЕКТОРІВ
СППД11- 04 НА УСТАНОВЦІ ПЛАЗМОВИЙ ФОКУС (ТЮЛЬПАН)
С.П. Єлисєєв, В.Я. Нікулин, П.В. Силін
За допомогою швидкодіючих напівпровідникових детекторів типу СППД11-04 проведені виміри м'якого
рентгенівського випромінювання (МРВ) з часовим дозволом 1.5 нс. Здійснено спостереження під кутами 45 і
90˚ до вертикальної осі системи. Досліджено залежність інтенсивності МРВ від тиску газу. Максимум
випромінювання відповідав тискові аргону 2 Торр. Ширина рентгенівського імпульсу по напіввисоті при
даному тиску і напрузі 12 кВ дорівнювала 5 нс. Була досліджена залежність МРВ від напруги конденсаторної
батареї (8-14 кВ) у двох енергетичних діапазонах квантів 1.2-1.8 і 2.9-3.5 кеВ. Для даних діапазонів при напрузі
14 кВ і тиску аргону 2 Торр оцінені повна кількість квантів 8·1014, повна енергія ~ 0.2 Дж і потужність
випромінювання ~ 7·106 Вт у 4π.
224
SOFT X-RAY MEASUREMENT BY SPPD11-04 DETECTORS ON THE PF “TULIP” INSTALLATION
CONCLUSION
REFERENCES
|