Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation

Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation

The soft X-ray (SXR) measurements were received with help of the fast semiconductor detectors SPPD11-04 with exposure time about 1.5 ns. Observation directions were at 45° and 90° to the chamber axis. The SXR dependence from pressure was designed. The radiation maximum corresponded to argon pressure...

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Bibliographische Detailangaben
Datum:2008
Hauptverfasser: Eliseev, S.P., Nikulin, V.Ya., Silin, P.V.
Format: Artikel
Sprache:English
Veröffentlicht: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2008
Schriftenreihe:Вопросы атомной науки и техники
Schlagworte:
Plasma diagnostics
Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/111026
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Soft X-ray measurement by SPPD11-04 detectors on the PF “Tulip” installation / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 222-224. — Бібліогр.: 2 назв. — англ.

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