Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon
The results of experiments received on the plasma focus (PF) device with energy stored equal 1.5-5 kJ are represented in this paper. Discharge integral photos were obtained with the help of the soft x-ray pinhole camera with four 250 μm apertures. Simultaneously the short X-ray pulse recording syste...
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2008
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irk-123456789-1110282017-01-08T03:03:25Z Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon Eliseev, S.P. Nikulin, V.Ya. Silin, P.V. Plasma diagnostics The results of experiments received on the plasma focus (PF) device with energy stored equal 1.5-5 kJ are represented in this paper. Discharge integral photos were obtained with the help of the soft x-ray pinhole camera with four 250 μm apertures. Simultaneously the short X-ray pulse recording system was fulfilled by the fast semiconductor detectors SPPD11-04 hided 50 μm Be filters with exposure time about 1.5 ns. The soft X-ray measurements were fulfilled in the voltage range U=8-14 kV and argon pressure 1.3-3.2 Torr. Under some conditions transition from hot spots regime to column type was observed by the 50 μm pinhole camera. With help of the 20 μm pinhole camera was estimated size of the hot spots about 13-25 μm radiated quanta with energy ≥ 1.8 keV. Представлено результати експериментів, проведених на плазмовому фокусі (ПФ) з енергією конденсаторної батареї 1.5-5 кДж. За допомогою 4-х кадрової рентгенівської камери-обскури з розмірами діафрагм близько 250 мкм були отримані інтегральні рентгенівські знімки розряду. Одночасно з цим, за допомогою напівпровідникових детекторів СППД11-04, закритих 50 мкм Ве фільтром, здійснювалася реєстрація рентгенівського випромінювання з часовим розділенням близько 1.5 нс. Виміри м'якого рентгенівського випромінювання здійснювалися в діапазоні напруг конденсаторної батареї 8-14 кВ і тисків аргону 1.3-3.2 Торр. За певних умов рентгенівською камерою-обскурой з 50 мкм- діафрагмою спостерігався перехід від пінчевого режиму до режиму гарячих точок. За допомогою 20мкм- камери-обскури були отримані розміри гарячих точок з енергією квантів > 1.8 кеВ на рівні 13-25 мкм. Представлены результаты экспериментов, проведенных на плазменном фокусе (ПФ) с энергией конденсаторной батареи 1.5-5 кДж. С помощью 4-х кадровой рентгеновской камеры-обскуры с размерами диафрагм около 250 мкм были получены интегральные рентгеновские снимки разряда. Одновременно с этим, с помощью полупроводниковых детекторов СППД11-04, закрытых 50 мкм Ве фильтром, осуществлялась регистрация рентгеновского излучения с временным разрешением около 1.5 нс. Измерения мягкого рентгеновского излучения осуществлялись в диапазоне напряжений конденсаторной батареи 8-14 кВ и давлений аргона 1.3-3.2 Торр. При определенных условиях рентгеновской камерой-обскурой с 50 мкм- диафрагмой наблюдался переход от пинчевого режима к режиму горячих точек. С помощью 20мкм- камеры-обскуры были получены размеры горячих точек с энергией квантов > 1.8 кэВ на уровне 13-25 мкм. 2008 Article Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 216-218. — Бібліогр.: 7 назв. — англ. 1562-6016 PACS: 52.58.Lq, 52.59.Hq, 52.70.-m, 52.70.La http://dspace.nbuv.gov.ua/handle/123456789/111028 en Вопросы атомной науки и техники Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
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Plasma diagnostics Plasma diagnostics |
| spellingShingle |
Plasma diagnostics Plasma diagnostics Eliseev, S.P. Nikulin, V.Ya. Silin, P.V. Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon Вопросы атомной науки и техники |
| description |
The results of experiments received on the plasma focus (PF) device with energy stored equal 1.5-5 kJ are represented in this paper. Discharge integral photos were obtained with the help of the soft x-ray pinhole camera with four 250 μm apertures. Simultaneously the short X-ray pulse recording system was fulfilled by the fast semiconductor detectors SPPD11-04 hided 50 μm Be filters with exposure time about 1.5 ns. The soft X-ray measurements were fulfilled in the voltage range U=8-14 kV and argon pressure 1.3-3.2 Torr. Under some conditions transition from hot spots regime to column type was observed by the 50 μm pinhole camera. With help of the 20 μm pinhole camera was estimated size of the hot spots about 13-25 μm radiated quanta with energy ≥ 1.8 keV. |
| format |
Article |
| author |
Eliseev, S.P. Nikulin, V.Ya. Silin, P.V. |
| author_facet |
Eliseev, S.P. Nikulin, V.Ya. Silin, P.V. |
| author_sort |
Eliseev, S.P. |
| title |
Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon |
| title_short |
Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon |
| title_full |
Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon |
| title_fullStr |
Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon |
| title_full_unstemmed |
Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon |
| title_sort |
correlation between time-resolved and integral mesurements of the soft x-ray emission in a plasma focus operated in argon |
| publisher |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України |
| publishDate |
2008 |
| topic_facet |
Plasma diagnostics |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/111028 |
| citation_txt |
Correlation between time-resolved and integral mesurements of the soft X-ray emission in a plasma focus operated in argon / S.P. Eliseev, V.Ya. Nikulin, P.V. Silin // Вопросы атомной науки и техники. — 2008. — № 6. — С. 216-218. — Бібліогр.: 7 назв. — англ. |
| series |
Вопросы атомной науки и техники |
| work_keys_str_mv |
AT eliseevsp correlationbetweentimeresolvedandintegralmesurementsofthesoftxrayemissioninaplasmafocusoperatedinargon AT nikulinvya correlationbetweentimeresolvedandintegralmesurementsofthesoftxrayemissioninaplasmafocusoperatedinargon AT silinpv correlationbetweentimeresolvedandintegralmesurementsofthesoftxrayemissioninaplasmafocusoperatedinargon |
| first_indexed |
2025-07-08T01:31:44Z |
| last_indexed |
2025-07-08T01:31:44Z |
| _version_ |
1837040460027133952 |
| fulltext |
CORRELATION BETWEEN TIME-RESOLVED AND INTEGRAL
MESUREMENTS OF THE SOFT X-RAY EMISSION IN A PLASMA FOCUS
OPERATED IN ARGON
S.P. Eliseev, V.Ya. Nikulin, P.V. Silin
P.N. Lebedev Physical Institute of RAS, Moscow, Russia
The results of experiments received on the plasma focus (PF) device with energy stored equal 1.5-5 kJ are represented in this
paper. Discharge integral photos were obtained with the help of the soft x-ray pinhole camera with four 250 μm apertures.
Simultaneously the short X-ray pulse recording system was fulfilled by the fast semiconductor detectors SPPD11-04 hided
50 μm Be filters with exposure time about 1.5 ns. The soft X-ray measurements were fulfilled in the voltage range U=8-14 kV
and argon pressure 1.3-3.2 Torr. Under some conditions transition from hot spots regime to column type was observed by the
50 μm pinhole camera. With help of the 20 μm pinhole camera was estimated size of the hot spots about 13-25 μm radiated
quanta with energy ≥ 1.8 keV.
PACS: 52.58.Lq, 52.59.Hq, 52.70.-m, 52.70.La
1. INTRODUCTION
The Plasma Focus is considered as a source for the
inertial confinement fusion (ICF) with homogeneous
irradiation of the X-ray, but also for high density
lithography, X-ray microscopy, radiography and materials
modification. There is continued interest in operating
plasma focus with different gases for higher soft X-ray
yield. Such in a number of cases plasma focus was
studied when neon [1-4], argon [4-7], hydrogen[7] or
mixtures[4] were used as the filling gases.
In our work, we studied argon plasma focus
discharge and intend to make the mechanism of the soft
X-ray generation more clearly. For this purpose
measurements with a high speed semiconductor detector
SPPD11-04 and the soft X-ray pinhole camera were used.
2. PLASMA FOCUS FACILITY
AND DIAGNOSTICS
A Mather type plasma focus facility was used to
generate a current sheet for compressing filled argon. The
discharge occurred between two single-axis electrodes.
The diameter of the inner (anode) and the outer (cathode)
electrons were 30 and 53 mm, respectively. Their lengths
were 60 and 55 mm, respectively. The condenser bank
consisted of 4x12 μF, 25 kV capacitors. The facility
operated at the bank voltage from 8 to 14 kV and the total
current did not exceed 0.4 MA at its maximum. Gas
pressure in different experiments was from 1.3 to
3.2 Torr.
Fig.1. Block diagram of the experimental setup with
different diagnostics
Fig.1 shows the block diagram of the experimental
setup with different diagnostics.
The evolution of the soft X-ray emission was
monitored using the SPPD11-04 PIN diode with a 50 μm
thick Be filter and accuracy 1.5 ns. The PIN diode signal
was recorded by 500 MHz oscillograph (TDS-304B). The
discharge integral photos were obtained with the help of a
soft X-ray pinhole camera on the RAR2494 X-ray film.
Four soft X-ray images, A, B, C and D, were
simultaneously taken though four pinholes of 250, 260,
250, 270 μm in diameter (Fig 3 and 5) or one soft X-ray
image was taken through pinhole of 48 or 20 μm in
diameter with a 50 μm Be filter. The filters, 15, 30, 50
and 150 μm Be, were attached to four pinholes,
respectively. Beryllium foil filters prevented from the
visible light emitted from the source. Spectral responses
of the filters which were employed in this experiment, are
shown in Fig. 2. Energy of radiation corresponded to an
initial intensity decrease exponent times is represented in
the Table. Combination of the applied film and the 50 μm
Be foil filter gave a registration region from 1.8 to
10 keV. Registration was produced under 90 degrees to
the vertical axis. The synchronization of the photography
moment was produced with respect to the peculiarity on
the current oscillogram recorded by the magnetic probe in
the range of 1-3 μs with the accuracy of 10 ns.
The experimental tools were operated simultaneously
to measure the plasma parameters without expecting a
shot-to-shot reproducibility.
1000 2000 3000 4000
0,0
0,2
0,4
0,6
0,8
1,0
T
ra
ns
m
is
si
on
o
f f
ilt
er
s
Energy, eV
15 µ m Be
30 µ m Be
50 µ m Be
150 µ m Be
Fig.2. Spectral response of 15, 30, 50 and 150 μm
Be filters
216 PROBLEMS OF ATOMIC SCIENCE AND TECHNOLOGY. 2008. № 6.
Series: Plasma Physics (14), p. 216-218.
Energy of radiation corresponded to an initial intensity
decrease exponent times
filter 15 μm
Be
30 μm
Be
50 μm
Be
150 μm
Be
Ee, keV 1.2 1.5 1.8 2.5
3. RESULTS AND DISCUSSION
3.1. MACROSCOPIC BEHAVIOUR
OF THE SOFT X-RAY EMISSION
AT DIFFERENT VOLTAGES
Examples of the PIN diode signals and the soft X-ray
images which were taken simultaneously are shown in
Fig. 3. Experiments were fulfilled under constant argon
pressure 1.9 Torr and different voltages from 8 to 14 kV.
The soft X-ray images were obtained by the four-pinhole
camera.
Fig.3. Oscillogram of the current derivative in the
peculiarity region (1), PIN diode behind 50 μm Be filter
signal (2) and the X-ray pinhole pictures at argon
pressure 1.9 Torr and voltage a)-9 kV, b)-10 kV,
c)-11 kV, d)-12 kV, e)-14 kV.
Pinholes’ dimensions are equal about 250 μm
It has been observed that the soft X-ray signal
obtained by the PIN diode rises almost at the moment of
the first current peculiarity (pinch maximum). The soft X-
ray image appeared only through pinhole A under voltage
8 kV (E~1.6 kJ). Hot spots with quanta energy ≤ 2.5 keV
were recorded under voltage 9 kV (Fig. 3b). Hot spots
with quanta energy ≥ 2.5 keV and intensive radiation
appeared at more voltages. Usually 1-2 most intense hot
spots set one above another at a distance about 1 mm
were generated. As shown in Figs. 3b and 3e the lower
spot was more intense generally and produced the harder
radiation. Plasma radiated in the 1.2-1.5 keV region is
also detected around and between hot spots. It can be seen
in the pinhole A that this plasma radiation increases
greatly under the more voltages. The surface of anode tip
became to radiate (E>2.5 keV) at the voltage ≥ 11 kV
and its intensity changes slightly in the voltage range
from 11 to 14 kV. Dimension of the radiate region equals
about 1 cm and coincide with the W-Cu insert dimension.
The soft X-ray PIN diode with a 50 μm Be filter became
to record a signal at a voltage 10 kV (Fig 3c). The signal
mainly consisted of one-two impulses with duration about
3-4 ns. Taking into account experiments accomplished by
the PIN diode with a 15 μm thick Be filter at the voltage
equals 14 kV, X-ray radiation consisted of two pulses
with different energy. The first impulse could pass
through 50 μm thick Be filter has duration about 10 ns.
The second impulse with less quanta energy have 40-
50 ns duration and can be absorbed by 50 μm Be filter.
Fig.4. Discharge integral photos of the 50 μm pinhole
camera and PIN diode signal behind 50 μm Be filter at
argon pressure 2 Torr and voltage a)10, b)12, c)13, d)14 kV
It can be seen in the pinhole picture Fig. 4a that the
soft X-ray emission at 10 kV voltage occur from one hot
spot. At 12 kV, as shown in Fig. 4b, the radiation is
generated in some hot spots. Further voltage increasing
creates conditions for combination of the pinch and hot
spots radiation regime (Fig. 4c and d).
In experiments with help of the 20 μm pinhole camera
was estimated size of the hot spots about 13-25 μm
radiated quanta with energy ≥ 1.8 keV.
3.2. MACROSCOPIC BEHAVIOUR OF THE SOFT
X-RAY EMISSION AT DIFFERENT FILLING
PRESSURES
The maximum X-ray intensity was record at an argon
pressure about 2 Torr (Fig. 5b). Radiation region has
more Z vertical elongation at lower pressure.
Fig.5. Oscillogram of the current derivative in the
peculiarity region (1), PIN diode behind 50 μm Be filter
signal (2) and the X-ray pinhole pictures at a bank
voltage 12 kV and an argon pressure a) 1.3, b) 1.9, c) 2.5,
d) 3.2 Torr. Pinholes’ dimensions are equal about 250
μm
217
The region of hot spots generation contracts in
vertical to 3 mm and expands in axial direction ~ 1mm at
higher pressure (Fig. 5c and d). X-ray signal consist of
many impulses lied in time interval from 40 to 70 ns. The
signal amplitude is lower at these conditions. The
brightest hot spot lies about anode in the most
experiments and responsible for X-ray radiation with
E > 2.8 keV.
CONCLUSION
Mainly the Soft X-ray radiation of argon plasma is
generated in the hot spots regime. In some cases of
condenser bank energy increasing the transition to
columned regime was registered. Minimal size of the hot
spots estimated in our experiment was about 20 μm. It
was determined that usually quantity of the hot spots and
impulses, registered by PIN diode detectors, are equal.
The exceptions can be explained by that some impulses
were not resolved by register system < 1.5 ns. It was
defined that duration of each X-ray impulse ≤ 3-4 ns.
REFERENCES
1. S.P. Eliseev, V.Ya. Nikulin, A.V. Oginov,
A.A. Tikhomirov // Problems of Atomic Science and
Technology. Ser. “Plasma Phys” (12). 2006, v. 6, p. 147.
2. M.Liu, X. Feng, S.V. Springham, and S. Lee // IEEE
Transactions on Plasma Science.1998, v. 26, p.135.
3 N.V. Filippov, T.I. Filippova, I.V. Khutoretskaia,
V.V. Mialton, and V.P. Vinogradov //Phys. Lett. A. 1996,
v. 211, p. 168.
4. M. Zakaullah, I. Ahmed, A.R. Omer, G. Murtaza, and
M.M. Beg // Plasma Sources Sci. Technol. 1996, v. 5,
p. 544.
5. C. Mang Ng, S.P. Moo, and C.S. Wong//IEEE Trans.
Plasma Sci. 1998, v. 26, p. 1146.
6. R. Lebert, A. Engel, and W. J. Neff // J. Appl. Phys.
1995, v. 78, p. 6414.
7. M. Zakaullah, K. Alamgir, M. Shafiq, M. Sharif,
A. Waheed, and G. Murtaza //Journal of Fusion Energy.
2000, v. 19, № 2, p. 143.
Article received 30.09.08.
СВЯЗЬ МЕЖДУ ИЗМЕРЕНИЯМИ МЯГКОГО РЕНТГЕНОВСКОГО ИЗЛУЧЕНИЯ С ВРЕМЕННЫМ
И ПРОСТРАНСТВЕННЫМ РАЗРЕШЕНИЯМИ ДЛЯ ПЛАЗМЕННОГО ФОКУСА, РАБОТАЮЩЕГО
С АРГОНОМ
С.П. Елисеев, В.Я. Никулин, П.В. Силин
Представлены результаты экспериментов, проведенных на плазменном фокусе (ПФ) с энергией
конденсаторной батареи 1.5-5 кДж. С помощью 4-х кадровой рентгеновской камеры-обскуры с размерами
диафрагм около 250 мкм были получены интегральные рентгеновские снимки разряда. Одновременно с этим, с
помощью полупроводниковых детекторов СППД11-04, закрытых 50 мкм Ве фильтром, осуществлялась
регистрация рентгеновского излучения с временным разрешением около 1.5 нс. Измерения мягкого
рентгеновского излучения осуществлялись в диапазоне напряжений конденсаторной батареи 8-14 кВ и
давлений аргона 1.3-3.2 Торр. При определенных условиях рентгеновской камерой-обскурой с 50 мкм-
диафрагмой наблюдался переход от пинчевого режима к режиму горячих точек. С помощью 20мкм- камеры-
обскуры были получены размеры горячих точек с энергией квантов > 1.8 кэВ на уровне 13-25 мкм.
ЗВ'ЯЗОК МІЖ ВИМІРАМИ М'ЯКОГО РЕНТГЕНІВСЬКОГО ВИПРОМІНЮВАННЯ З ЧАСОВИМ
І ПРОСТОРОВИМ РОЗДІЛЕННЯМ ДЛЯ ПЛАЗМОВОГО ФОКУСА, ЩО ПРАЦЮЄ З АРГОНОМ
С.П. Єлисєєв, В.Я. Нікулін, П.В. Силін
Представлено результати експериментів, проведених на плазмовому фокусі (ПФ) з енергією конденсаторної
батареї 1.5-5 кДж. За допомогою 4-х кадрової рентгенівської камери-обскури з розмірами діафрагм близько
250 мкм були отримані інтегральні рентгенівські знімки розряду. Одночасно з цим, за допомогою
напівпровідникових детекторів СППД11-04, закритих 50 мкм Ве фільтром, здійснювалася реєстрація
рентгенівського випромінювання з часовим розділенням близько 1.5 нс. Виміри м'якого рентгенівського
випромінювання здійснювалися в діапазоні напруг конденсаторної батареї 8-14 кВ і тисків аргону 1.3-3.2 Торр.
За певних умов рентгенівською камерою-обскурой з 50 мкм- діафрагмою спостерігався перехід від пінчевого
режиму до режиму гарячих точок. За допомогою 20мкм- камери-обскури були отримані розміри гарячих точок
з енергією квантів > 1.8 кеВ на рівні 13-25 мкм.
218
CORRELATION BETWEEN TIME-RESOLVED AND INTEGRAL MESUREMENTS OF THE SOFT X-RAY EMISSION IN A PLASMA FOCUS OPERATED IN ARGON
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