X-ray lines relative intensity depending on detector efficiency, foils and cases thickness for primary and scattered spectra
Primary and Compton scattered radiation spectra from radioactive source ²⁴¹Am were measured in various geometry and for various targets. Spectral lines intensity of characteristic X-ray radiation (CXR), Compton and Rayleigh scattering are defined. The back scattering peak for a line 59.54 keV was ex...
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| Datum: | 2011 |
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| Hauptverfasser: | , , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2011
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| Schriftenreihe: | Вопросы атомной науки и техники |
| Schlagworte: | |
| Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/111134 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | X-ray lines relative intensity depending on detector efficiency, foils and cases thickness for primary and scattered spectra / G.L.Bochek, O.S.Deiev, N.I.Maslov, V.K.Voloshyn // Вопросы атомной науки и техники. — 2011. — № 3. — С. 42-49. — Бібліогр.: 12 назв. — англ. |