XRF with a primary X-rays from the target with monoisotopical surface layer

The development is presented of X-Rays fluorescence analysis using as primary source proton induced X-Rays emission. It is offered to make primary target as double-layer using as the backing natural intermixture of isotopes, and as the upper layer - an isotope with the highest threshold of (p,n)-rea...

Повний опис

Збережено в:
Бібліографічні деталі
Дата:2016
Автори: Levenets, V., Omelnik, O., Shchur, A.
Формат: Стаття
Мова:English
Опубліковано: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2016
Назва видання:Вопросы атомной науки и техники
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/111742
Теги: Додати тег
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:XRF with a primary X-rays from the target with monoisotopical surface layer / V. Levenets, O. Omelnik, A. Shchur // Вопросы атомной науки и техники. — 2016. — № 1. — С. 99-101. — Бібліогр.: 3 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
Опис
Резюме:The development is presented of X-Rays fluorescence analysis using as primary source proton induced X-Rays emission. It is offered to make primary target as double-layer using as the backing natural intermixture of isotopes, and as the upper layer - an isotope with the highest threshold of (p,n)-reaction for given element. Such target allows to reach lower detection limits by decreasing of background γ-emission from (p,n)-reactions. The making of target from copper, nickel, zirconium, and molybdenum are discussed. The presented approach has been used for elemental analysis of the samples of zirconium compounds and alloys, soils, plants and sediments.