U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding

С использованием метода, основанного на ультрамалоугловом рассеивании нейтронов, выполнен анализ размеров пор диаметром 100 нм ... 25 мкм в полученных инжекционной формовкой образцах из никель-титанового сплава (с памятью формы) до и после обработки импульсным электрическим током. При обработке обра...

Повний опис

Збережено в:
Бібліографічні деталі
Дата:2010
Автори: Giuliani, A., Calbucci, V., Fiori, F., Imgrund, P., Babutskiic, A.I.
Формат: Стаття
Мова:English
Опубліковано: Інститут проблем міцності ім. Г.С. Писаренко НАН України 2010
Назва видання:Проблемы прочности
Теми:
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/112017
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding / A. Giuliani, V. Calbucci, F. Fiori, P. Imgrund, A.I. Babutskiic // Проблемы прочности. — 2010. — № 6. — С. 137-145. — Бібліогр.: 19 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-112017
record_format dspace
spelling irk-123456789-1120172017-01-17T03:02:52Z U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding Giuliani, A. Calbucci, V. Fiori, F. Imgrund, P. Babutskiic, A.I. Научно-технический раздел С использованием метода, основанного на ультрамалоугловом рассеивании нейтронов, выполнен анализ размеров пор диаметром 100 нм ... 25 мкм в полученных инжекционной формовкой образцах из никель-титанового сплава (с памятью формы) до и после обработки импульсным электрическим током. При обработке образцов поры диаметром меньше 4 мкм коалесцируют, а поры диаметром больше 4 мкм уменьшаются в размерах. Із використанням методу, що базується на ультрамалокутовому розсіянні нейтронів, проаналізовано розміри пор діаметром 100 нм...25 мкм в отриманих інжекційним формуванням зразках нікель-титанового сплаву (із пам’яттю форми) до і після обробки імпульсним електричним струмом. При обробці зразків пори діаметром, який менше за 4 мкм, зливаються, а більше за 4 мкм, зменшуються в розмірах. 2010 Article U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding / A. Giuliani, V. Calbucci, F. Fiori, P. Imgrund, A.I. Babutskiic // Проблемы прочности. — 2010. — № 6. — С. 137-145. — Бібліогр.: 19 назв. — англ. 0556-171X http://dspace.nbuv.gov.ua/handle/123456789/112017 539.4 en Проблемы прочности Інститут проблем міцності ім. Г.С. Писаренко НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Научно-технический раздел
Научно-технический раздел
spellingShingle Научно-технический раздел
Научно-технический раздел
Giuliani, A.
Calbucci, V.
Fiori, F.
Imgrund, P.
Babutskiic, A.I.
U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding
Проблемы прочности
description С использованием метода, основанного на ультрамалоугловом рассеивании нейтронов, выполнен анализ размеров пор диаметром 100 нм ... 25 мкм в полученных инжекционной формовкой образцах из никель-титанового сплава (с памятью формы) до и после обработки импульсным электрическим током. При обработке образцов поры диаметром меньше 4 мкм коалесцируют, а поры диаметром больше 4 мкм уменьшаются в размерах.
format Article
author Giuliani, A.
Calbucci, V.
Fiori, F.
Imgrund, P.
Babutskiic, A.I.
author_facet Giuliani, A.
Calbucci, V.
Fiori, F.
Imgrund, P.
Babutskiic, A.I.
author_sort Giuliani, A.
title U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding
title_short U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding
title_full U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding
title_fullStr U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding
title_full_unstemmed U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding
title_sort u-sans analysis of as-sintered and pec-treated niti sma produced by metal injection moulding
publisher Інститут проблем міцності ім. Г.С. Писаренко НАН України
publishDate 2010
topic_facet Научно-технический раздел
url http://dspace.nbuv.gov.ua/handle/123456789/112017
citation_txt U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding / A. Giuliani, V. Calbucci, F. Fiori, P. Imgrund, A.I. Babutskiic // Проблемы прочности. — 2010. — № 6. — С. 137-145. — Бібліогр.: 19 назв. — англ.
series Проблемы прочности
work_keys_str_mv AT giuliania usansanalysisofassinteredandpectreatednitismaproducedbymetalinjectionmoulding
AT calbucciv usansanalysisofassinteredandpectreatednitismaproducedbymetalinjectionmoulding
AT fiorif usansanalysisofassinteredandpectreatednitismaproducedbymetalinjectionmoulding
AT imgrundp usansanalysisofassinteredandpectreatednitismaproducedbymetalinjectionmoulding
AT babutskiicai usansanalysisofassinteredandpectreatednitismaproducedbymetalinjectionmoulding
first_indexed 2025-07-08T03:11:35Z
last_indexed 2025-07-08T03:11:35Z
_version_ 1837046742318579712
fulltext UDC 539.4 U-SANS Analysis of As-Sintered and PEC-Treated NiTi SMA Produced by Metal Injection Moulding A. Giuliani, a V. Calbucci, a F. Fiori, a P. Imgrund, b and A. I. Babutskii c a Marche Polytechnic University, Ancona, Italy b Fraunhofer Institute of Manufacturing and Advanced Materials, Bremen, Germany c Pisarenko Institute of Problems of Strength, National Academy of Sciences of Ukraine, Kiev, Ukraine ÓÄÊ 539.4 Àíàëèç èñõîäíîãî è îáðàáîòàííîãî èìïóëüñíûì ýëåêòðè÷åñêèì òîêîì íèêåëü-òèòàíîâîãî ñïëàâà, ïîëó÷åííîãî ìåòîäîì èíæåêöèè, ïðè èñïîëüçîâàíèè óëüòðàìàëîóãëîâîãî ðàññåèâàíèÿ íåéòðîíîâ À. Äæóëèàíè à , Â. Êàëáó÷÷è à , Ô. Ôèîðè à , Ô. Èìãðóíä á , À. È. Áàáóöêèé â à Ïîëèòåõíè÷åñêèé óíèâåðñèòåò îáëàñòè Ìàðêå, Àíêîíà, Èòàëèÿ á Ôðàóíãîôåðñêèé èíñòèòóò ïðîìûøëåííîñòè è ñîâðåìåííûõ ìàòåðèàëîâ, Áðåìåí, Ãåðìàíèÿ â Èíñòèòóò ïðîáëåì ïðî÷íîñòè èì. Ã. Ñ. Ïèñàðåíêî ÍÀÍ Óêðàèíû, Êèåâ, Óêðàèíà Ñ èñïîëüçîâàíèåì ìåòîäà, îñíîâàííîãî íà óëüòðàìàëîóãëîâîì ðàññåèâàíèè íåéòðîíîâ, âû- ïîëíåí àíàëèç ðàçìåðîâ ïîð äèàìåòðîì 100 íì ... 25 ìêì â ïîëó÷åííûõ èíæåêöèîííîé ôîðìîâ- êîé îáðàçöàõ èç íèêåëü-òèòàíîâîãî ñïëàâà (ñ ïàìÿòüþ ôîðìû) äî è ïîñëå îáðàáîòêè èìïóëüñ- íûì ýëåêòðè÷åñêèì òîêîì. Ïðè îáðàáîòêå îáðàçöîâ ïîðû äèàìåòðîì ìåíüøå 4 ìêì êîàëåñ- öèðóþò, à ïîðû äèàìåòðîì áîëüøå 4 ìêì óìåíüøàþòñÿ â ðàçìåðàõ. Êëþ÷åâûå ñëîâà: ìåòîä óëüòðàìàëîóãëîâîãî ðàññåèâàíèÿ íåéòðîíîâ, èíæåê- öèîííàÿ ôîðìîâêà, èìïóëüñíûé ýëåêòðè÷åñêèé òîê. Introduction. The study of the electromagnetic field effects on dislocations and other defects involved in the deformation process of polycrystalline solids is still a challenge in material science. In fact, according to the review of the present work authors, the influence of specific electric fields was clarified just in a few conventional materials like steels, cast iron and the principal aluminum and titanium alloys [1]. On the other hand, it is assessed that an electric field offers an additional parameter in metal processing with the potential of increasing the efficiency and effectiveness of the process, improving the final resulting thermo- mechanical properties. For instance, high density (103–106 A/cm2) electropulsing influences the flow stress of metals at 78–300 K during their tensile deformation, significantly reducing the flow stress (or increasing the strain rate) [2–5]. © A. GIULIANI, V. CALBUCCI, F. FIORI, P. IMGRUND, A. I. BABUTSKII, 2010 ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 137 The effects of an external electric field (surface charge) on the superplastic deformation of the 7475 Al alloy were investigated and it was found that the field produced the following effects [6–10]: (a) reduced the flow stress by 10–20%, (b) slightly increased the strain rate hardening exponent m�� � � �ln ln , (c) slightly increased the width of the dispersoid-free zone at the grain boundaries. In the case of 7475 Al alloy, the field also changed the chemical composition and enhanced the formation of whiskers; therefore: (d) retarding grain growth and (e) significantly reducing cavitation. The effects of electric fields were also tested during the superplastic deformation of 3Y-TZP. Even in this case, the electric field reduced the flow stress and increased the elongation. Along with its effect on the stress–strain curve, the field retarded grain growth and cavitation [11]. For the first time in the present work, pulse electric current (PEC) treatment was applied to NiTi SMA specimens produced by metal injection moulding (MIM). Ultra-small angle neutron scattering (U-SANS) analysis was performed on NiTi specimens in order to verify if defect (pore) size varies after the PEC treatment in the dimensional range between 100 nm and 25 �m. U-SANS technique is in fact a suitable characterization method in order to get such answer in this range. 1. Materials and Methods. 1.1. NiTi Specimens Preparation by MIM. MIM was first used for NiTi processing by Bram et al. [12]. In the present process, prealloyed NiTi powder with a powder particle size d� � 11.3 �m and an atomic ratio of 50.7% Ni–49.3% Ti was mixed with an organic binder of waxes and polymers to obtain the feedstock. Specimens were moulded as in conventional injection moulding. The binder was then retracted from the part and sintered at 1250�C under high vacuum (10 4 mbar). Density measurements by the Archimedes method showed that a density of 91–94% of theoretical density was obtained after sintering. The process and some of the obtained moulded parts are depicted in Fig. 1. 1.2. PEC Treatment of NiTi Specimens. PEC treatment was fulfilled using a pulse electric current generator consisting of a high voltage power supplier, capacitor banks and discharge switch. Registration of the pulse electric current Fig. 1. MIM process (left) and NiTi green parts (right). 138 ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 A. Giuliani, V. Calbucci, F. Fiori, et al. parameters was realized using Rogovsky coil, high frequency A/D converter and PC where data were stored and processed. The treatment was carried out by direct current passage through the NiTi specimen. Three short sequential pulses of the electric current with the maximum amplitude of 52 kA – 56 kA – 52 kA were passed through the specimen, here the specimen sectional area was near 80 mm2. 2. Experimental Methods. 2.1. Preliminary Characterization by Scanning Electron Microscopy and Energy Dispersive X-ray Analysis. As-sintered NiTi specimens were characterized by means of scanning electron microscopy (SEM) and energy dispersive X-ray (EDX) analyses for a preliminary determination of pore size, Ni–Ti ratio and phase compositions. The microstructure, as revealed by SEM, is shown in Fig. 2. Concerning composition, two different phases were detected by EDX analyses. The light grey matrix phase was found to be NiTi: the atomic ratio detected was 50.3 Ni–49.7 Ti, which was in good accordance with the base material composition. The slightly darker phase revealed a Ni/Ti ratio of 33/67, indicating the presence, after sintering, of a very low amount of NiTi2 secondary phase. Figure 2 shows such multi-phase microstructure along with some irregular porosity. In fact, together with large irregularly shaped pores, different fine, spherical pores were detected, demonstrating the necessity to investigate the PEC treatment effects on NiTi by U-SANS, such technique being sensitive at a scale range comparable with the latter pore dimensional group. 2.2. Characterization by the U-SANS. U-SANS analysis was performed at the double crystal diffractometer (DCD) instrument at the Geesthacht Neutron Facility (Geesthacht, Germany) on NiTi specimens produced by MIM before and after the PEC treatment. The DCD, in the chosen set-up, was equipped with triple-bounce channel-cut perfect Si crystals [13]. Using the (111) reflection, the full width at half-maximum (FWHM) of the rocking curve (RC) is about 2 6 10 4. nm 1 at a wavelength of �� 0.44 nm. When compared with single-bounce crystals, the instrumental background at a scattering vector Q � 10 3 nm 1 is decreased by two orders of magnitude: this Fig. 2. SEM micrograph of NiTi after MIM and sintering at 1250�C under high vacuum. ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 139 U-SANS Analysis of As-Sintered and PEC-Treated ... leads to enormous progress involving the possibility to detect small volume fractions of inhomogeneities in the size range from 100 nm up to about 25 �m [14]. Because of this, DCD was selected and used in the present work to analyze shape, size distribution and volume fraction of pores and the effects of the PEC treatment on them. Pore size distribution N R( ) shall be defined in the radius interval [Rmin , Rmax]: it can be written as a linear combination of m basic size distributions n Ri ( ) with coefficients x i : N R x n Ri i i m ( ) ( ).� � � 1 (1) Cubic B-splines are chosen for the basic size distributions n Ri ( ). With such a set of basic functions, an arbitrary smooth function can be approximated [15, 16]. We numerically treated the data obtained on both PEC-treated and untreated specimens with a model based on two phases coexistence: the NiTi phase and another phase corresponding to pores. This model is called two-phase model and is based on the assumption of the presence of pores with a size distribution N R( ), embedded in a homogeneous matrix (polidispersion). The Master equation of such model is the following [17, 18]: d d N R V R F QR dR � � �� � ( ) ( ) ( ) ( ) , 2 2 2 0 (2) where d d� � is the macroscopic cross section of pores (the measured quantity), ( )� 2 is the nuclear contrast between the pores and the matrix, V R( ) is the pore volume, and F QR( ) is the pore form factor. In our case, on the basis of preliminary SEM analysis (Sec. 2.1), we considered a sphere-like form factor, corresponding pores approximately spherical in shape. Under these conditions it is also possible to estimate pore volume fraction f by means of the following equation: f N R V R dr� ( ) ( ) . (3) An estimate of the pore size can also be obtained by means of the Guinier approximation. As far as this is valid, that is for QRG �15. (approximately), Eq. (2) can be written as d d nV Q RG� � �� � � � � � � � �( ) exp , 2 2 2 2 3 (4) where n is the number density of pores and RG is the Guinier radius. For spherical pores with radius R, R RG � 3 5 ; in the case of polydispersion, RG depends on the size distribution: 140 ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 A. Giuliani, V. Calbucci, F. Fiori, et al. R R N R dR R N R dR G 2 8 0 6 0 � � � � � ( ) ( ) , (5) RG is usually determined by the slope, at low Q values, of the linear plot ln( )d d � vs. Q 2 . Anyway an alternative (and even more direct) method is by plotting Q d d2 ( ) � vs. Q. In fact, from Eq. (4), it is easy to verify that this function has a maximum for Q RG� 3 . 3. Results. The Q d d2 ( ) � vs. Q plots for the untreated and PEC-treated specimens are shown in Fig. 3. In the untreated profile, two peaks corresponding to two pore families are detected, one with RG �2 37. �m and the other with RG �8 75. �m. In the PEC-treated case, only the peak corresponding to the biggest family is clearly visible, with a Guinier radius smaller than the one for the untreated specimen (RG �5 83. �m); on the contrary, the peak corresponding to the smaller family is not detectable. In Fig. 4 the DCD scattering curves from the PEC-treated (dotted line) and the untreated (solid line) NiTi specimens are shown, superimposed to the best fit curve obtained by writing N R( ) as a linear combination of cubic B-spline functions � i R( ): N R c R d d c R V R F QR dRi i i N i i s ( ) ( ) ( ) ( ) ( ) ( ) .� � � � � � � � 1 2 2 2 � � 01 � � �� i N s (6) The coefficients ci are the parameters optimized by the least-square fit and resulting in the pore size distribution N R( ) shown in Fig. 5. Fig. 3. Q d d2 ( ) � vs. Q plots for the PEC-treated (dot-line) and the untreated (solid line) specimens. ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 141 U-SANS Analysis of As-Sintered and PEC-Treated ... The N R( ) size distribution is four-modal (4 peaks in each curve) (Fig. 5). In the untreated specimen there is a first big family of pores (I-F) with a main pore radius slightly bigger than 400 nm, another family (II-F) with average radius close to 800 nm, a third group (III-F) with a radius close to 2.5 �m and the last family (IV-F) with a radius close to 10 �m. It is visible from the results presented in Fig. 5 that after PEC treatment the redistribution of the pores numbers took place: the total pores’ number in the former I-F and III-F families was reduced; in the II-F family, the pores’ number with smaller dimension was reduced and the pores’ number with bigger dimension was increased; and vice versa for the last IV-F family, the share of pores with smaller dimension was increased against the reduction of the big pores’ number. The volume fractions for each pore family can be calculated as the integral of the curves N R V R( ) ( ) vs. R , where N R( ) is the size distribution, V R( ) is the volume of the pore, and R is its radius, i.e., applying (2) and (3) and extrapolating the results shown in Fig. 6. Fig. 4. DCD scattering curves for the PEC-treated (dot-line) and the untreated (solid line) specimens. Fig. 5. Pore size distribution in the PEC-treated specimens (dot-curve) and in the untreated ones (solid curve). 142 ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 A. Giuliani, V. Calbucci, F. Fiori, et al. In the untreated specimen (solid-line) the I-F (R close to 400 nm) exhibits a small volume fraction. This is justified by very small volume of such pores. The second family, with the average radius close to 800 �m has a quite high volume fraction close to 2/3 of the third group (that one with R close to 2.5 �m). The fourth family with an average pore radius close to 10 �m has a very small volume fraction: this is due to the almost negligible amount of pores of such size, as it is detectable by SEM (Sec. 2.1). After the PEC treatment the volume fraction of the first family of pores is reduced, the volume fraction of the second family significantly increased and that of the third family significantly reduced. In contrast to the other three families, the trend of the last group (with a radius close to 10 �m before PEC treatment), after the treatment exhibit at the meantime an increasing of its volume fraction and significant reduction of its pore radius from 10 �m to less than 8 �m. These results (at least for what concerns the III-F and the IV-F) are in good agreement with the ones previously obtained by the Guinier approximation. Analysis of the results obtained shows substantial redistribution of pore numbers depending of their sizes due to PEC treatment. This is takes place via coalescence of pores and reduction of their sizes. In addition, an annihilation of small pores is possible. The reason of these processes can be a vacancy movement generated by the pores under passage of electric current through the material [19]. At least two mechanisms of stimulation of vacancy generation exist: the first one is related to entrainment of the vacancies by conductivity electrons and the second one is related to nonhomogeneity of temperature distribution in the material caused by inhomogeneous Joule heat release in the defects of material structure (e.g., in pores). Generated temperature gradients cause local thermal stresses contributing pores coalescence and emission of vacancy-type dislocation loops. It causes the reduction of pore sizes and, as extreme case, results in pores’ annihilation. Conclusions. U-SANS was successfully applied for microstructural analysis of NiTi shape memory alloys submitted to PEC treatment. In particular, quantitative information about structure in the size range between 100 nm and a few tens of �m were obtained. This technique gave us a possibility to investigate parameters such as cavity density and dimensions, before and after the PEC treatment. Fig. 6. Pore volume fraction (integrated area) in the PEC-treated specimens (dotted curve) and in the untreated ones (solid curve). ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 143 U-SANS Analysis of As-Sintered and PEC-Treated ... The phase morphology of the material (presence of pores) before and after PEC treatment has yielded data required for the optimization of the processing routes. The results described in the previous chapter corroborate that, while pores with diameter smaller than 4 �m undergo coalescence phenomena after the PEC treatment, with a reduction of pores number but a crucial increase of their dimensions, in pores with diameter bigger than 4 �m the PEC treatment causes pore size reduction. Redistribution of pores numbers demands a more precise definition of physical mechanisms through further microstructure investigations. Acknowledgments. The authors acknowledge the help of Dr. K. Pranzas for the technical support during the U-SANS experiment at GKSS. This research has been supported by the European Commission under the 6th Framework Programme through the Key Action: Strengthening the European Research Area, Research Infrastructures. Contract No.: RII3-CT-2003-505925 (NMI3). This work was also supported by the EU Network of Excellence project Knowledge-based Multicomponent Materials for Durable and Safe Performance (KMM-NoE) under the contract No. NMP3-CT-2004-502243. Ð å ç þ ì å ²ç âèêîðèñòàííÿì ìåòîäó, ùî áàçóºòüñÿ íà óëüòðàìàëîêóòîâîìó ðîçñ³ÿíí³ íåéòðîí³â, ïðîàíàë³çîâàíî ðîçì³ðè ïîð ä³àìåòðîì 100 íì...25 ìêì â îòðè- ìàíèõ ³íæåêö³éíèì ôîðìóâàííÿì çðàçêàõ í³êåëü-òèòàíîâîãî ñïëàâó (³ç ïà- ì’ÿòòþ ôîðìè) äî ³ ï³ñëÿ îáðîáêè ³ìïóëüñíèì åëåêòðè÷íèì ñòðóìîì. Ïðè îáðîáö³ çðàçê³â ïîðè ä³àìåòðîì, ÿêèé ìåíøå çà 4 ìêì, çëèâàþòüñÿ, à á³ëüøå çà 4 ìêì, çìåíøóþòüñÿ â ðîçì³ðàõ. 1. H. Conrad, “Some effects of an electric field on the plastic deformation of metals and ceramics,” Mat. Res. Innovat., 2, 1–8 (1998). 2. A. F. Sprecher, S. L. Mannan, and H. Conrad, “On the mechanisms for the elector plastic effect in metals,” Acta Metall., 34, 1145–1162 (1986). 3. H. Conrad and A. F. Sprecher, “The electroplastic effect in metals,” in: F. R. N. Nabarro (Ed.), Dislocations in Solids, Ch. 43. Elsevier Science Publ. BV (1989), p. 499. 4. W. Cao, A. F. Sprecher, and H. Conrad, “The electroplastic effect in niobium in high temperature niobium alloys,” in: J. J. Stephens and I. Ahmed (Eds.), High Temperature Niobium Alloys, TMS, Warrendale, PA (1991), p. 27. 5. W. Cao and H. Conrad, “Effect of stacking fault-energy and temperature on the electroplastic effect in FCC metals,” in: S. Chu et al. (Eds.), Micro- mechanics of Advanced Materials, TMS, Warrendale, PA (1995), p. 225. 6. W. Cao, X. Lu, A. F. Sprecher, and H. Conrad, “Superplastic behaviour and microstructure of 7475 Al deformed in an external electric field,” in: T. McNelly and H. Heikkenean (Eds.), Superplasticity in Aerospace, II, TMS, Warrendale, PA (1990), p. 269. 144 ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 A. Giuliani, V. Calbucci, F. Fiori, et al. 7. W. Cao, X. Lu, A. F. Sprecher, and H. Conrad, “Superplastic deformation behavior of 7475 aluminum alloy in an electric field,” Mater. Sci. Eng., A138, 247 (1990). 8. H. Conrad, W. Cao, X. Lu, and A. F. Sprecher, “Effect of electric field on cavitation in superplastic aluminum alloy 7475,” Mater. Sci. Eng., A138, 247–258 (1991). 9. X. Lu, W. Cao, A. F. Sprecher, and H. Conrad, “Influence of an external electric field on the microstructure of superplastically deformed 7475 Al,” J. Mater. Sci., 27, 2243–2250 (1992). 10. W. Cao, X. Lu, and H. Conrad, “Whisker formation and the mechanism of superplastic deformation,” Acta Mater., 44, 697–706 (1996). 11. S. L. Hwang and I. W. Chen, “Grain size control of tetragonal zirconia polycrystals using space charge concept,” J. Amer. Ceram. Soc., 73, 3269 (1990). 12. M. Bram, A. Ahmad-Khanlou, A. Heckmann, et al., “Powder metallurgical fabrication processes for NiTi shape memory alloy parts,” Mat. Sci. Eng., A337, 254 (2002). 13. D. Bellmann, M. Klatt, R. Kampmann, and R. Wagner, “Improvement of the double crystal diffractometer at the Geesthacht Neutron Facility (GeNF) by means of perfect channel-cut silicon crystals,” Physica B, 241-243, 71–73 (1998). 14. P. Staron and D. Bellmann, “Analysis of neutron double-crystal diffractometer scattering curves including multiple scattering,” J. Appl. Cryst., 35, 75–81 (2002). 15. O. Glatter, “A new method for the evaluation of small-angle scattering data,” Ibid, 10, 415–421 (1977). 16. O. Glatter, “Determination of particle-size distribution functions from small- angle scattering data by means of the indirect transformation method,” Ibid, 13, 7–11 (1980). 17. A. Guinier and G. Fournet, Small-Angle Scattering of X-Rays, Wiley, New York (1955). 18. G. Kostorz, Treatise on Materials Science and Technology, in: G. Kostorz and H. Herman (Eds.), Neutron Scattering, Vol. 15, Academic Press, New York (1979), p. 227. 19. S. V. Venginskaya and Yu. V. Kornyushin, “On a possibility of curing of extended defects by carry of vacancies used stimulation by an electric current,” Metallofiz. Nov. Tekhnol., Issue 61, 72–75 (1975). Received 22. 04. 2009 ISSN 0556-171X. Ïðîáëåìû ïðî÷íîñòè, 2010, ¹ 6 145 U-SANS Analysis of As-Sintered and PEC-Treated ... << /ASCII85EncodePages false /AllowTransparency false /AutoPositionEPSFiles true /AutoRotatePages /All /Binding /Left /CalGrayProfile (Dot Gain 20%) /CalRGBProfile (sRGB IEC61966-2.1) /CalCMYKProfile (U.S. Web Coated \050SWOP\051 v2) /sRGBProfile (sRGB IEC61966-2.1) /CannotEmbedFontPolicy /Warning /CompatibilityLevel 1.4 /CompressObjects /Tags /CompressPages true /ConvertImagesToIndexed true /PassThroughJPEGImages true /CreateJDFFile false /CreateJobTicket false /DefaultRenderingIntent /Default /DetectBlends true /DetectCurves 0.0000 /ColorConversionStrategy /LeaveColorUnchanged /DoThumbnails false /EmbedAllFonts true /EmbedOpenType false /ParseICCProfilesInComments true /EmbedJobOptions true /DSCReportingLevel 0 /EmitDSCWarnings false /EndPage -1 /ImageMemory 1048576 /LockDistillerParams false /MaxSubsetPct 100 /Optimize true /OPM 1 /ParseDSCComments true /ParseDSCCommentsForDocInfo true /PreserveCopyPage true /PreserveDICMYKValues true /PreserveEPSInfo true /PreserveFlatness true /PreserveHalftoneInfo false /PreserveOPIComments false /PreserveOverprintSettings true /StartPage 1 /SubsetFonts true /TransferFunctionInfo /Apply /UCRandBGInfo /Preserve /UsePrologue false /ColorSettingsFile () /AlwaysEmbed [ true ] /NeverEmbed [ true ] /AntiAliasColorImages false /CropColorImages true /ColorImageMinResolution 300 /ColorImageMinResolutionPolicy /OK /DownsampleColorImages true /ColorImageDownsampleType /Bicubic /ColorImageResolution 300 /ColorImageDepth -1 /ColorImageMinDownsampleDepth 1 /ColorImageDownsampleThreshold 1.50000 /EncodeColorImages true /ColorImageFilter /DCTEncode /AutoFilterColorImages true /ColorImageAutoFilterStrategy /JPEG /ColorACSImageDict << /QFactor 0.15 /HSamples [1 1 1 1] /VSamples [1 1 1 1] >> /ColorImageDict << /QFactor 0.15 /HSamples [1 1 1 1] /VSamples [1 1 1 1] >> /JPEG2000ColorACSImageDict << /TileWidth 256 /TileHeight 256 /Quality 30 >> /JPEG2000ColorImageDict << /TileWidth 256 /TileHeight 256 /Quality 30 >> /AntiAliasGrayImages false /CropGrayImages true /GrayImageMinResolution 300 /GrayImageMinResolutionPolicy /OK /DownsampleGrayImages true /GrayImageDownsampleType /Bicubic /GrayImageResolution 300 /GrayImageDepth -1 /GrayImageMinDownsampleDepth 2 /GrayImageDownsampleThreshold 1.50000 /EncodeGrayImages true /GrayImageFilter /DCTEncode /AutoFilterGrayImages true /GrayImageAutoFilterStrategy /JPEG /GrayACSImageDict << /QFactor 0.15 /HSamples [1 1 1 1] /VSamples [1 1 1 1] >> /GrayImageDict << /QFactor 0.15 /HSamples [1 1 1 1] /VSamples [1 1 1 1] >> /JPEG2000GrayACSImageDict << /TileWidth 256 /TileHeight 256 /Quality 30 >> /JPEG2000GrayImageDict << /TileWidth 256 /TileHeight 256 /Quality 30 >> /AntiAliasMonoImages false /CropMonoImages true /MonoImageMinResolution 1200 /MonoImageMinResolutionPolicy /OK /DownsampleMonoImages true /MonoImageDownsampleType /Bicubic /MonoImageResolution 1200 /MonoImageDepth -1 /MonoImageDownsampleThreshold 1.50000 /EncodeMonoImages true /MonoImageFilter /CCITTFaxEncode /MonoImageDict << /K -1 >> /AllowPSXObjects false /CheckCompliance [ /None ] /PDFX1aCheck false /PDFX3Check false /PDFXCompliantPDFOnly false /PDFXNoTrimBoxError true /PDFXTrimBoxToMediaBoxOffset [ 0.00000 0.00000 0.00000 0.00000 ] /PDFXSetBleedBoxToMediaBox true /PDFXBleedBoxToTrimBoxOffset [ 0.00000 0.00000 0.00000 0.00000 ] /PDFXOutputIntentProfile () /PDFXOutputConditionIdentifier () /PDFXOutputCondition () /PDFXRegistryName () /PDFXTrapped /False /Description << /CHS <FEFF4f7f75288fd94e9b8bbe5b9a521b5efa7684002000500044004600206587686353ef901a8fc7684c976262535370673a548c002000700072006f006f00660065007200208fdb884c9ad88d2891cf62535370300260a853ef4ee54f7f75280020004100630072006f0062006100740020548c002000410064006f00620065002000520065006100640065007200200035002e003000204ee553ca66f49ad87248672c676562535f00521b5efa768400200050004400460020658768633002> /CHT <FEFF4f7f752890194e9b8a2d7f6e5efa7acb7684002000410064006f006200650020005000440046002065874ef653ef5728684c9762537088686a5f548c002000700072006f006f00660065007200204e0a73725f979ad854c18cea7684521753706548679c300260a853ef4ee54f7f75280020004100630072006f0062006100740020548c002000410064006f00620065002000520065006100640065007200200035002e003000204ee553ca66f49ad87248672c4f86958b555f5df25efa7acb76840020005000440046002065874ef63002> /DAN <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> /DEU <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> /ESP <FEFF005500740069006c0069006300650020006500730074006100200063006f006e0066006900670075007200610063006900f3006e0020007000610072006100200063007200650061007200200064006f00630075006d0065006e0074006f0073002000640065002000410064006f0062006500200050004400460020007000610072006100200063006f006e00730065006700750069007200200069006d0070007200650073006900f3006e002000640065002000630061006c006900640061006400200065006e00200069006d0070007200650073006f0072006100730020006400650020006500730063007200690074006f00720069006f00200079002000680065007200720061006d00690065006e00740061007300200064006500200063006f00720072006500630063006900f3006e002e002000530065002000700075006500640065006e00200061006200720069007200200064006f00630075006d0065006e0074006f00730020005000440046002000630072006500610064006f007300200063006f006e0020004100630072006f006200610074002c002000410064006f00620065002000520065006100640065007200200035002e003000200079002000760065007200730069006f006e0065007300200070006f00730074006500720069006f007200650073002e> /FRA <FEFF005500740069006c006900730065007a00200063006500730020006f007000740069006f006e00730020006100660069006e00200064006500200063007200e900650072002000640065007300200064006f00630075006d0065006e00740073002000410064006f00620065002000500044004600200070006f007500720020006400650073002000e90070007200650075007600650073002000650074002000640065007300200069006d007000720065007300730069006f006e00730020006400650020006800610075007400650020007100750061006c0069007400e90020007300750072002000640065007300200069006d007000720069006d0061006e0074006500730020006400650020006200750072006500610075002e0020004c0065007300200064006f00630075006d0065006e00740073002000500044004600200063007200e900e90073002000700065007500760065006e0074002000ea0074007200650020006f007500760065007200740073002000640061006e00730020004100630072006f006200610074002c002000610069006e00730069002000710075002700410064006f00620065002000520065006100640065007200200035002e0030002000650074002000760065007200730069006f006e007300200075006c007400e90072006900650075007200650073002e> /ITA <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> /JPN <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> /KOR <FEFFc7740020c124c815c7440020c0acc6a9d558c5ec0020b370c2a4d06cd0d10020d504b9b0d1300020bc0f0020ad50c815ae30c5d0c11c0020ace0d488c9c8b85c0020c778c1c4d560002000410064006f0062006500200050004400460020bb38c11cb97c0020c791c131d569b2c8b2e4002e0020c774b807ac8c0020c791c131b41c00200050004400460020bb38c11cb2940020004100630072006f0062006100740020bc0f002000410064006f00620065002000520065006100640065007200200035002e00300020c774c0c1c5d0c11c0020c5f40020c2180020c788c2b5b2c8b2e4002e> /NLD (Gebruik deze instellingen om Adobe PDF-documenten te maken voor kwaliteitsafdrukken op desktopprinters en proofers. De gemaakte PDF-documenten kunnen worden geopend met Acrobat en Adobe Reader 5.0 en hoger.) /NOR <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> /PTB <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> /SUO <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> /SVE <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> /ENU (Use these settings to create Adobe PDF documents for quality printing on desktop printers and proofers. Created PDF documents can be opened with Acrobat and Adobe Reader 5.0 and later.) >> /Namespace [ (Adobe) (Common) (1.0) ] /OtherNamespaces [ << /AsReaderSpreads false /CropImagesToFrames true /ErrorControl /WarnAndContinue /FlattenerIgnoreSpreadOverrides false /IncludeGuidesGrids false /IncludeNonPrinting false /IncludeSlug false /Namespace [ (Adobe) (InDesign) (4.0) ] /OmitPlacedBitmaps false /OmitPlacedEPS false /OmitPlacedPDF false /SimulateOverprint /Legacy >> << /AddBleedMarks false /AddColorBars false /AddCropMarks false /AddPageInfo false /AddRegMarks false /ConvertColors /NoConversion /DestinationProfileName () /DestinationProfileSelector /NA /Downsample16BitImages true /FlattenerPreset << /PresetSelector /MediumResolution >> /FormElements false /GenerateStructure true /IncludeBookmarks false /IncludeHyperlinks false /IncludeInteractive false /IncludeLayers false /IncludeProfiles true /MultimediaHandling /UseObjectSettings /Namespace [ (Adobe) (CreativeSuite) (2.0) ] /PDFXOutputIntentProfileSelector /NA /PreserveEditing true /UntaggedCMYKHandling /LeaveUntagged /UntaggedRGBHandling /LeaveUntagged /UseDocumentBleed false >> ] >> setdistillerparams << /HWResolution [2400 2400] /PageSize [612.000 792.000] >> setpagedevice