Scanning Tunneling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface
Scanning tunnelling microscopy and spectroscopy (STM/STS) and low-energy electron diffraction (LEED) techniques are used in combination to study the surface structure of GaTe cleavages. Two different structures, hexagonal one on macroscale and monoclinic one randomly distributed on nanoscale, are id...
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| Datum: | 2015 |
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| Hauptverfasser: | , , , , , |
| Format: | Artikel |
| Sprache: | English |
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Інститут металофізики ім. Г.В. Курдюмова НАН України
2015
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| Schriftenreihe: | Металлофизика и новейшие технологии |
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| Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/112254 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Scanning Tunneling Microscopy/Spectroscopy and Low-Energy Electron Diffraction Investigations of GaTe Layered Crystal Cleavage Surface / P. Galiy, T. Nenchuk, A. Ciszewski, P. Mazur, S. Zuber, I. Yarovets // Металлофизика и новейшие технологии. — 2015. — Т. 37, № 6. — С. 789-801. — Бібліогр.: 9 назв. — англ. |