Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection

The dielectric permeability of the free-electron system in semiconductor is usually considered using the Drude-Lorentz model without taking into account this system polarization. But it seems reasonable to include polarization phenomena into consideration of the free-electron system behavior. In...

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Datum:2011
1. Verfasser: Severin, V.S.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2011
Schriftenreihe:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/117710
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection / V.S. Severin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 2. — С. 175-178. — Бібліогр.: 15 назв. — англ.

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spelling irk-123456789-1177102017-05-27T03:05:37Z Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection Severin, V.S. The dielectric permeability of the free-electron system in semiconductor is usually considered using the Drude-Lorentz model without taking into account this system polarization. But it seems reasonable to include polarization phenomena into consideration of the free-electron system behavior. In this paper, the position of minimum in plasma optical reflection by the system of free electrons is analyzed with allowance for this system polarization. This position can substantially differ from that given via calculation of it within the framework of the traditional Drude-Lorentz model. This difference is significant when analyzing the available experimental results. 2011 Article Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection / V.S. Severin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 2. — С. 175-178. — Бібліогр.: 15 назв. — англ. 1560-8034 PACS 77.22.Ch, Ej, 78.20.Bh, Ci, -e http://dspace.nbuv.gov.ua/handle/123456789/117710 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The dielectric permeability of the free-electron system in semiconductor is usually considered using the Drude-Lorentz model without taking into account this system polarization. But it seems reasonable to include polarization phenomena into consideration of the free-electron system behavior. In this paper, the position of minimum in plasma optical reflection by the system of free electrons is analyzed with allowance for this system polarization. This position can substantially differ from that given via calculation of it within the framework of the traditional Drude-Lorentz model. This difference is significant when analyzing the available experimental results.
format Article
author Severin, V.S.
spellingShingle Severin, V.S.
Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Severin, V.S.
author_sort Severin, V.S.
title Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection
title_short Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection
title_full Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection
title_fullStr Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection
title_full_unstemmed Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection
title_sort influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2011
url http://dspace.nbuv.gov.ua/handle/123456789/117710
citation_txt Influence of polarization of free-electron system in semiconductor on the position of minimum in plasma light reflection / V.S. Severin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2011. — Т. 14, № 2. — С. 175-178. — Бібліогр.: 15 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT severinvs influenceofpolarizationoffreeelectronsysteminsemiconductoronthepositionofminimuminplasmalightreflection
first_indexed 2025-07-08T12:40:17Z
last_indexed 2025-07-08T12:40:17Z
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