Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination
It is proposed the new technique for the digital demodulation of images with two-dimensional spatial modulation of illumination. This technique is applicable for low contrast modulation with any phases of modulation that are different. Efficiency of the technique is demonstrated using images of t...
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2010
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irk-123456789-1178092017-05-27T03:06:23Z Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination Borovytsky, V. It is proposed the new technique for the digital demodulation of images with two-dimensional spatial modulation of illumination. This technique is applicable for low contrast modulation with any phases of modulation that are different. Efficiency of the technique is demonstrated using images of test-objects formed by an optical microscope with and without spatial modulation of illumination. 2010 Article Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination / V. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 98-102. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 07.60.Pb http://dspace.nbuv.gov.ua/handle/123456789/117809 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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It is proposed the new technique for the digital demodulation of images with
two-dimensional spatial modulation of illumination. This technique is applicable for low
contrast modulation with any phases of modulation that are different. Efficiency of the
technique is demonstrated using images of test-objects formed by an optical microscope
with and without spatial modulation of illumination. |
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Borovytsky, V. |
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Borovytsky, V. Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination Semiconductor Physics Quantum Electronics & Optoelectronics |
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Borovytsky, V. |
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Borovytsky, V. |
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Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination |
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Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination |
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Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination |
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Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination |
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Two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination |
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two-dimensional digital demodulation for optical microscopes with spatial modulation of illumination |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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2010 |
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http://dspace.nbuv.gov.ua/handle/123456789/117809 |
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Two-dimensional digital demodulation for optical microscopes
with spatial modulation of illumination / V. Borovytsky // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2010. — Т. 13, № 1. — С. 98-102. — Бібліогр.: 9 назв. — англ. |
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Semiconductor Physics Quantum Electronics & Optoelectronics |
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AT borovytskyv twodimensionaldigitaldemodulationforopticalmicroscopeswithspatialmodulationofillumination |
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2025-07-08T12:50:06Z |
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Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010. V. 13, N 1. P. 98-102.
© 2010, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
98
PACS 07.60.Pb
Two-dimensional digital demodulation for optical microscopes
with spatial modulation of illumination
Volodymyr Borovytsky
Information Software Systems Ltd.,
15, Bozhenko str., Kyiv 03680, Ukraine,
e-mail: Volodymyr_Borovytsky@iss.org.ua
Abstract. It is proposed the new technique for the digital demodulation of images with
two-dimensional spatial modulation of illumination. This technique is applicable for low
contrast modulation with any phases of modulation that are different. Efficiency of the
technique is demonstrated using images of test-objects formed by an optical microscope
with and without spatial modulation of illumination.
Keywords: optical microscopy, spatial modulation of illumination, spatial resolution,
digital demodulation, spatial harmonics.
Manuscript received 13.10.09; accepted for publication 22.10.09; published online 30.12.09.
The structural illumination microscopy or microscopy
with spatial modulation of illumination (SMI) is a
perspective branch of optical microscopy of high
resolution [1-3]. Its principal advantage is a possibility
to overcome the limit of spatial resolution caused by
diffraction of optical waves on an aperture of
microscope optics (MO) [1]. That is why the leading
producers of optical microscopes such as Carl Zeiss and
others have announced the new products based on
implementation of SMI [2, 3].
The key idea of SMI microscopy is to apply non-
uniform harmonic illumination [2-8]. As a result, the
spatial harmonics of high frequencies located outside the
MO bandwidth are shifted into it due to amplitude
modulation of illumination on specimen surface and
passed through a MO [4, 5]. It is possible to extract these
harmonics from the digital images with SMI captured by
a digital camera and to put them on their place outside
the bandwidth. This operation called the digital
demodulation is performed using computers [4-7]. This
demodulation makes the bandwidth of an imaging
channel of an optical microscope wider, and it increases
ability to resolve objects of small size called spatial
resolution [4, 8].
Demodulation is the sophisticated operation: the
spatial harmonics of high frequencies shifted into the
MO bandwidth drop on the harmonics located inside the
MO bandwidth. The separation of these harmonics is
getting more complicated in two-dimensional case when
spatial harmonics overlay in two dimensional spatial
frequency space. In [4, 5] this separation is considered
for the partial case when SMI phases are equal to 0,
+π/2, –π/2. In [6] separation is made using iterative
procedures that requires many calculations with
numerous digital images with SMI. In [7, 8] three one-
dimensional demodulations are applied for a set of the
digital images with one directional SMI to form the two-
dimensional result. Two-dimensional demodulation still
remains a complicated problem due to absence of a
direct analytical solution for separation of the spatial
harmonics. The goal of this work is to find a solution of
this problem.
Let us consider the typical demodulation of images
with two-dimensional SMI. To perform demodulation, it
is necessary to capture five images in which SMI pattern
has relative phases (0,0), (φ01,0), (φ02,0), (0,φ01),
(0,φ02). Then, it has to make two-dimensional fast
Fourier transform of each image and to get five
corresponding complex spatial spectra [4, 5]. Each
spectrum contains five components, and it is necessary
to separate them [4, 5]. Four components are shifted by
the +/–SMI spatial frequency along the axes of two-
dimensional SMI [4].
Five spatial spectra with five components in each
spectrum can be written as a system of five equations:
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010. V. 13, N 1. P. 98-102.
© 2010, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
99
YXMYXMYX
YMXYMXMYXM
YXMYXMYX
YMXYMXMYXM
YXMYXMYXYMX
YMXMYXM
YXMYXMYXYMX
YMXMYXM
YXMYXMYX
YMXYMXMYXM
UjUjU
UUkUk
UjUjU
UUkUk
UUUjU
jUkUk
UUUjU
jUkUk
UUU
UUkUk
,exp,exp,
,,125.0,5.01
,exp,exp,
,,125.0,5.01
,,,exp,
exp,125.0,5.01
,,,exp,
exp,125.0,5.01
,,,
,,125.0,5.01
010202
010101
2020
20
1010
10
00
(1)
where U(υX,υY) – 2D spatial spectrum of the image without
SMI; υХ, υY – spatial frequencies; υМ – spatial frequency of
SMI that is supposed equal along axes υХ, υY; Δφ10, Δφ20,
Δφ01, Δφ02 – relative SMI phases in the digital images with
SMI: Δφ10, Δφ20 are introduced by shift of the SMI pattern
along axis X, phases Δφ01, Δφ02 – by shift of the SMI
pattern along axis Y; Uφ00(υX,υY), Uφ10(υX,υY), Uφ20(υX,υY),
Uφ01(υX,υY), Uφ02(υX,υY) – five spatial spectra of the digital
images with SMI when the SMI pattern has relative phases
(0,0), (φ01,0), (φ02,0), (0,φ01), (0,φ02), relatively; kM –
contrast of SMI in these images.
The system (1) is not a pure linear system of five
equations. It has to point out that the relative SMI phases
Δφ10, Δφ20 are defined along the axis of spatial
coordinate X, and Δφ01, Δφ02 – along the axis of spatial
coordinate Y. It is a principal difficulty in solving (1).
To solve (1), it is proposed to group the first equation
and two pair of two equations for SMI phase shift along
the orthogonal axes of spatial coordinates X, Y. Now the
system (1) can be rewritten as two linear systems of
three equations in the following matrix form:
YX
YX
YX
YX
YX
YXY
X
YX
YX
YXY
M
M
M
U
U
U
U
U
U
M
U
U
U
jjK
jjK
K
,
,
,
,
,
,
,
,
,
expexp
expexp
11
20
10
00
20
10
20
10
20202
10102
2
(2)
YX
YX
YX
YX
YX
YXX
Y
YX
YX
YXX
M
M
M
U
U
U
U
U
U
M
U
U
U
jjK
jjK
K
,
,
,
,
,
,
,
,
,
expexp
expexp
11
02
01
00
02
01
02
01
02022
01012
2
where U00(υX,υY), U10(υX,υY), U20(υX,υY), U01(υX,υY),
U02(υX,υY) – symbolic definition of the components
U(υX,υY), U(υX+υМ, υY), U(υX–υМ, υY), U(υX, υY+υМ),
U(υX, υY–υМ), relatively, they are introduced to simplify
the formulas; UY(υX,υY), UX(υX,υY) – sums for the definite
components of the spatial spectra (1), respectively:
YXYX
YXMYXY
UU
UKU
,,
,,
0201
002
YXYX
YXMYXX
UU
UKU
,,
,,
2010
002
МХ, МY – matrixes of the complex coefficients that
describes the linear relationship between the components
U(υX,υY), U(υX+υМ, υY), U(υX–υМ, υY), U(υX, υY+υМ),
U(υX, υY–υМ) and spatial spectra of five images with
different SMI phases UY(υX,υY), UX(υX,υY), Uφ10(υX,υY),
Uφ20(υX,υY), Uφ01(υX,υY), Uφ02(υX,υY), relatively; KМ2 –
coefficient introduced to take into account influence of
the contrast kM of SMI in the digital images:
M
M
M
M
M k
k
k
k
K
5.01
8
125.0
5.01
2
The solution of two systems (2) can be found
analytically and written in the following form:
YX
YX
YX
X
YX
YX
YXX
U
U
U
M
U
U
U
,
,
,
,
,
,
20
10
00
1
20
10 (3)
YX
YX
YX
Y
YX
YX
YXY
U
U
U
M
U
U
U
,
,
,
,
,
,
02
01
00
1
02
01
where МХ
-1, МY
-1 – inverse complex matrixes of the
matrixes МХ, МY (2), respectively.
These matrixes can be easy written in the following
analytical form:
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010. V. 13, N 1. P. 98-102.
© 2010, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
100
10202010
1020
1020
1020
2010
10
2
20
2
2010
2
1
sinsinsin2
1expexp1
expexp
exp11exp
expexp
sin
2
sin
2
sin
2
j
jj
jj
jj
jj
K
j
K
j
K
j
M
MMM
X
01020201
0102
0102
0102
0201
01
2
02
2
0201
2
1
sinsinsin2
1expexp1
expexp
exp11exp
expexp
sin
2
sin
2
sin
2
j
jj
jj
jj
jj
K
j
K
j
K
j
M
MMM
Y
It is obvious that the unknown component
U00(υX,υY) can be calculated using the sums UX(υX,υY),
UY(υX,υY) (2):
20201
00
/,,
,,
MYXYX
YXYYX
KUU
UU
22010 /,,
,
MYXYX
YXX
KUU
U
As a result, all the components of the spatial
spectrum can be calculated using the proposed analytical
formulas (3). The components U10(υX,υY), U20(υX,υY),
U01(υX,υY), U02(υX,υY) contain the pure spatial harmonics
of high frequencies that has been located outside the MO
bandwidth and shifted into it. It is possible to shift these
harmonics back on their original location. To perform
this operation, it has to shift the components U10(υX,υY),
U20(υX,υY), U01(υX,υY), U02(υX,υY) to the definite zone of
high spatial frequencies [4, 5]:
YXYRYX
YMXYXY
RYXYMX
RYXYX
YXXRYX
YMXYXX
RYXYMX
YXR
U
U
U
U
U
U
,0,
,,,0
,,,
,,
,0,
,,,0
,,,
,
22
02
22
01
22
0
22
20
22
10
(4)
where υR is the radius of a circle in spatial frequency
space, outside this circle it has to add the fragment of
the restored components U10(υX,υY), U20(υX,υY),
U01(υX,υY), U02(υX,υY); of course, υR is not bigger
than the MO bandwidth; UR(υX,υY) – spatial spectrum
of the high resolution digital image as a result of the
digital demodulation. To get this image it is
necessary to perform inverse two-dimensional fast
Fourier transform of UR(υX,υY) (4). It has to point out
that SMI with the digital demodulation (3, 4) allows
overcoming the diffraction limit of spatial resolution
of MO:
1. At the beginning the spatial harmonics of high
frequencies outside the MO bandwidth are shifted into it
[4, 5].
2. These harmonics are extracted using the
proposed mathematical apparatus (3).
3. These harmonics are shifted on their original
location and added to the harmonics located inside the
MO bandwidth (4). The final bandwidth of an imaging
channel of an optical microscope is getting higher than
the bandwidth of a diffraction-limited MO [9]. The
increased bandwidth guarantees the higher spatial
resolution as ability to resolve objects of small
dimensions.
The computer simulation of an optical microscope
with SMI proves the efficiency of the proposed
technique (3, 4). It is selected the test objects as two
dimensional structure of binary square bars (Fig. 1a).
The spatial period of the bars is equal to 200 nm along
axes X, Y. The MO has numerical aperture 0.95 and
operation wavelength is 550 nm. According to the Abbe
formula, it has spatial resolution as the minimal resolved
spatial period of a grating equal to 298 nm [9]. The
spatial period of a grating is only 0.75 of the minimal
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010. V. 13, N 1. P. 98-102.
© 2010, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
101
resolved spatial period, and the bars cannot be resolved
in the image formed by the MO even after digital
deconvolution (see Figs 1b and 1c). It is illustrated in the
space of spatial harmonics: the principal spatial
frequency of the bars is higher than the MO bandwidth
(see Figs 1d, e, f).
Fig. 1. Digital images of test-objects and amplitudes of their two-dimensional spatial spectra:
а, b, c) test-object, its image formed by the MO, its image after deconvolution, respectively; d, e, f) spatial spectra of (a), (b), (c),
respectively; g, h, i) test-object with SMI, its image with SMI, the high resolution digital image, respectively; j, k, l) spatial spectra
of (g), (h), (i), respectively;
a) b) c)
g) h) i)
d) e) f)
k) l)j)
υX
υY
X
Y
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2010. V. 13, N 1. P. 98-102.
© 2010, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
102
In the case of the optical microscope with SMI,
the spatial harmonics are shifted into the MO bandwidth,
they pass the MO can be extracted and shifted back on
their original location (see Fig. 1j, k, l). The spatial
frequency of SMI is 0.75 of the MO bandwidth. The
SMI spatial harmonics can pass through the MO with
decreasing its amplitude (see Fig. 1h). It provides higher
spatial resolution: in the image made from the optical
microscope without SMI, the bars are not resolved (see
Fig. 1c), but in the image from the same optical
microscope with SMI the bars are clearly resolved (see
Fig. 1i).
The minimal resolved spatial period of an
imaging channel of an optical microscope with SMI can
be calculated using the following formula:
O
M
O
MO
Md
1
11
(5)
O
M
O
M
d
NA
11
1
2
where υO is the MO bandwidth; d, dM – minimal
resolved spatial periods of a grating in optical
microscopes without SMI according to Abbe formula
and with SMI, respectively; NA – MO numerical
aperture; λ – operation wavelength.
It is reasonable to consider the formula (5) as a
common case of Abbe formula [9]:
NA
d
O
2
1
The proposed technique has the advantages in
comparison with the known techniques [4-8]:
1. It is presented in common analytical form for the
two-dimensional digital demodulation. It is applicable
for any combination of SMI phases which only should
differ. It is very important for practical implementation.
2. It can be applied in the case of low contrast SMI.
It is possible due to amplification of SMI amplitudes
during digital demodulation.
3. It requires minimal number of calculations to get
the high resolution digital images. No iteration
procedures are necessary.
4. In the case when υM<υO, the bandwidth of an
imaging channel in an optical microscope can be
expanded up to two MO bandwidths (5) [7].
References
1. 1. Y. Garini, B.J. Vermolen, I.T. Yong, From
micro to nano: recent advances in high-resolution
microscopy // Current Opinion in Biotechnology
№ 6, p. 3-12 (2005).
2. ELYRA Enter the World of Superresolution.
Product description. – Jena: Carl Zeiss
MicroImaging GmbH, 2009.
3. Applied Precision Delta Vision OMX. 3D-SIM
Super-Resolution Imaging. Product description. –
Issaquah: Applied Precision, Inc., 2009.
4. J.T. Frohn, Super-Resolution Fluorescence
Microscopy by Structured Light Illumination. //
Dissertation of Doctor of Technical Sciences. –
Zurich, 2000. – 143 p.
5. M. Beck, Extended Resolution in Total Internal
Reflection Fluorescence Microscopy. //
Dissertation of Doctor of Technical Science. –
Zurich, 2008. – 120 p.
6. S.S. Hong, Scanning Standing Wave Illumination
Microscopy: A Path to Nanometer Resolution in X-
Ray microscopy // Dissertation of Doctor of
Philosophy. – Massachusetts, 2005. – 88 p.
7. M.G.L. Gustafsson, L. Shao, P.M. Carlton, R.C.J.
Wang, I.N. Golubovskaya, etc. Three-Dimensional
Resolution Doubling in Wide-Field Fluorescence
Microscopy by Structured Illumination //
Biophysical Journal 94, June, p. 4957-4970 (2008).
8. S. Haase, OMX – A Novel High Speed and High
Resolution Microscope and its Application to
Nuclear Chromosomal Structure Analysis //
Dissertation of Doctor of Mathematic – Nature
Science. – Berlin, 2005. – 144 p.
9. H.G. Kapitsa, Microscopy from the Very
Beginning. 2nd revised edition. – Carl Zeiss: Jena,
1997.
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