The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series
The development of the device to measure the lifetime of ZnS luminescent films with different dopants has been presented. The devices have been designed to operate under semiautomatic ( LMS 01) and program mode (LMS 02) of measuring the parameters of films with setting the input ones. The data are...
Saved in:
| Date: | 2003 |
|---|---|
| Main Authors: | , , , , |
| Format: | Article |
| Language: | English |
| Published: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2003
|
| Series: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/118093 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series / K. Popovych, Yu. Nakonechny, I. Rubish, V. Gerasimov, G. Leising // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 520-523. — Бібліогр.: 4 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-118093 |
|---|---|
| record_format |
dspace |
| spelling |
irk-123456789-1180932017-05-29T03:02:49Z The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series Popovych, K. Nakonechny, Yu. Rubish, I. Gerasimov, V. Leising, G. The development of the device to measure the lifetime of ZnS luminescent films with different dopants has been presented. The devices have been designed to operate under semiautomatic ( LMS 01) and program mode (LMS 02) of measuring the parameters of films with setting the input ones. The data are transmitted to a computer and processed by a specialized program that, in its turn, controls the operation of the device, on the whole. 2003 Article The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series / K. Popovych, Yu. Nakonechny, I. Rubish, V. Gerasimov, G. Leising // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 520-523. — Бібліогр.: 4 назв. — англ. 1560-8034 PACS: 78.06.F; 78.66.Hf http://dspace.nbuv.gov.ua/handle/123456789/118093 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The development of the device to measure the lifetime of ZnS luminescent films with different dopants has been presented. The devices have been designed to operate under semiautomatic ( LMS 01) and program mode (LMS 02) of measuring the parameters of films with
setting the input ones. The data are transmitted to a computer and processed by a specialized program that, in its turn, controls the operation of the device, on the whole. |
| format |
Article |
| author |
Popovych, K. Nakonechny, Yu. Rubish, I. Gerasimov, V. Leising, G. |
| spellingShingle |
Popovych, K. Nakonechny, Yu. Rubish, I. Gerasimov, V. Leising, G. The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Popovych, K. Nakonechny, Yu. Rubish, I. Gerasimov, V. Leising, G. |
| author_sort |
Popovych, K. |
| title |
The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series |
| title_short |
The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series |
| title_full |
The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series |
| title_fullStr |
The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series |
| title_full_unstemmed |
The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series |
| title_sort |
study of the lifetime of zns-based luminescent films by using the devices of lms series |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2003 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/118093 |
| citation_txt |
The study of the lifetime of ZnS-based luminescent films by using the devices of LMS series / K. Popovych, Yu. Nakonechny, I. Rubish, V. Gerasimov, G. Leising // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2003. — Т. 6, № 4. — С. 520-523. — Бібліогр.: 4 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
| work_keys_str_mv |
AT popovychk thestudyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT nakonechnyyu thestudyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT rubishi thestudyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT gerasimovv thestudyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT leisingg thestudyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT popovychk studyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT nakonechnyyu studyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT rubishi studyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT gerasimovv studyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries AT leisingg studyofthelifetimeofznsbasedluminescentfilmsbyusingthedevicesoflmsseries |
| first_indexed |
2025-07-08T13:21:15Z |
| last_indexed |
2025-07-08T13:21:15Z |
| _version_ |
1837085101822836736 |
| fulltext |
Semiconductor Physics, Quantum Electronics & Optoelectronics. 2003. V. 6, N 4. P. 520-523.
© 2003, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine520
PACS: 78.06.F; 78.66.Hf
The study of the lifetime of ZnS-based luminescent films
by using the devices of LMS series
K. Popovych, Yu. Nakonechny and I. Rubish
Uzhgorod National University, Physical Department, 34, Pidhirna str., 88003 Uzhgorod, Ukraine
V. Gerasimov
Mukachevo Technological Institute, Technological Department, 26, Uzhgorodska str., 89600 Mukachevo, Ukraine,
Fax: +380 (3131) 21109; E-mail: vitge@mti.edu.ua
G. Leising
Institut fur Festkorperphysik, Technische Universitat Graz, Petersgasse 16, A-8010 Graz, Austria,
Phone: 43316 8738470; E-mail: g.leising@tugraz.at
Abstract. The development of the device to measure the lifetime of ZnS luminescent films with
different dopants has been presented. The devices have been designed to operate under semi-
automatic ( LMS 01) and program mode (LMS 02) of measuring the parameters of films with
setting the input ones. The data are transmitted to a computer and processed by a specialized
program that, in its turn, controls the operation of the device, on the whole.
Keywords: thin film, device, luminescence, ZnS, intensity of light.
Paper received 08.09.03; accepted for publication 11.12.03.
Recently the devices based on thin luminescent films have
acquired a wide development and spreading. First of all,
these are multi-colored flat luninescent panels. The ba-
sic material for films is ZnS [1�3] that is doped by various
impurities of ions, for example Mn+2, Ñu+2, which causes
the change in the colour of the films luminescence. One
of the most important characteristics of luminescent films
is the lifetime of illumination, or aging of films [3]. When
performing these studies, the problem of arranging the
studies themselves, that is the problem of using such a
device that would give a possibility to observe changes in
the luminous intensity of films in a real time scale is of
great importance. The application of various devices
unadapted to carry out these studies directly, for exam-
ple candelometers, is rather complicated at large time
intervals and with a great number of the fims under inves-
tigation. The investigator feels a particular inconvenien-
ce when he wants to elucidate the character of lumines-
cent films aging followed by recording the data and con-
ducting a statistical processing of the results of studies.
In this work the device to perform researches con-
nected with the lifetime of luminescent films is proposed.
The result of joint work of the authors� team was the
development of a series of devices under the title of LMS
in two versions. The outward appearance of the devices
LMS S12-01 and LMSS12-02 is depicted in Figs 1 and 2,
respectively. The given devices measure the luminous
intensity of films after the preset time interval. The first
version measures in a semi-automatic way (the investiga-
tor takes off the data himself), the second one is fully
automated. The device consists of two units. The elements
of controlling the device are located in the first unit, and
the films under investigation - in the other one.
The measuring unit realizes the interaction of all func-
tional units of the model. The basic part of the measuring
unit is a special cassette for 12 films. It provides a reli-
able electrical contact of the films under study with the
power supply and protects films from external radiation,
mechanical deformations and damages during their test-
ing. Under the cassette, the board of the photoamplifier
comprising 12 light receivers is located. The structural
block diagram of the device LMS 01 is showm in Fig. 3.
Its main difference from LMS 02 lies in the fact that
in the latter the control of the device using a microcont-
K. Popovych et al.: The study of the life-time of ZnS-based luminescent films...
521SQO, 6(4), 2003
roller is realized. This allows one to fully automate the
measuring process. Via a built-in port RS232, a micro-
controller gets the instructions and sends the measured
data to a computer. A specially developed computer pro-
gram that runs under the operational system Windows
98�2000 controls the measurement process and constructs
the plot of dependence of illumination as a function of
time.
In the device of series 01, the choice of the film to be
investigated is performed by the operator transferring a
measuring probe to a special cell with the film. The data
obtained via a special input-output card are transmitted
to a computer and processed by the program. Besides, in
the series LMS-02 the computer program itself optimizes
the gain of the photoamplifier that gives a possibility to
obtain a larger dynamic range of the gain. The device of
series 02 also allows one to set a constant time interval
after which a fixed point on the plot of dependence of the
luminous intensity as a function of time will be derived.
Before the beginning of measurements, the investiga-
tor specifies the following parameters � voltage magni-
tude and its frequency. These parameters will be stored
in the files of a computer alongside with the measurement
data later on.
The manufacturing method for luminescent films was
based on the serigraphy one. The packet structure for
studies is described in [4] and it is routine for such inves-
tigations.
Using the proposed device, a lot of films at different
parameters of measurements were tested. By analyzing
the experimental data, one can make a conclusion about
a gradual decrease in the luminous intensity of the most
of electroluminescent films prepared for all the films hav-
ing a different composition with the time of operation
which makes up some ten thousands of hours [1]. The
typical curves of the change in the luminous intensity of
films depending on time are shown in Fig. 4. The ap-
proximation of the glowing curve by a mathematical
dependence gives dependences, shown in Fig. 4. This
gives a possibility to construct models and project output
parameters of luminescent films beforehand by varying
their operating modes and manufacturing methods.
a b
Fig. 1. LMS- 01 device : a) Control unit; b) measuring unit.
Fig. 2. LMS- 02 device : a) Control unit; b) measuring unit.
a b
522
SQO, 6(4), 2003
K. Popovych et al.: The study of the life-time of ZnS-based luminescent films...
F
ig
.
3.
B
lo
ck
-d
ia
gr
am
o
f
L
M
S
-0
2
.
K. Popovych et al.: The study of the life-time of ZnS-based luminescent films...
523SQO, 6(4), 2003
Conclusions
Thus, the proposed devices that control parameters of
luminescent films under the computer-based mode allow
one to observe the change in the luminous intensity dur-
ing a certain time, which gives a possibility to make an
analysis and conclusions on their likely use in different
electronic and optoelectronic devices in future.
References
1. Hoy Yanbing, Hua Yulin Xu Xurong The elctroluminescence
of Pr ions in ZnS thin film // J. of Luminescence, 60&61, pp.
916-918 (1994).
2. H.Uchiike, S.Hirao, M.Noborio, Y.Fukushima, Characteri-
zation of Isolated Mn+2 Ions in ZnS:Mn Thin Films //
Electroluminescence, pp. 89-92 (1989).
3. Alex N. Krasnov Selection of dielectrics for alternating-cur-
rent thin-film electroluminescent device // Thin solid Film,
348, pp. 1-13 (1999).
4. Reiner H.Mauch Electroluminescence in thin films // Ap-
plied surface science, 92, pp. 589-592 (1996).
Fig. 4. Typical lifetime curve of ZnS film and approximation functional. A result was obtained with LMS series device.
0
40
60
80
100
120
400 800 1200 1600 2000
S V S– L M S S 1 2-0 2
A g e ing t im e, h
y x x x = –7 E – 0 9 + 3 E – – 0 .0 42 4 + 9 1.753 2
In
te
ns
ity
, %
Spannung, V
1 26 7 a
1
1 26 7 c
2
1 26 7 d
3
1 26 7 b
4
1 26 9 a
5
6
2 ,3
4
56
1
|