Effect of magnetic field on hysteretic characteristics of silicon diodes under conditions of low-temperature impurity breakdown
Effect of magnetic field (up to 14 T) on current-voltage characteristics of silicon n⁺ -p diodes which manifests hysteresis loops related with low-temperature impurity breakdown has been studied. With growth of magnetic field, the hysteresis loops are narrowed and decreased in amplitude and then...
Gespeichert in:
Datum: | 2012 |
---|---|
Hauptverfasser: | Aleinikov, A.B., Berezovets, V.A., Borblik, V.L., Shwarts, M.M., Shwarts, Yu.M. |
Format: | Artikel |
Sprache: | English |
Veröffentlicht: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2012
|
Schriftenreihe: | Semiconductor Physics Quantum Electronics & Optoelectronics |
Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/118325 |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Zitieren: | Effect of magnetic field on hysteretic characteristics of silicon diodes under conditions of low-temperature impurity breakdown / A.B. Aleinikov, V.A. Berezovets, V.L. Borblik, M.M. Shwarts, Yu.M. Shwarts // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2012. — Т. 15, № 3. — С. 288-293. — Бібліогр.: 19 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of UkraineÄhnliche Einträge
-
Effect of magnetic field on hysteretic characteristics of silicon diodes under conditions of low-temperature impurity breakdown
von: A. B. Aleinikov, et al.
Veröffentlicht: (2012) -
Characteristics of diode temperature sensors which exhibit Mott conduction in low temperature region
von: Borblik, V.L., et al.
Veröffentlicht: (2007) -
A new method of extraction of a p-n diode series resistance from I-V characteristics and its application to analysis of low-temperature conduction of the diode base
von: Borblik, V.L., et al.
Veröffentlicht: (2009) -
New evidence of the hopping nature of the excess tunnel current in heavily doped silicon p-n diodes at cryogenic temperatures
von: V. L. Borblik, et al.
Veröffentlicht: (2017) -
Revealing the hopping mechanism of conduction in heavily doped silicon diodes
von: Borblik, V. L., et al.
Veröffentlicht: (2005)