The resolution function and effective response of piezoelectric thin films in Piezoresponse Force Microscopy

The resolution function and effective response of piezoelectric thin films in Piezoresponse Force Microscopy

The elastic Green function and resolution function in Piezoresponse Force Microscopy (PFM) of thin piezoelectric film capped on the rigid substrate are derived. The extrinsic size effect on the resolution function is demonstrated.

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Bibliographische Detailangaben
Datum:2008
1. Verfasser: Morozovska, A.N.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2008
Schriftenreihe:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/118851
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:The resolution function and effective response of piezoelectric thin films in Piezoresponse Force Microscopy / A.N. Morozovska // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2008. — Т. 11, № 2. — С. 171-177. — Бібліогр.: 11 назв. — англ.

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