On the nature of the fine structure in emission spectra of XeCl laser
Results of investigation of the fine structure existing in emission spectra of the transverse-discharge pumped XeCl laser are presented. Influence of selective components of the cavity on the structure of spectrum of induced emission is investigated. Conditions of manifestation in the emission spect...
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2004
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
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| Цитувати: | On the nature of the fine structure in emission spectra of XeCl laser / I.V. Blonskyy, A.V. Gnatovskyy, N.G. Zubrilin, I.A. Pavlov, M.P. Chernomorets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 301-303. — Бібліогр.: 8 назв. — англ. |
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irk-123456789-1191292017-06-05T03:02:44Z On the nature of the fine structure in emission spectra of XeCl laser Blonskyy, I.V. Gnatovskyy, A.V. Zubrilin, N.G. Pavlov, I.A. Chernomorets, M.P. Results of investigation of the fine structure existing in emission spectra of the transverse-discharge pumped XeCl laser are presented. Influence of selective components of the cavity on the structure of spectrum of induced emission is investigated. Conditions of manifestation in the emission spectra of fine structure caused by the molecules rotation are clarified. Generation frequencies in the region of 0–3 transition are measured. 2004 Article On the nature of the fine structure in emission spectra of XeCl laser / I.V. Blonskyy, A.V. Gnatovskyy, N.G. Zubrilin, I.A. Pavlov, M.P. Chernomorets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 301-303. — Бібліогр.: 8 назв. — англ. 1560-8034 PACS: 42.55.Lt, 42.60.Jf http://dspace.nbuv.gov.ua/handle/123456789/119129 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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Results of investigation of the fine structure existing in emission spectra of the transverse-discharge pumped XeCl laser are presented. Influence of selective components of the cavity on the structure of spectrum of induced emission is investigated. Conditions of manifestation in the emission spectra of fine structure caused by the molecules rotation are clarified. Generation frequencies in the region of 0–3 transition are measured. |
| format |
Article |
| author |
Blonskyy, I.V. Gnatovskyy, A.V. Zubrilin, N.G. Pavlov, I.A. Chernomorets, M.P. |
| spellingShingle |
Blonskyy, I.V. Gnatovskyy, A.V. Zubrilin, N.G. Pavlov, I.A. Chernomorets, M.P. On the nature of the fine structure in emission spectra of XeCl laser Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Blonskyy, I.V. Gnatovskyy, A.V. Zubrilin, N.G. Pavlov, I.A. Chernomorets, M.P. |
| author_sort |
Blonskyy, I.V. |
| title |
On the nature of the fine structure in emission spectra of XeCl laser |
| title_short |
On the nature of the fine structure in emission spectra of XeCl laser |
| title_full |
On the nature of the fine structure in emission spectra of XeCl laser |
| title_fullStr |
On the nature of the fine structure in emission spectra of XeCl laser |
| title_full_unstemmed |
On the nature of the fine structure in emission spectra of XeCl laser |
| title_sort |
on the nature of the fine structure in emission spectra of xecl laser |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
2004 |
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http://dspace.nbuv.gov.ua/handle/123456789/119129 |
| citation_txt |
On the nature of the fine structure in emission spectra of XeCl laser / I.V. Blonskyy, A.V. Gnatovskyy, N.G. Zubrilin, I.A. Pavlov, M.P. Chernomorets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2004. — Т. 7, № 3. — С. 301-303. — Бібліогр.: 8 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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2025-07-08T15:16:29Z |
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2025-07-08T15:16:29Z |
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| fulltext |
301© 2004, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
Semiconductor Physics, Quantum Electronics & Optoelectronics. 2004. V. 7, N 3. P. 301-303.
PACS: 42.55.Lt, 42.60.Jf
On the nature of the fine structure
in emission spectra of XeCl laser
I.V. Blonskyy, À.V. Gnatovskyy, N.G. Zubrilin, I.A. Pavlov, M.P. Chernomorets
Institute of Physics NAS of Ukraine, 46, prospect Nauky, 03028 Kyiv, Ukraine
E-mail: zubrilin@iop.kiev.ua
Abstract. Results of investigation of the fine structure existing in emission spectra of the
transverse-discharge pumped XeCl laser are presented. Influence of selective components of
the cavity on the structure of spectrum of induced emission is investigated. Conditions of
manifestation in the emission spectra of fine structure caused by the molecules rotation are
clarified. Generation frequencies in the region of 0�3 transition are measured.
Keywords: laser emission sperctra, fine structure.
Paper received 24.03.04; accepted for publication 21.10.04.
1. Introduction
XeCl laser is, probably, one of the most studied repre-
sentatives of the devices based upon the monohalogenides
of noble gases. In many applications, it is needed a de-
tailed notion of structure of the XeCl laser emission spec-
trum and a possibility to control it.
Since the discussion on the nature of the fine structure
in the XeCl laser emission spectrum lasts for a long time
[1�5], we conducted a series of experiments targeted at
distinguishing between contributions into the emission
spectrum from: i) interference in selective components of
the cavity and ii) properly the energy structure of XeCl
molecule. In this work, results of our first experiments
are presented.
2. Equipment and technique of investigation
In this work, an electric-discharge laser with self-acting
preionization was used. Its discharge-gap volume was
equal to 38×1.5×0.8 cm3 with 1.5 cm interelectrode spac-
ing. External dielectric mirrors possessing different ref-
lection coefficients served as a cavity. The reflective coa-
ting has been put onto one flat of plane-parallel 8-mm-
wide substrates made of KU-1 type quartz (the coated
surface of the substrate was faced towards the interior of
the cavity). Substrates of the same type but without coa-
ting served as windows of the chamber. �Freon-12� sub-
stance (CF2Cl2) was used as a chlorine dopant.
The emission spectrum had been recorded on photo
film of RF type by using DFS-8 spec-trograph. With the
grating of 1,800 grooves per mm used in the apparatus,
the reciprocal linear dispersion was 0.87 Å/mm in the
second order. To identify the wavelengths, the Feemission
spectrum of a hollow-cathode lamp was used. The fre-
quencies have been measured by computer treating of the
scanned exposed films. The accuracy of the frequency
determination is 0.05 cm�1.
3. Results and discussion
To reduce the number of components influencing the in-
terference pattern, the following measures were under-
taken. The outer surface of the output window was made
to be scattering, and external mirrors were absent. There-
fore, the cavity consisted of internal surface of the output
window and the back window, two surfaces of which could
serve as a source of an interference pattern.
The emission spectrum of a laser possessing such a
cavity is shown in Fig. 1a. The active mixture inside the
chamber was CF2Cl2:Xe:He in which the components
related as 1:45:1500 under a common pressure of 2 atm
(202, 650 Pa). In the spectrum, an interference pattern is
observed. The inter-line distance equals to 0.4 cm�1 thus
corresponding to width of the window.
The interference pattern was absent (Fig. 1b) in the
case in which the cavity was formed by internal surface
of the output window and the external 99%-reflecting
mirror placed behind the back window.
The presence of the interference pattern in the former
case is explained as follows. One component of the cav-
ity (the back window) is a Fabri-Perot interferometer and,
hence, cavity radiation losses are different for different
302
SQO, 7(3), 2004
I.V. Blonskyy et al.: On the nature of the fine structure in emission spectra of ...
frequencies in accordance with the reflection spectrum of
the interferometer. If we place a high-reflective mirror
behind this surface, then the cavity losses are determined
by this mirror, and the interference pattern disappears.
However, it should be taken into account that, when one
covers the plane-parallel plate with a mirror layer, the
mirror surface and the opposite surface of the substrate
also form a Fabri-Perot interferometer with different re-
flection coefficients of its surfaces.
The reflection spectrum of the mirror that is taken
into consideration for the second reflective surface of the
substrate is presented in Fig. 2. It is adopted that R1 is a
reflective surface and R2 = 0.04 � non-covered surface. It
is seen that, if high-reflective mirrors are used, the differ-
ence between rmax and rmin is negligible. Under R1 = 97%,
the rmax � rmin value for the reflective surface is 2.4%, and
under R1 = 99% it equals to 0.8%. The dependence of
rmax � rmin on R1 is shown in Fig. 3. rmax � rmin takes its
maximum value at R1 being about 30%.
From the set forth above, it also follows that a win-
dow situated normally to the laser axis does not form the
interference pattern in the laser radiation spectrum in the
case, when the higher reflectivity mirror is situated be-
hind the window. Furthermore, to avoid an influence of
the interference effects on the radiation spectrum, mir-
rors of the cavity must be high-reflective (the tight ca-
vity). In this case, the reflection coefficient is described
by a weakly-modulated function and practically does not
influence the laser radiation spectrum.
One of the XeCl laser radiation spectrum measured
with a tight cavity (R1 = R2 = 99%) under the mixture
pressure of 0.3 atm is presented in Fig. 4. To verify these
lines belonging to a XeCl molecule, we have measured
the spectrum of spontaneous emission. To do this, the
cavity mirrors were eliminated and the chamber windows
were misaligned. Conditions of the mixture excitation,
composition of the mixture, and the common pressure
were the same in both the generation and the spontane-
ous emission cases. A complete correspondence between
the generation lines (Fig. 5) and those of the spontaneous
emission spectrum is observed, i.e. the fine structure of
the generation spectrum under the low pressure is not
caused by the cavity effects, instead, it is caused by the
energy structure of XeCl molecules.
In Table 1, the frequencies of 0�3 transition genera-
tion spectrum (Fig. 5) are listed.
0
50
100
150
200
250
300
32450 32452 32454 32456 32458 32460
b
I
n, cm –1
Fig. 1. Emission spectrum of XeCl laser in the region of 0�2 tran-
sition: a � in the presence of interference; b � in the absence of it.
n, cm –1
= 0.99
0.97
0.5
0 .3
0.04
0
0.2
0.4
0.6
0.8
1
32453.0 32453.5 32454.0 32454.5 32455.0
rm in
r
R
r
m a x
1
Fig. 2. Dependence of reflection coefficient of the mirror with
taking into account the second reflective surface.
0
0.05
0.1
0.15
0.2
0.25
0.3
0 0.25 0.5 0.75 1
rmax � rmin
R
Fig. 3. Dependence of the modulation depth of the mirror ref-
lection coefficient for various values of the reflection coefficient
of the sprayed face.
n, cm–1
I
0
50
100
150
200
250
32410 32510
Fig. 4. Emission spectrum of XeCl laser under the pressure of
0.3 atm.
I.V. Blonskyy et al.: On the nature of the fine structure in emission spectra of ...
303SQO, 7(3), 2004
The separate rotational transitions can not be ob-
served even with a higher-resolution apparatus is used.
According to the selection rules, P and R branches are
realized in a rotational spectrum [8]. Furthermore, each
of these branches transforms into two branches as a re-
sult of the spin splitting.
So, with availability of these four rotational branches,
the radiation spectrum is formed by a superposition of
many rotational lines. Taking into account that the natu-
ral Xe includes 9 isotopes (five of which contribute no-
ticeably), and Cl includes 2 ones, we can assert that the
spectrum observed is formed with superposition of a large
number of rotational lines of ten XeCl molecules possess-
ing different isotopic composition.
If the pressure increases, a gradual widening of the
lines takes place and, when pressure achieves 2 atm, tops
of only separate peaks are seen on the background of the
solid spectrum (see Fig. 1,b).
The presence of the structure caused by the rotation
of molecules should be taken into account when the fre-
quency is tuned. Authors of works [6,7] have observed a
manifestation of the fine structure when tuning the fre-
quency of a high-pressure (3 atm) long-pulse XeCl laser
with Ne as buffer gas.
In the generation spectrum, we also have observed
dips caused by in-cavity absorption of OH radicals. In
particular, deep depressions in the 0�2 transition coin-
cide in their wavelengths with OH absorption lines quoted
in work [5], but full identification of OH absorption lines
was not an object of this work.
4. Conclusions
Basing on the experiments carried out and analysis of
published data, the following conclusions can be made:
1. Manifestation of the interference pattern in XeCl
laser radiation spectra depends on reflection coefficients
of cavity mirrors.
2. In the case of a tight cavity and low-pressure me-
dium, the fine structure of generation spectra is caused
by manifestation of the rotational structure of electron-
vibration transitions.
3. In the case of high-pressure active medium and if
the interference effects are eliminated, the structure of
XeCl laser emission spectra is determined by a shape of
the vibration bands and their superposition with the OH-
radical absorption lines.
4. To consider this issue in more detail, it is neces-
sary to carry out studies of influence of isotopic composi-
tion of the active mixture on the fine structure of XeCl
laser radiation spectra.
Reference
1. C. Jianwen, F. Shufen, L. Miaohong, Efficient operation of
Blumlein-discharge-exited XeCl laser // Appl. Phys. Lett.,
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2. I.S. Gorban', N.G. Zubrilin, A.S. Kucherov, M.P. Cherno-
morets, The spectral composition of XeCl-laser radiation with
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598 (1984).
3. N.G. Basov, I.S. Gorban', V.A. Danilychev, N.G. Zubrilin,
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CNIatominform, 1988 (in Russian), 20 p.
n, cm–1
b
a
32420 32445
Fig. 5. Spectrum of the induced (a) and spontaneous (b) emis-
sion of XeCl molecules in the region of 0�3 transition.
Table 1. Frequencies of 0�3 transition generation spectrum.
No Wavelengths, Å Frequencies, cm�1
1. 3084.32 32412.6
2. 3084.24 32413.4
3. 3084.16 32414.2
4. 3084.01 32415.8
5. 3083.87 32417.3
6. 3083.82 32417.8
7. 3083.75 32418.6
8. 3083.58 32420.3
9. 3083.53 32420.9
10. 3083.34 32422.9
11. 3083.24 32423.9
12. 3083.06 32425.8
13. 3083.00 32426.4
14. 3082.87 32427.8
15. 3082.51 32431.6
16. 3082.32 32433.6
17. 3082.27 32434.1
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