Thickness dependences of optical constants for thin layers of some metals and semiconductors
The review comprises investigations devoted to determination of refractive index and absorption coefficient dependences on thickness for thin films of metals and atomic semiconductors. It has been shown that erroneous results were obtained in many papers and correct interpretation of the latter is...
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| Date: | 2001 |
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| Main Authors: | , |
| Format: | Article |
| Language: | English |
| Published: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2001
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| Series: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/119328 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Thickness dependences of optical constants for thin layers of some metals and semiconductors / S.A. Kovalenko, M.P. Lisitsa // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2001. — Т. 4, № 4. — С. 352-357. — Бібліогр.: 13 назв. — англ. |