XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality

Designed precision method for determining residual stresses in crystals of the KDP on the relative displacement of the rocking curves (RC), caused by the presence of tensile stress, compression from the {110} or {101}, with the asymmetric geometry of the shooting at the reflection. The error in dete...

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Bibliographic Details
Date:2015
Main Authors: Puzikov, V.M., Tkachenko, V.F., Tsurikov, V.A.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2015
Series:Functional Materials
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Online Access:http://dspace.nbuv.gov.ua/handle/123456789/119559
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:XRD method for the determination of internal stresses in KDP crystals and their relationship to the anomalous biaxiality / V.M. Puzikov, V.F. Tkachenko, V.A. Tsurikov // Functional Materials. — 2015. — Т. 22, № 3. — С. 402-407. — Бібліогр.: 17 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine

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