Raman spectra of Ag- and Cu- photodoped chalcogenide films

Raman spectra of the chalcogenide vitreous layers (As₄₀S₆₀, As₄₀S₄₀Se₂₀, As₄₀Se₆₀ ) non-doped and photodoped by Ag, Cu were measured. The spectra were analyzed in terms of a molecular model. It was ascertained, that for the spectra of photodoped As₄₀S₆₀, As₄₀S₄₀Se₂₀ layers, the shift of the main ban...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Datum:1999
Hauptverfasser: Stronski, A.V., Vlcek, M., Stetsun, A.I., Sklenar, A., Shepeliavyi, P.E.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 1999
Schriftenreihe:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/119862
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Raman spectra of Ag- and Cu- photodoped chalcogenide films / A.V. Stronski, M. Vlcek, A.I. Stetsun, A. Sklenar, P.E. Shepeliavyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 63-68. — Бібліогр.: 37 назв. — англ.

Institution

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-119862
record_format dspace
spelling irk-123456789-1198622017-06-11T03:02:27Z Raman spectra of Ag- and Cu- photodoped chalcogenide films Stronski, A.V. Vlcek, M. Stetsun, A.I. Sklenar, A. Shepeliavyi, P.E. Raman spectra of the chalcogenide vitreous layers (As₄₀S₆₀, As₄₀S₄₀Se₂₀, As₄₀Se₆₀ ) non-doped and photodoped by Ag, Cu were measured. The spectra were analyzed in terms of a molecular model. It was ascertained, that for the spectra of photodoped As₄₀S₆₀, As₄₀S₄₀Se₂₀ layers, the shift of the main bands to the high frequency side and the appearance of the additional scattering bands in the low frequency spectral range are characteristic features. For the spectra of photodoped As₄₀S₆₀ layers, such shift and significant increase in scattering were not observed. Variations in the Raman spectra with photodoping by Ag or Cu are consistent with the supposition concerning normal covalent and coordinative bond formation between metal additives and chalcogen atoms. 1999 Article Raman spectra of Ag- and Cu- photodoped chalcogenide films / A.V. Stronski, M. Vlcek, A.I. Stetsun, A. Sklenar, P.E. Shepeliavyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 63-68. — Бібліогр.: 37 назв. — англ. 1560-8034 PACS 78.30, 78.66, 82.20C http://dspace.nbuv.gov.ua/handle/123456789/119862 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Raman spectra of the chalcogenide vitreous layers (As₄₀S₆₀, As₄₀S₄₀Se₂₀, As₄₀Se₆₀ ) non-doped and photodoped by Ag, Cu were measured. The spectra were analyzed in terms of a molecular model. It was ascertained, that for the spectra of photodoped As₄₀S₆₀, As₄₀S₄₀Se₂₀ layers, the shift of the main bands to the high frequency side and the appearance of the additional scattering bands in the low frequency spectral range are characteristic features. For the spectra of photodoped As₄₀S₆₀ layers, such shift and significant increase in scattering were not observed. Variations in the Raman spectra with photodoping by Ag or Cu are consistent with the supposition concerning normal covalent and coordinative bond formation between metal additives and chalcogen atoms.
format Article
author Stronski, A.V.
Vlcek, M.
Stetsun, A.I.
Sklenar, A.
Shepeliavyi, P.E.
spellingShingle Stronski, A.V.
Vlcek, M.
Stetsun, A.I.
Sklenar, A.
Shepeliavyi, P.E.
Raman spectra of Ag- and Cu- photodoped chalcogenide films
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Stronski, A.V.
Vlcek, M.
Stetsun, A.I.
Sklenar, A.
Shepeliavyi, P.E.
author_sort Stronski, A.V.
title Raman spectra of Ag- and Cu- photodoped chalcogenide films
title_short Raman spectra of Ag- and Cu- photodoped chalcogenide films
title_full Raman spectra of Ag- and Cu- photodoped chalcogenide films
title_fullStr Raman spectra of Ag- and Cu- photodoped chalcogenide films
title_full_unstemmed Raman spectra of Ag- and Cu- photodoped chalcogenide films
title_sort raman spectra of ag- and cu- photodoped chalcogenide films
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 1999
url http://dspace.nbuv.gov.ua/handle/123456789/119862
citation_txt Raman spectra of Ag- and Cu- photodoped chalcogenide films / A.V. Stronski, M. Vlcek, A.I. Stetsun, A. Sklenar, P.E. Shepeliavyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 1. — С. 63-68. — Бібліогр.: 37 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT stronskiav ramanspectraofagandcuphotodopedchalcogenidefilms
AT vlcekm ramanspectraofagandcuphotodopedchalcogenidefilms
AT stetsunai ramanspectraofagandcuphotodopedchalcogenidefilms
AT sklenara ramanspectraofagandcuphotodopedchalcogenidefilms
AT shepeliavyipe ramanspectraofagandcuphotodopedchalcogenidefilms
first_indexed 2025-07-08T16:47:33Z
last_indexed 2025-07-08T16:47:33Z
_version_ 1837098078745657344
fulltext 63© 1999, Institute of Semiconductor Physics, National Academy of Sciences of Ukraine Semiconductor Physics, Quantum Electronics & Optoelectronics. 1999. V. 2, N 2. P. 63-68. PACS 78.30, 78.66, 82.20C Raman spectra of Ag- and Cu- photodoped chalcogenide films A. V. Stronski a*, M. Vlcek b, A. I. Stetsun a, A. Sklenar b, P. E. Shepeliavyi a a - Institute of Semiconductor Physics of NASU, 45, prospect Nauki , 252028 Kiev, Ukraine b - Pardubice University, Pardubice, Czech Republic Abstract. Raman spectra of the chalcogenide vitreous layers (As40S60, As40S40Se20, As40Se60 ) non- doped and photodoped by Ag, Cu were measured. The spectra were analyzed in terms of a molecular model. It was ascertained, that for the spectra of photodoped As40S60, As40S40Se20 layers, the shift of the main bands to the high frequency side and the appearance of the additional scattering bands in the low frequency spectral range are characteristic features. For the spectra of photodoped As40Se60 layers, such shift and significant increase in scattering were not observed. Variations in the Raman spectra with photodoping by Ag or Cu are consistent with the supposition concerning normal covalent and coordina- tive bond formation between metal additives and chalcogen atoms. Keywords: arsenic chacogenides, thin films, photodoping, Raman spectroscopy. Paper received 26.04.99; revised manuscript received 28.04.99; accepted for publication 12.07.99. 1. Introduction Chalcogenide vitreous semiconductors ( ChVS) have high transparency in the IR spectral range. This and other of their specific properties enable one to use them as a me- dia for light waveguides in optoelectronics and also in the IR technique. Among the numerous photo- and ra- diation-stimulated phenomena exhibited by ChVS - the phenomenon of the photostimulated diffusion of metal [1] (mainly Ag or Cu) into ChVS is one of the most inter- esting. Under the illumination of the ChVS layer that was deposited on the metal layer (or metal- containing layer, the order of the layers can be reversed ) the inter- action between substances in the semiconductor and metal layers occurs with the creation of an interaction product layer (photodoped layer). The phenomenon has attracted the attention of numerous investigators, vari- ous practical application possibilities (this effect leads to substantial changes in solubility rates of chalcogenide layer, which makes possible the production of various relief images) were shown for microelectronics [2-3], op- tical memory [4], holography, diffractive optics [5-9], etc. Many publications were devoted to the investigation of the photodoping mechanism and the basic physical prop- erties of this phenomenon [10-18]. However, the peculiari- ties of the interaction of metal atoms with the atoms of the chalcogenide matrix, along with the local structure of such products, have been studied very little even for the most investigated As3S3-Ag structure. This is associated with experimental difficulties while using the standard X-ray methods of investigations. Application of the optical non- destructive techniques (including the investigations of the Raman spectra ) can bring information on the changing of chemical bonds and the molecular structure for the ChVS films as a result of photodoping. It is known that some metals intensively undergo photodoping in the structures based on vitreous arsenic sul- fide and arsenic selenide . Investigations of the local struc- ture of photodoped As-S layers were carried out using Ra- man scattering [11-14]. It was found that, in general, Raman spectra in such films are analogous to those for the As-S-Ag massive glasses and indicate the presence of Ag-S bonds. The latter are analogous to those present in Ag2S compounds [11-12]. Later studies [13-14] conducted gave more detailed features of the possible formation mechanisms involving metal-impurity chemical bonds with the As2S3 glass matrix, and of the influence of impurity on the glass structure, too .The structure of the photodoped As-Se layers is less inves- tigated. In the present work, the results of the Raman spec- tra investigations of ChVS (As40S60, As40Se60, As40S40Se20 compositions) and their modifications with photodoping by A. V. Stronski et al.: Raman spectra of Ag- and Cu- photodoped... 64 SQO, 2(2), 1999 Ag or Cu are presented and discussed. The peculiarities of the formation of the metal-chalcogenide bonds are discussed. 2. Experiment The bulk materials (As40S60-xSex, x = 0; 20; 60) were pre- pared by the direct synthesis from 5N purity elements in evacuated quartz ampoules at 700 - 750 oC for 8 - 24 hrs. After synthesis , the ampoules were quenched in cold water. Thin ChVS films (d = 0.4-5 µm) and metal (Ag,Cu with d = 0.01-0.2 µm) were sequentially deposited by the vacuum thermal evaporation (p = 1.33×10-3 Pa) from the resistance-heated quartz or Mo boats onto clean glass substrates (microscopic slides) kept under room temper- ature. Deposition rate was continuously measured using the quartz microbalance technique, and in the present study it was within 1 - 6.0 nm/s. The prepared two-layer ChVS-metal structures were exposed to light in order to photodissolve and uniformly spread the metal in the ChVS film. An incandescent lamp was used for expo- sure. The concentrations of the metal in the photodoped samples were determined by the mass proportion of the deposited metal and ChVS. The metal concentration in- tervals for the investigated samples were chosen by tak- ing into account the photodoping peculiarities in such structures. The Raman spectroscopy investigations were carried out by using BRUKER IFS55 IR spectrophotometer with a FRA 106 accessory. The laser irradiation on the wave- length 1,06 µm was used for the excitation of the Raman spectra. In our case , this wavelength value was very essen- tial because irradiation of samples in this range causes no detectable photostructural transformations or photodoping processes. 3. Results Raman spectra of the investigated materials are presented in Fig.1-3. For each of the investigated compositions (As40S60, As40Se60,and As40S40Se20) the spectra of the mas- sive glass, the thermally- evaporated film and the photodoped film are presented. While normalizing on the intensity max- imum, a correlation is observed in the spectral position and form of the most intense main bands of the thermally depos- ited film and the corresponding massive glass. This indi- cates the presence of the same structural elements in them, which determines the scattering characteristics in the spec- tra of both the massive glass and the film. However, at the same time, differences are also observed between these two types of spectra. In general, they are characterized by the appearance of the additional weak bands in the spectra of the films. This difference is more pronounced for As40S60 and less for As40Se60. In the spectrum of the thermally evaporated As40S60 film the number of bands is equal to 14 (see Fig.1, curve 3), which corresponds to the results obtained in an earlier investiga- tion [19]. In the region of the main maximum at 345 cm-1 the splitting can be seen, which is absent in the spectrum of the massive glass. From the results of previously carried out investigations [20-21], it is known that these differences as well as the numerous weak bands in the 50-250 cm-1 range, and also the band near 495 cm-1, are due to the presence of non-stoichiometric structural units of As4S4 and S2 in the structural network of the thermally-evaporated As40S60 film. The main maximum in the spectrum of the photodoped layer in relation to the maximum for the initial nondoped layer is shifted to higher wavenumber, namely to 373 cm-1 (see Fig.1, curve 4). The spectrum of the photodoped layer is also characterized by the presence of a second intensive Fig. 1. Raman spectra of As40S60: 1 � bulk glass ; 2 � As40S60 layers annealed in Ar atmosphere; 3 � as-evaporated As40S60 layer; 4 � As40S60 layer photodoped with Ag (As2S3Ag2.2). 100 200 300 400 500 600 0 2 4 6 ~ 343 145 186 217 270 373 363 345 234 223191 169 136 495 4 3 2 1 I, a rb . u n . λ , cm -1 A. V. Stronski et al.: Raman spectra of Ag- and Cu- photodoped... 65SQO, 2(2), 1999 band near 217 cm-1. The wavenumber position of several bands and shoulders in this spectrum, in 50-190 cm-1 range is near to the position of the weak bands in the spectrum of the thermally-evaporated As40S60 film. It is necessary to mention here that under the annealing ( see Fig.1, curve 2) or the exposure processes of As40S60 films there is no sig- nificant change of the main maxima position, and the corre- sponding spectra approach the spectrum of massive glass (see Fig.1, curve 1). The polymerization that proceeds un- der the exposure or annealing of As40S60 films decreases the number of the nonstoichiometric structural units As4S4 and S2 , that leads to the sufficient intensity decrease of cor- responding to them weak bands in the 50-250 cm-1 range, and also of the band near 495 cm-1. It can be seen from the comparison of curves 1-3 that the result involving only po- lymerization processes (see curve 2) is sufficiently differ- ent from the changes observed after photodoping processes (see curve 4), where the polymerization processes and pho- tostimulated introduction of silver proceed simultaneously. In the spectrum of thermally-evaporated As40Se60 layer the band position of the most intense band is near 224 cm-1 (see Fig.2, curve 2), that practically coincides with the po- sition of the maximum in spectrum for massive glass with the same composition. The maximum in the spectrum of the As40Se60 layer photodoped by silver (see curve 3) is situated practically at the same wavenumber. In the spec- trum of the thermally-evaporated As40Se60 film the asym- metry of the main band and the presence of weak bands in the region 50-175 cm-1 can be seen. Such differences in spectra of the film and massive glass As40Se60 are explained by the presence in the films network of the nonstoichiomet- ric structural elements, similar to those that are present in the network of the arsenic sulfide layers [20]. As a result of the photodoping of As40Se60 with silver, the intensity of the scattering in the wavenumber region less then 175 cm-1 is increased in a such way that the weak bands which are char- acteristic for the As40Se60 film are not seen (see Fig. 2, curve 3), new maxima are not observed. The most intensive bands in the Raman spectra of thermally-evaporated As40S40Se20 layers are located near 222 and 343 cm-1 (see Fig. 3, curve 2) which are near to the band maxima positions in the spectra of the layers for the extreme compositions (As2S3 and As2Se3). The differences in the spectra of massive As40S40Se20 glass from the spectra of the layers in general are in agree- ment to those that were observed in the spectra of As2S3 and As2Se3 layers in relation to their corresponding massive glasses. As a result of photodoping of As40S40Se20 by silver up to the ∼ 25 at% concentration the band maxima positions (222 and 343 cm-1 ) are shifted to the high wave- number region up to 234 and 353 cm-1, respectively (see Fig. 3, curve 4). Curve 3 of the same figure corresponds to the sample involving photodoping of the As40S40Se20 film up to ~ 10 at% Photodoping of the As40S40Se20 layers by copper also causes the shift of the maxima to 232 and 352 cm-1 , respectively (see Fig. 3 curve 5). In all spectra for As40S40Se20 layers photodoped by metals, the wave- number positions of the shoulders near 188, 146, 135 cm-1 coincide with the positions of the corresponding weak bands in the spectra of the initial layers. 4. Discussion The vibrational spectra of the chalcogenide glasses show differences with respect to other amorphous materials. The influence of the matrix elements that modulate the density of the phonon states is more strongly pronounced. In this connection, the main peculiarities of the Raman spectra of the arsenic-containing ChVS are in agreement with the molecular selection rules for the AsX3 (X = S, Se) pyrami- dal structural units in the glass [22-25]. The most intense bands in the Raman spectra of As2S3 and As2Se3 occur near 345 cm-1 and 224 cm-1 and correspond to the ν1(A) valence vibrations of the corresponding pyramidal structural units in the glass. The deformation vibrations ν3(E) near 310 cm-1 for As2S3 and 216 cm-1 for As2Se3 are pronounced weaker. The stretching and compression force constant Kr of As-X Fig. 2. Raman spectra of As40Se60: 1 � bulk glass ; 2 � as-evaporated As40Se60 layer; 3 � As40Se60 layer photodoped with Ag (~ 10 at%). 100 200 300 400 500 600 0 1 2 3 4 5 6 ~ 234 348 352 232 234 353 253 348 146 135 188 201 360 343 257 222 5 4 3 2 1 I, a rb . u n . λ, cm -1 100 200 300 400 500 600 0 2 4 6 8 10 12 ~ 159 137 148 170 112 224 3 1 2 I, a rb . u n . λ, cm -1 Fig. 3. Raman spectra of As40S40Se20 layers: 1 � bulk glass ; 2 � asevapo- rated As40S40Se20 layer; 3, 4 � photodoped with Ag ~ 10 and 25 at%, respectively; 5 � photodoped with Cu. A. V. Stronski et al.: Raman spectra of Ag- and Cu- photodoped... 66 SQO, 2(2), 1999 bond that determine the wavenumber of the valence vibra- tions can be calculated according to the Gordy rule [23, 26]: Kr = aN(XAsXx/d2)3/4 + b, ( 1 ) where a and b are empirical constants, N is the order of the bond, XAs and Xx are the electronegativities of the corre- sponding elements, and d is the bond length. As mentioned above, the introduction of metals into the As40S60 and As40S40Se20 layers causes the shift of the Raman maxima to the region of higher wavenum- bers. The wavenumber position for the maximum of the photodoped As40Se60 spectrum remains the same as for the initial nondoped layer. It is important to note that such changes in the Ra- man spectra for the As40S60 and As40S40Se20 layers or the absence of essential changes for the As40Se60 layers are characteristic for the photodoped ChVS layers with the substantial dopant concentration, when the number of the metal atoms is near to the number of chalcogene at- oms and for some concentrations exceeds the number of pnic- tide atoms. For example, the optimal concentration of Ag dur- ing photodoping of the As2S3 layers is 30-32 at%, which cor- respond to the composition As2S3Ag2.2-2.4 [27]. Thus, the given set of experimental results can be explained by the formation of specific bonds between the metal and the chal- cogen atoms. In the given case, the same principle acts, which explains the weak influence of some dopants on the ChVS electrophysical properties and when the valence demands of the dopant are satisfied at the cost of lone pair electrons [28]. It was shown that the metal with V valence in the ChVS melt forms V normal covalent bonds in the place of broken bonds and 4 - V coordinative bonds formed with the partic- ipation of the lone pair electrons from chalcogene atoms [ 29-30]. In the network structure of the thermally- evaporat- ed film of As2SxSe3-x composition, the number of broken bonds can exceed 7 at % [31]. Thus, a certain amount of metal atoms can be bonded by means of normal covalent bonds. The presence of the intense band in the spectrum of the photodoped layer near 217 cm-1 supports this sugges- tion. The presence of several shoulders in the region 50- 260 cm-1 in the spectrum of thermally-evaporated As40S60 layers, whose wavenumber positions correspond to the po- sitions of weak bands, which are connected to As-As vibra- tions, indicate that the covalent pnictide bonds (As-As) also contribute to this part of spectrum. The band near 495 cm-1 which indicate the presence of the non-stoichiometric struc- tural units S2 in the photodoped As40S60 layer is absent. This can be explained by sulfur bonding with metal during photodoping processes (normal covalent bonds) and also by the polymerization . Illumination induces polymeriza- tion processes between the S-rich and As-rich parts of the films, resulting in formation of As2S3 network structure. The content of these molecular fragments is decreased because of these reactions. As said above, the polymerization processes and photo- stimulated introduction of silver proceed simultaneously. Nevertheless , the other metal atoms satisfy the demands of their chemical valency at the cost of coordinative bonds for- mation. In accordance with the nature of such bonds after their formation there is no destruction of pyramidal struc- tural units of As-S-Se glasses, that is in agreement with pres- ervation of the main bands characteristic for the undoped samples in the Raman spectra of the investigated photodoped As-S-Se layers. Sulfur-silver coordinative bonds also con- tribute to the band at 217 cm-1. Under formation of the co- ordinative bonds metal-chalcogene, partial redistribution of the charge density of the lone-pair electrons from the chal- cogene to metal atom occurs. Due to this, the effective elec- tronegativity of the chalcogene increases, which in accor- dance with the Gordy rule leads to an increase of the force constant Kr. This force constant change is observed in the Raman spectra of As2S3 as the shift of the maximum to the higher wavenumber side. The absence of shift of the maximum in the Raman spectra of photodoped As2Se3 can be explained in the following way. The atomic mass is more than two times bigger for selenium than for the sulphur. Thus, under the same relative increase of the force constant the effect of the redistribution of the density of phonon states must be less pronounced. One the essential reason more for the observed differences in the spectra of As2S3 and As2Se3, can be the smaller metal concentration up to which the ar- senic selenide is photodoped. In the investigations of the IR spectra of GeSe2 and As2Se3 photodoped by metals the displacement of the density of phonon states to the high wavenumber side (that was characteristic for As2S3 and GeS2 [32]) was not observed. This experimental results shows that under the formation of the coordinative metal-selenium bonds, the charge transfer is less pronounced, then for the metal- sulphur bonds. Also, it is known, that Ag-S (Ag-Se) bonds which form the Ag2S(Se) structure have weak cross-sections of Raman scattering [12]. Therefore, a substantial amount of Ag-Se bonds in As2Se3Agx prod- ucts will be hardly observed in Raman spectra. Besides that, it can be seen from the comparison of the spectra of thermally evaporated As2S3 and As2Se3 films that the bands corresponding to the presence of the homopolar bonds are sufficiently weaker in the Raman spectrum of As2Se3 film. Thus, they are also hardly observed in the Raman spectrum of photodoped As2Se3 layer. In the network structure of the As-S-Se glasses, the chaotic replacement of chalcogenes of one type by chalco- genes of another type takes place [33-34]. This can explain why the displacement value of the main maxima in the Ra- man spectra of the As40S40Se20 layer photodoped by silver or copper has an intermediate magnitude between those ob- served for the two extreme stoichiometric compositions. It is necessary to note here that in the region of main band 234 cm-1 in the Raman spectra of the As40S40Se20 layer photodoped by silver the weak bands, corresponding to the presence of the As4S4 and S2 nonstoichiometric structural units within the films network (see Fig.1, curve 3) are also present. This circumstance makes clouds the interpretation of its evolution. In the spectrum of As40S40Se20 layer photodoped by silver up to the 25 at% the intensity ratio between the bands at 234 and 353 cm-1 is preserved the same A. V. Stronski et al.: Raman spectra of Ag- and Cu- photodoped... 67SQO, 2(2), 1999 as in the spectrum of the nondoped layer involving the bands at 222 and 343 cm-1. Taking into account the results of the previous investigations of the IR absorption spectra of the photodoped As2S3 layers [35], we can consider these ex- perimental data to be good evidence that during the photodoping of the As2SxSe3-x compositions, no destruc- tion of the pyramidal structural units in films takes place. The main mechanism, that enables the structural elements of chalcogenide glasses to remain indestructible under the photodoping by the metals is that the lone-pair electrons of the chalcogene atoms are not taking part in the formation of the AsX3 pyramids. Usually, the coordinative bonds are weaker than covalent ones [36]. Thus, the formation of the coordinative metal-chalcogene bonds doesn�t lead to the destruction of the structural units of the glass, and can in- fluence only the dynamical characteristics of this structural elements. Under the formation of such bonds during the photodoping process or processes of the photostimulated mass transfer of metal through the photodoped layer, the ions of metal are diffuse along the sites of the lone-pair elec- trons belonging to the chalcogene atoms. The formation of the normal metal-chalcogene covalent bonds occurs by means of metal diffusion on the sites of defects of the amor- phous matrix. Two types of metal photodiffusion channels correspond to two types of the structural centers [35], and presence of the different activation energy values for the silver photostimulated diffusion into ChVS during the var- ious stages of the process [15, 37] supports this suggestion. 5. Conclusion The study of Raman spectra of Ag- and Cu- photodoped chalcogenide films revealed that changes in the Raman spectra with photodoping by Ag or Cu are consistent with the suppositions concerning normal covalent and coordinative bond formation between metal additives and chalcogen atoms. Such behaviour is in accordance with the principle, which explains the slight influence of the additives on the electrical properties of chalcogenide glasses, when valence demands of additive atoms are satis- fied at the cost of lone-pair electrons. The introduction of a high concentration (10-30 at%) of doping metal in As40S60- xSex does not lead to destruction of a large fraction of struc- tural unit bonds. Acknowledgements The authors wish to express their gratitude to Prof. I. Z. In- dutnyi and Dr. A. A. Kudryavtsev for valuable discussion and critical reading the manuscript. References 1. M. T. Kostishin, E. V. Michailovskaya, P. F. Romanenko, On the effect of photographic sensitivity of thin semiconductor layers on the metal substrate // Sov.Phys. Solid State 8(2), pp.571-576 (1966). 2. Y. Mizushima, A. Yoshikava, Photoprocessing and lithographic ap- plications, in Amorphous Semiconductors Technol. and Devices, Y. Hamakava, Ed., OHM,Tokyo, and North-Holland, Amsterdam, pp.277-295, (1982). 3. P. E. Shepeljavi, A. V. Stronski, I. Z. Indutnyi, Fabrication and properties of vacuum inorganic resists, Proc. of Ukranian Vacu- um Society, Kiev:IMF NASU, 1, pp.324-327 (1995). 4. I. Z. Indutnyi, P. E. Shepeljavi, P. F. Romanenko, I. I. Robur, and A.V.Stronski, The films of chalcogenide glasses as media for the fabrication of diffraction elements and holographic recording of in- formation, SPIE Proc. 3055, pp.50-53 (1996). 5. A. V. Stronski, M. Vlcek, J. Prokop, T. Wagner, S. A. Kos- tioukevitch, P. E. Shepeljavi, As-S thin films as inorganic resists and some their applications, Proc. Ukranian Vacuum Society, 3, pp.235-237 (1997). 6. P. E. Shepeljavi, A. V. Stronski, I. Z. Indutnyi ,V. I. Minko, and I. I. Robur, Fabrication of holographic diffraction gratings with the sinusoidal groove profile on the base of As40S20Se40 layers // Opt. Eng. Bull. N 2-3 (10-11), pp.40-42 (1996). 7. A. V. Stronski. P. F. Romanenko, I. I. Robur, I. Z. Indutnyi, P. E. Shepeljavi, and S. A. Kostioukevitch, Recording of holographic optical elements on As-S-Se layers // J.Inf.Rec.Mats., 20(6), pp.541- 546 (1993). 8. P. E. Shepeljavi, S. A. Kostioukevich, I. Z. Indutnyi, A. V. Stron- ski, Fabrication of periodical structures with the help of chalco- genide inorganic resists, In Integrated Optics and Microstructures II�, SPIE Proc., 2291, pp.188-192 (1994). 9. I. Z.Indutnyi, A. V. Stronski, S. A. Kotioukevitch, P. F. Romanen- ko, P. E. Shepeljavi, I. I. Robur, Holographic optical element fab- rication using chalcogenide layers // Optical Engineering, 34(4), pp.1030-1039 (1995). 10. P. J. S. Ewen, A. Zakery, A. P. Firth and A. E. Owen, Optical monitoring of photodissolution kinetics in amorphous chalco- genide semiconductors // Philos Mag., B57(1), pp.1-12 (1988). 11. A. E. Owen, A. P. Firth, P. J. S. Ewen, Photoinduced structural and physico-chemical changes in amorphous chalcogenide semi- conductors // Phil Mag. B, 52(3), p.347-362 (1985). 12. A. E. Owen, A. P. Firth, P. J. S. Ewen, Photoinduced structural and physico-chemical changes in amorphous chalcogenide semi- conductors // Phil Mag. B, 52(3), p.347-362 (1985). 13. I. Z. Indutnyi, A. I. Stetsun, V. I. Zimenko, V. G. Kravetz, B. D. Nechiporuk, Influence of silver photodoping on IR and Raman spectra of amorphous arsenic sulphide layers // Ukrainian Journ. of Physics, 38(3), pp.377-381 (1993). 14. I. Z. Indutnyi, A. I. Stetsun, M. V. Sopinski, B. D. Nechiporuk, � Optical investigations of the local structure of impurity Ag cen- ters in photodoped As2S3 layers , In.: �Optoelectronics and Semi- conductor Technique�, Kiev, Naukova Dumka, 30, p.42 (1995). 15. T. Wagner, M. Vlcek, V. Smrchka, P. J. S. Ewen and A. E. Owen, Kinetics and reaction products of the photo-induced solid state chem- ical reaction between silver and amorphous As33S67 layers // J.Non.Cryst.Sol. 164-166, Pt.II, pp.1255-1258 (1993). 16. S. R. Elliot, Photodissolution of metals in chalcogenide glasses : a unified mechanism // J.Non-Cryst.Sol,. 137-138, Pt.2, pp.1031-1034 (1991). 17. I. Z. Indutnyi, Photostimulated diffusion in thinfilm light-sensitive semiconductor-metal structures // J.Sci.Appl.Photogr,. 39(I.6), pp.65- 77, (1994). 18. A. Fisher-Colbrie, A. Bienestock, P. H. Fuoss and Mattew A. Marcus, Structure and bonding in photodiffused amorphous Ag-GeSe2 thin films // Phys.Rev.B38(17), pp.12388-12403 (1988). 19. S. A. Solin, G. N. Papatheodorou, Irrevessible thermostructural trans- formations in amorphous As2S3 films.: A light-scattering study // Phys.Rev.B-197.-15(4).-p.2084-2090. 20. R. J. Nemanich, G. A. N. Connel, T. M. Hayers and R. A. Street, Thermally induced effects in evaporated chalcogenide films I. Struc- ture // Phys.Rev. B.-18(12), pp.6900-6914 (1978). 21. M. L. Slade and R. Zallen, Raman spectra of As4S4 polymorphs: struc- tural implications for amorphous As2S3 films // Sol.State Commun, 30(6), p.p.357-360 (1979). 22. G. Lucovsky, A molecular model for the vibrational modes in chalco- genide glasses // J.Non-Cryst.Solids, 8-10, p.p.185-190 (1972). A. V. Stronski et al.: Raman spectra of Ag- and Cu- photodoped... 68 SQO, 2(2), 1999 23. G. Lucovsky, Optic Modes in amorphous As2S3 and As2Se3 // Phys. Rev.B., 6(4), pp.1480-1489 (1972). 24. R. J. Kobliska, S. A. Solin, Temperature dependence of the Ra- man Spectrum and the Depolarization spectrum of Amorphous As2S3 // Phys.Rev. B, 8(2), pp.756-767 (1973). 25. G. A. N. Connel and G. Lucovsky, Structural models for amor- phous semiconductors and insulators // J.Non-Ctryst.Solids, 31, pp.123-155 (1978). 26. W. Gordy, A relation between bond force constants ,bond orders, bond lengths, and the electronegativities of the bonded atoms // J.Chem.Phys., 14(5), p.303 (1946). 27. M. T. Kostishin, A. V. Stronski, Ju. V. Ushenin, Formation of the products of photostimulated interaction in ChVs-metal systems // J.Sci.Appl.Photogr.Sinematogr., 34(I.2), pp.81-84 (1989). 28. M. Kastner, Prediction of the influence of additives on the densi- ty of valence-alternation centers in lone-pair semiconductors // Phil.Mag.B., 37(1), pp.127-133 (1978). 29. H. Fritzhe, M. Kastner, The effect of charged additives on the carrier concentrations in lone-pair semiconductors // Phil Mag.B., 37(3), pp.285-292 (1978). 30. H. Fritzhe, P. J. Gaczi, M. Kastner, The effect of electronegativity difference on the defect chemistry in lone-pair semiconductors // Phil Mag.B., 37(5), pp.593-600 (1978). 31. F. Kosek, Z. Cimpl, J. Tulka, J. Chlebny, New analythic method for investigation of the distribution of bonds in As-S system // J.Non- Cryst.Solids, 90 , N113401-404, (1987). 32. A. I. Stetsun, PhD thesis, Kiev-1994, 150p. 33. G. Lucovsky, Structural interpretations of the infrared and Ra- man spectra of amorphous semiconductors, Proc. 5th. Conf. of Amorph. and Liquid Semicond., 1973, London,1974, p.1099-1120. 34. E. J. Felty, G. Lucovsky , and M. B. Myers, Optical properties of the mixed amorphous system As2SxSe3-x // Solid State Communs, 5, N , p.555-558 (1967). 35. A. Stetsun, I. Z. Indutnyi, Infrared absorption of Ag- and Cu- photodoped chalcogenide films // J.Non-Cryst.Solids, 202(1-2), p.113-121 (1996). 36. J. E. Hutley, Inorganic chemistry, third edition, Harper and Row, (1983). 37. M. T. Kostishin, A. V. Stronski, Ju. V.Ushenin, Temperature de- pendencies of the initial and diffusion stages of the photoprocess in arsenic chalcogenide-silver systems // J.Sci. Appl. Photogr. Sine- matogr., 29(I.6), pp.468-471 (1984).