The exact solution of self-consistent equations in the scanning near-field optic microscopy problem
The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for...
Збережено в:
| Дата: | 1999 |
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| Автори: | , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
1999
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| Назва видання: | Semiconductor Physics Quantum Electronics & Optoelectronics |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/119866 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| id |
irk-123456789-119866 |
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dspace |
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irk-123456789-1198662017-06-11T03:02:37Z The exact solution of self-consistent equations in the scanning near-field optic microscopy problem Lozovski, V. Bozhevolnyi, S. The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for solving the self-consistent integral equation. The method developed is applied to calculations of near-field optical images obtained in illumination mode. It is assumed that the system under consideration consists of an object illuminated by the field scattered by a small probe. This assumption allows us to consider multiple scattering between a (point-like) probe and an extended object as well as inside the object. The exact solution for the self-consistent field is then obtained in terms of effective susceptibility of the probe-object system. Application of our method to the description of orientation of molecular complexes at the surface is discussed. 1999 Article The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ. 1560-8034 PACS: 42.65.K http://dspace.nbuv.gov.ua/handle/123456789/119866 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| institution |
Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| collection |
DSpace DC |
| language |
English |
| description |
The macroscopic approach that allows one to obtain an exact solution of the self-consistent equation of the Lippmann-Schwinger type is developed. The main idea of our method consist in usage of diagram technique for exact summation of the infinite series corresponding to the iteration procedure for solving the self-consistent integral equation. The method developed is applied to calculations of near-field optical images obtained in illumination mode. It is assumed that the system under consideration consists of an object illuminated by the field scattered by a small probe. This assumption allows us to consider multiple scattering between a (point-like) probe and an extended object as well as inside the object. The exact solution for the self-consistent field is then obtained in terms of effective susceptibility of the probe-object system. Application of our method to the description of orientation of molecular complexes at the surface is discussed. |
| format |
Article |
| author |
Lozovski, V. Bozhevolnyi, S. |
| spellingShingle |
Lozovski, V. Bozhevolnyi, S. The exact solution of self-consistent equations in the scanning near-field optic microscopy problem Semiconductor Physics Quantum Electronics & Optoelectronics |
| author_facet |
Lozovski, V. Bozhevolnyi, S. |
| author_sort |
Lozovski, V. |
| title |
The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_short |
The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_full |
The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_fullStr |
The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_full_unstemmed |
The exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| title_sort |
exact solution of self-consistent equations in the scanning near-field optic microscopy problem |
| publisher |
Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
| publishDate |
1999 |
| url |
http://dspace.nbuv.gov.ua/handle/123456789/119866 |
| citation_txt |
The exact solution of self-consistent equations in the scanning near-field optic microscopy problem / V. Lozovski, S. Bozhevolnyi // Semiconductor Physics Quantum Electronics & Optoelectronics. — 1999. — Т. 2, № 3. — С. 45-56. — Бібліогр.: 28 назв. — англ. |
| series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
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