X-ray investigations of phase transition in Bi₂TeO₅ single crystals

This work is devoted to researching a phase transition in bismuth tellurite single crystals using a high-temperature X-ray analysis method. The cell parameter step-wise changes at 805 ◦C are revealed. Starting from the data obtained we can say that the first-type transition takes place in bismuth te...

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Datum:1999
Hauptverfasser: Domoratsky, K.V., Dudnik, E.F., Katkov, V.F., Sadovskaya, L.Ya.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики конденсованих систем НАН України 1999
Schriftenreihe:Condensed Matter Physics
Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/120589
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Zitieren:X-ray investigations of phase transition in Bi₂TeO₅ single crystals / K.V. Domoratsky, E.F. Dudnik, V.F. Katkov, L.Ya. Sadovskaya // Condensed Matter Physics. — 1999. — Т. 2, № 4(20). — С. 591-594. — Бібліогр.: 5 назв. — англ.

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spelling irk-123456789-1205892017-06-13T03:05:15Z X-ray investigations of phase transition in Bi₂TeO₅ single crystals Domoratsky, K.V. Dudnik, E.F. Katkov, V.F. Sadovskaya, L.Ya. This work is devoted to researching a phase transition in bismuth tellurite single crystals using a high-temperature X-ray analysis method. The cell parameter step-wise changes at 805 ◦C are revealed. Starting from the data obtained we can say that the first-type transition takes place in bismuth tellurite. Ця робота присвячена дослiдженню фазового переходу в монокристалах телуриту вiсмуту методом високотемпературного рентгеноструктурного аналiзу. Виявленi стрибкоподiбнi змiни параметрiв комiрки при 805 ◦С. Виходячи з отриманих даних, можна казати, що у телуритi вiсмуту має мiсце фазовий перехiд 1-го роду. 1999 Article X-ray investigations of phase transition in Bi₂TeO₅ single crystals / K.V. Domoratsky, E.F. Dudnik, V.F. Katkov, L.Ya. Sadovskaya // Condensed Matter Physics. — 1999. — Т. 2, № 4(20). — С. 591-594. — Бібліогр.: 5 назв. — англ. 1607-324X DOI:10.5488/CMP.2.4.591 PACS: 61.50.K http://dspace.nbuv.gov.ua/handle/123456789/120589 en Condensed Matter Physics Інститут фізики конденсованих систем НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description This work is devoted to researching a phase transition in bismuth tellurite single crystals using a high-temperature X-ray analysis method. The cell parameter step-wise changes at 805 ◦C are revealed. Starting from the data obtained we can say that the first-type transition takes place in bismuth tellurite.
format Article
author Domoratsky, K.V.
Dudnik, E.F.
Katkov, V.F.
Sadovskaya, L.Ya.
spellingShingle Domoratsky, K.V.
Dudnik, E.F.
Katkov, V.F.
Sadovskaya, L.Ya.
X-ray investigations of phase transition in Bi₂TeO₅ single crystals
Condensed Matter Physics
author_facet Domoratsky, K.V.
Dudnik, E.F.
Katkov, V.F.
Sadovskaya, L.Ya.
author_sort Domoratsky, K.V.
title X-ray investigations of phase transition in Bi₂TeO₅ single crystals
title_short X-ray investigations of phase transition in Bi₂TeO₅ single crystals
title_full X-ray investigations of phase transition in Bi₂TeO₅ single crystals
title_fullStr X-ray investigations of phase transition in Bi₂TeO₅ single crystals
title_full_unstemmed X-ray investigations of phase transition in Bi₂TeO₅ single crystals
title_sort x-ray investigations of phase transition in bi₂teo₅ single crystals
publisher Інститут фізики конденсованих систем НАН України
publishDate 1999
url http://dspace.nbuv.gov.ua/handle/123456789/120589
citation_txt X-ray investigations of phase transition in Bi₂TeO₅ single crystals / K.V. Domoratsky, E.F. Dudnik, V.F. Katkov, L.Ya. Sadovskaya // Condensed Matter Physics. — 1999. — Т. 2, № 4(20). — С. 591-594. — Бібліогр.: 5 назв. — англ.
series Condensed Matter Physics
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fulltext Condensed Matter Physics, 1999, Vol. 2, No. 4(20), pp. 591–594 X-ray investigations of phase transition in Bi2TeO5 single crystals K.V.Domoratsky, E.F.Dudnik, V.F.Katkov, L.Ya.Sadovskaya Dnipropetrovsk State University, 20 Kazakova Str., 320625 Dnipropetrovsk, Ukraine Received October 12, 1998 This work is devoted to researching a phase transition in bismuth tellurite single crystals using a high-temperature X-ray analysis method. The cell parameter step-wise changes at 805 ◦C are revealed. Starting from the data obtained we can say that the first-type transition takes place in bismuth tellurite. Key words: phase transition, bismuth tellurite, X-ray, diffraction maxima PACS: 61.50.K Authors [1] consider that bismuth tellurite Bi2TeO5 (BTO) possesses ferroelectric properties having undergone the second-type phase transition (PT) at the tempera- ture about 780 ◦C. BTO has Abm2 orthorhombic lattice a=11.602 Å, b=16.461 Å, c=5.523 Å according to [2]. The BTO single crystal belongs to the continuous solid solution group of Bi1−xTexO(3+x)/2 [3]. It is presumed that subcell distorted of flu- orite type with the side about 5.5 Å is a basis of this solid solution structure. The unit-cell is formed by a multiplicity along cell axes 2x3x1 respectively. The temper- ature studies of changing cell parameters and symmetry have not been carried out earlier. Therefore the aim of this work is X-ray research of Bi2TeO5 single crystals in a wide temperature range including the area of phase transition supposed. The (100), (010) and (001) single crystal plates oriented and polished with the size of 10x15x2 mm3 and the powder of the Bi2TeO5 single crystals grown were used. The single crystal boules of bismuth tellurite were prepared as in the work [4] from the melt by the Czochralski technique at the starting ratio of the Bi2O3 and TeO2 components 47 and 53 mole % respectively. The sample X-ray patterns were recorded with the DRON 2.0 difractometer (CoKα -radiation filtered). For the high- temperature measurements the UVD-2000 accessory was used. In table 1 the po- sitions and the relative intensities of X-ray maxima from the BTO single crystal powder are presented at room temperature. The difractograms of BTO single crys- tal cuts show a=11.616 Å, b=16.451 Å and c=5.524 Å at room temperature and systematic extinctions for oriented plates taking into account non-centrosymmetry are stowed to the Abm2 space group. c© K.V.Domoratsky, E.F.Dudnik, V.F.Katkov, L.Ya.Sadovskaya 591 K.V.Domoratsky et al. Table 1. Data of X-ray maxima from the BTO single crystal powder at room temperature. N d, Å I/I0, % hkl N d, Å I/I0, % hkl 1 11.601 32 100 9 2.315 9 500 2 5.791 4 200 10 1.990 34 460,402 3 3.869 6 300 11 1.726 58 133 4 3.22 100 231 12 1.688 10 480 5 3.136 34 311 13 1.611 16 462 6 2.890 >100 400 14 1.108 14 971 7 2.753 14 002 15 0.910 6 176 8 2.659 4 160 16 0 100 200 300 400 500 600 700 800 900 5.50 5.55 5.60 5.65 5.70 cC el l p ar am et er , A t, 0C 11.6 11.7 a 16.5 17.0 b (*) o 760 800 11.74 11.76 Figure 1. The temperature dependence of BTO cell parameters (changing pa- rameters at heating are shown as circles: hollow ones are low-temperature phase, solid ones are high temperature phase; and changing at cooling are shown as downward triangles: hollow ones are high-temperature phase and solid ones are low-temperature phase). 592 X-ray investigations of Bi2TeO5 crystals Table 2. The most inten- sive maxima of the sur- face deposit. N d, Å I/I0, % 1 3.24 32 2 3.14 13 3 2.76 100 4 1.58 18.5 5 1.44 6.5 6 1.38 55 7 1.48 7.5 8 1.45 5 In figure 1 the temperature unit-cell parameter changes of the bismuth tellurite single crystals are showed. As it can be seen from the figure the pa- rameters steadily increase with the temperature rise. The thermal expansion coefficients over the range of 20–780 ◦C are close to each other for all directions: αa ∼ 1.6 · 10−5 deg−1 (a-axis), αb ∼ 1.2 · 10−5 deg−1 (b-axis) and αc ∼ 1.5 · 10−5 deg−1 (c-axis). At 805 ◦C parameter values increase step-wise. The largest change occurs along b-axis (∆b is ∼ 0.36 Å or 2.3 %). For polar axis ∆c is ∼ 0.064 Å (1 %). The smallest step is noticed for the direction perpendicular to the cleavage surface (∆a is ∼ 0.006 Å or 0.05 %). The anomalies observed suggest that at 805 ◦C the phase transition takes place in the solid phase (melt point ∼ 900 ◦C [5]). Over the range 805–810 ◦C the co-existence of diffraction maxima corresponding to low- and high-temperature phases (LP and HP respectively) is noticed and the fast intensity redistribution is observed. The HP parameter values are adduced in figure 1 with the LP indexes. The transition at cooling differ from the process occurring at heat- ing by a diffusion. The LP nucleation appears at ∼ 750 ◦C. The transition to the low-temperature phase is prolonged up to 700 ◦C. It should be noticed that at the thermocycling both the situation of the parameter increasing step-wise at heating and the phase transition shift and diffusion at cooling is reproduced. The character of the cell parameter change enables us to consider the first-type phase transition taking place in BTO at 805 ◦C. This PT temperature is somewhat higher than it is given in the work [1]. Probably that is caused by somewhat different starting component contents in the samples investigated. At the durational high-temperature difractometer measurements of BTO single crystals cuts, the material sublimation effect appears. That is reflected in the X-ray patterns by the emerging of additional maxima which are revealed from the temper- ature of ∼ 750 ◦C and which last at cooling to room temperature. The substance formed is registered by sight as a yellowish-rose-tinted deposit. Moreover, while the work face of the specimen has a rough surface the back face adjoining the platinum dish practically stays undamaged. The values of the interfacial distances and relative intensities of the most intensive maxima are presented in table 2. All these lines can hardly be connected with the onset of some single composition of the Bi2O3-TeO2 system. This fact allows us to consider the surface as the coating multiphasity. As can be seen from table 2, two most intensive maxima, judging from the d multiplicity, can be referred to the same composition. At cleaning the surface coating by lapping, these maxima disappear. The chemical features of the bismuth tellurite behaviour somewhat hamper the phase transition observing. However the effects observed in figure 1 can only be explained by the structure changes, which result from the 1-st type phase transition. The data obtained confirm the DTA research data which demonstrate the endoef- 593 K.V.Domoratsky et al. fect presence at heating in the corresponding temperature region. This also indicates to the first-type phase transition. Thus, high-temperature X-ray studies of the single crystal cuts confirmed the phase transition in bismuth tellurite single crystals but that is the 1-st type transi- tion. References 1. Stefanovich S.Yu., Sadovskaya L.Ya., Antonenko A.M. Phase transition in bismuth tellurite. // Sol. State Phys., 1991, vol. 37, No. 7, p. 2215–2217. 2. Mercurio D., Farissi M. El., Frit B., Goursat P. Etude structurale et densification d’un noveaux materiau piezoelectrique Bi2TeO5. // Mater. Chem. and Phys., 1983, vol. 12, No. 9, p. 467–476. 3. Mercurio D., Frit B., Harburn G., Parry B.H., Williams R.P., Tilley R.J.D. Diffraction patterns from ordered intergrowth phases in the Bi2O3-TeO2 system. // Phys. Stat. Sol. (a), 1988, vol. 108, p. 111–122. 4. Domoratsky K.V., Kudzin A.Yu., Sadovskaya L.Ya., Sokolyanskii G.Ch. Doping in- fluence on the physical properties of Bi2TeO5 single crystals. // Ferroelectrics, 1998, vol. 214, p. 191–197. 5. Földvary I., Peter A., Voszka R., Kappers L.A. Growth and properties of Bi2TeO5 single crystals. // J. Cryst. Growth, 1990, vol. 100, p. 75–77. Рентгенівськi дослiдження фазового переходу у монокристалах Bi2TeO5 К.В.Доморацький, О.Ф.Дуднiк, В.Ф.Катков, Л.Я.Садовська Днiпропетровський державний унiверситет, 320625 м. Днiпропетровськ, вул. Казакова, 20 Отримано 12 жовтня 1998 р. Ця робота присвячена дослiдженню фазового переходу в моно- кристалах телуриту вiсмуту методом високотемпературного рентге- ноструктурного аналiзу. Виявленi стрибкоподiбнi змiни параметрiв комiрки при 805 ◦С. Виходячи з отриманих даних, можна казати, що у телуритi вiсмуту має мiсце фазовий перехiд 1-го роду. Ключові слова: фазовий перехiд, телурит вiсмуту, рентген, дифракцiйнi максимуми PACS: 61.50.K 594