Physico-Chemical model and computer simulations of silicon nanowire growth
A model of catalytically enhanced CVD growth of a silicon nanowire assembly on a substrate is developed, and growth process is simulated. Thermodynamic-kinetic theory is used for modeling of molecular transport in the gas phase, processes near catalyst surface and nanowire side of variable curvature...
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
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irk-123456789-1209782017-06-14T03:03:57Z Physico-Chemical model and computer simulations of silicon nanowire growth Efremov, A. Klimovskaya, A. Kamins, T. Shanina, B. Grygoryev, K . Lukyanets, S . A model of catalytically enhanced CVD growth of a silicon nanowire assembly on a substrate is developed, and growth process is simulated. Thermodynamic-kinetic theory is used for modeling of molecular transport in the gas phase, processes near catalyst surface and nanowire side of variable curvature, bulk diffusion of silicon adatoms through catalyst – body, and 2D nucleation. The simulation of atomic transport across surfaces is based on a long-wave approach of lattice gas approximation. To determine a character of atomic transport in TiSi₂-catalyst that is of great importance for application in Si-based technology, a density functional theory is used. The main result of modeling is that it is found a relationship between growth conditions (an initial radius of catalyst particles, their density, substrate temperature, content, pressure of gas, as well as properties of materials used) and, on the other hand, a growth rate, shape, composition, and type of atomic structure (amorphous or crystalline) of the nanowires grown. Besides, available experimental data published previously are discussed, and a qualitative agreement between theory and various experiments is obtained. This agreement gives rise to use the found relationship for controlling the nanowire growth. 2005 Article Physico-Chemical model and computer simulations of silicon nanowire growth / A. Efremov, A. Klimovskaya, T. Kamins, B. Shanina, K. Grygoryev, S. Lukyanets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 3. — С. 1-11. — Бібліогр.: 37 назв. — англ. 1560-8034 PACS: 68.70.+w, 81.10.-h, 81.15.Aa, 64.60.Qb http://dspace.nbuv.gov.ua/handle/123456789/120978 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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A model of catalytically enhanced CVD growth of a silicon nanowire assembly on a substrate is developed, and growth process is simulated. Thermodynamic-kinetic theory is used for modeling of molecular transport in the gas phase, processes near catalyst surface and nanowire side of variable curvature, bulk diffusion of silicon adatoms through catalyst – body, and 2D nucleation. The simulation of atomic transport across surfaces is based on a long-wave approach of lattice gas approximation. To determine a character of atomic transport in TiSi₂-catalyst that is of great importance for application in Si-based technology, a density functional theory is used. The main result of modeling is that it is found a relationship between growth conditions (an initial radius of catalyst particles, their density, substrate temperature, content, pressure of gas, as well as properties of materials used) and, on the other hand, a growth rate, shape, composition, and type of atomic structure (amorphous or crystalline) of the nanowires grown. Besides, available experimental data published previously are discussed, and a qualitative agreement between theory and various experiments is obtained. This agreement gives rise to use the found relationship for controlling the nanowire growth. |
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Efremov, A. Klimovskaya, A. Kamins, T. Shanina, B. Grygoryev, K . Lukyanets, S . |
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Efremov, A. Klimovskaya, A. Kamins, T. Shanina, B. Grygoryev, K . Lukyanets, S . Physico-Chemical model and computer simulations of silicon nanowire growth Semiconductor Physics Quantum Electronics & Optoelectronics |
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Efremov, A. Klimovskaya, A. Kamins, T. Shanina, B. Grygoryev, K . Lukyanets, S . |
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Efremov, A. |
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Physico-Chemical model and computer simulations of silicon nanowire growth |
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Physico-Chemical model and computer simulations of silicon nanowire growth |
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Physico-Chemical model and computer simulations of silicon nanowire growth |
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Physico-Chemical model and computer simulations of silicon nanowire growth |
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Physico-Chemical model and computer simulations of silicon nanowire growth |
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physico-chemical model and computer simulations of silicon nanowire growth |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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2005 |
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http://dspace.nbuv.gov.ua/handle/123456789/120978 |
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Physico-Chemical model and computer simulations of silicon nanowire growth / A. Efremov, A. Klimovskaya, T. Kamins, B. Shanina, K. Grygoryev, S. Lukyanets // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2005. — Т. 8, № 3. — С. 1-11. — Бібліогр.: 37 назв. — англ. |
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Semiconductor Physics Quantum Electronics & Optoelectronics |
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AT efremova physicochemicalmodelandcomputersimulationsofsiliconnanowiregrowth AT klimovskayaa physicochemicalmodelandcomputersimulationsofsiliconnanowiregrowth AT kaminst physicochemicalmodelandcomputersimulationsofsiliconnanowiregrowth AT shaninab physicochemicalmodelandcomputersimulationsofsiliconnanowiregrowth AT grygoryevk physicochemicalmodelandcomputersimulationsofsiliconnanowiregrowth AT lukyanetss physicochemicalmodelandcomputersimulationsofsiliconnanowiregrowth |
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Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
1
PACS: 68.70.+w, 81.10.-h, 81.15.Aa, 64.60.Qb
Physico-chemical model and computer simulations
of silicon nanowire growth
Aleksey Efremov1, Alla Klimovskaya1, Ted Kamins2, Bela Shanina1,
Kostyantyn Grygoryev1, Sergey Lukyanets3
1V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 45, prospect Nauky, 03028 Kyiv, Ukraine
2Quantum Science Research, Hewlett-Packard Laboratories, Palo Alto, CA 94304, USA
3Institute of Physics, NAS of Ukraine, 46, prospect Nauky, 03028 Kyiv, Ukraine
Abstract. A model of catalytically enhanced CVD growth of a silicon nanowire
assembly on a substrate is developed, and growth process is simulated. Thermodynamic-
kinetic theory is used for modeling of molecular transport in the gas phase, processes
near catalyst surface and nanowire side of variable curvature, bulk diffusion of silicon
adatoms through catalyst – body, and 2D nucleation. The simulation of atomic transport
across surfaces is based on a long-wave approach of lattice gas approximation. To
determine a character of atomic transport in TiSi2-catalyst that is of great importance for
application in Si-based technology, a density functional theory is used. The main result
of modeling is that it is found a relationship between growth conditions (an initial radius
of catalyst particles, their density, substrate temperature, content, pressure of gas, as well
as properties of materials used) and, on the other hand, a growth rate, shape,
composition, and type of atomic structure (amorphous or crystalline) of the nanowires
grown. Besides, available experimental data published previously are discussed, and a
qualitative agreement between theory and various experiments is obtained. This
agreement gives rise to use the found relationship for controlling the nanowire growth.
Keywords: silicon, nanowire.
Manuscript received 05.05.05; accepted for publication 25.10.05.
1. Introduction
Silicon-based nanotechnology is highly promising
because of its compatibility with conventional silicon
integrated technology [1- 3]. Varying the experimental
conditions allows to achieve a wide variety of nanowire
shapes [4], such as straight nearly circular right cylinders
or prisms, telescope-like objects, cones, bead-like free-
standing filaments, springs [5, 6] or even single spheres
[7]. Very often we do not know why a specific shape is
realized by a given process, or why the shape changes,
although all the process parameters appear to be properly
controlled. The wide range of realized shapes makes it
difficult to expect that any model based on chemical
kinetics or/and thermodynamics can successfully predict
or explain such complicated and varied behavior. Some
doubts also arise as to the applicability of these
macroscopic tools to nanoscale dimensions. Neverthe-
less, recently obtained results have shown [8] that
considerations based on the approaches mentioned above
can predict some aspects of the experimental behavior,
especially the shape transformation of the nanoobject.
This paper is devoted to the detailed theoretical
analysis of the mechanisms responsible for quasi-1D
nanocrystal growth by catalytically enhanced CVD
technique that includes multiphase transformations in a
multicomponent medium. We consequently use concepts
of driving forces, barriers, and resistances toward atomic
or molecular transport; used together these concepts
determine the transfer of building materials along
different routes in series or in parallel towards the places
where atoms are incorporated into the growing object
and by-products are removed from the reaction zone.
The atomic transport to a solid phase and surfaces was
simulated as atomic exchange between adjacent small
cells of the surface. For a practically important case (1D
growth of silicon with the use of crystalline titanium
disilicide С49 as a catalyst), the distribution of electron
density, potential relief, and activation energy for
diffusion have been calculated for different
crystallographic planes of the catalyst using the density
functional method. This made it possible to specify
mechanisms of diffusion.
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
2
Fig. 1. General view of interaction of gas phase with the ensemble of growing nanowires (arbitrary scale) and distribution of
fluxes of substance considered in the model of individual nanowire growth. Arrows indicate macroscopic distribution of active
gas or adatom fluxes. 1–5 are zones of gas phase listed in the text; h and Dn–n are an average height and distance between
neighboring nanowires, respectively, 6 is the substrate. Letters corresponds to considered parts of the nanowire: external surface
of a catalyst particle (C), interface (I), sidewall (S), nearest vicinity of the gas phase (G).
The paper is organized as follows. Section 2 presents
a basis of physical model and contents: a review of
physical processes included in the model (subsec-
tion 2.1), mathematical description of gas transport of
silane (subsection 2.1.1), temperature distribution in the
gas phase near the substrate, chemisorption stage (sub-
section 2.1.2), diffusion processes on the surface, bulk
and interface of the catalyst particle (subsection 2.1.3)
and nanowire side (subsection 2.1.4). Mathematical
formulation of the model is presented in 2.2 and results
are discussed in Section 3.
2. Physical model
2.1. Review of physical processes included in the model
In contrast to the growth models proposed earlier [4, 9,
10], which were forced to be more or less schematic, we
have tried to take into account all the important stages of
the nanowire growth process.
To simulate the growth, we will restrict ourselves to
the consideration of silicon nanowire growth on a silicon
substrate by using silane in a mixture with hydrogen
(SiH4+H2). Transition to different gaseous mixtures will
not lead to qualitatively new processes although it will
affect the growth quantitatively. As a catalyst, any of
metals used in this process may be considered (e.g., Au,
Ni, Pt, Pd, Ga, Cu) or chemical compounds being in
liquid, solid or even crystalline state during crystal
growth. Catalytic particles are supposed to be previously
formed on the silicon substrate. Hereafter, they are
assumed to be hemispheres with the radius R .
Simulations included two groups of the processes,
which are treated in different manners. The first group
concerns the gas-phase transport of SiH4 molecules to
the vicinity both of the catalyst particle, and towards the
side of the nanowire. The second group involves various
processes on solid phase surface, at catalyst/nanowire
interface, and in the bulk of catalyst. General view of the
growing nanowire and fluxes responsible for mass
transfer in the vicinity of the nanowire and on the
surface of the object are shown in Fig. 1. In the present
approach, the mass-transfer in gas phase is considered as
a steady-state macroscopic flux caused by chemical
potential difference and determined by respective
“resistances” and barriers at different stages of the gas-
phase delivery. Therefore, here we consider only the
nanowire growth, corresponding to the steady-state gas-
phase conditions. On the other hand, the mass-transfer
onto the surface or into the bulk of a growing object is
considered in the framework of an approach similar to a
lattice-gas approximation (Fig. 1). Namely, the catalyst
surface, catalyst/nanowire interface, and nanowire
sidewall are divided into discrete cells, exchanging with
each other by silicon or hydrogen adatoms, and
undergoing also the adsorption and desorption of gas-
phase molecules.
2.1.1. Gas phase
In the steady-state mode, the gas phase may be subdi-
vided into five zones (numeration is shown in Fig. 1):
1. Forced convection region, blown by the gas
mixture, where the input steady-state values of
concentrations of both gases are established.
2. Macroscopic diffusion layer, characterized by
normal gradient of active gas concentration as well as
normal gradient of temperature. The former is caused by
the joint active gas consumption by the whole aggregate
of the catalyst particles as well as (if any) by the
sidewalls of the growing nanowires.
3. The region directly adjacent to the ensemble of
growing wires and depleted by silane because of silane
decomposition on the ensemble.
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
3
4. Local vicinity of the individual catalyst particle.
5. Inside the nanowire ensemble.
The total effective steady-state flux which is
absorbed by the individual growing nanowire through
the external surface of catalyst can be written as
)( eqeff nnkJ ga −= , (1)
where effk ( 111
eff
−−− += RD kkk ) is the effective rate
coefficient, which includes both diffusive transport of
reactant gas through the boundary diffusion layer and the
silane decomposition reaction. The similar approach was
used for CVD of silicon in [19]. Here gn is the active
gas concentration in the first zone, eqn is an equilibrium
concentration near the solid surface. It is modified by the
Gibbs-Thomson effect [17, 18] accounted usually in
precipitate growth consideration and used for expla-
nations of microwire growth [4]:
,)/1(
)/exp(
Beq0
Beq0eq
TkKn
TkKnn
mmm
mmm
Ω+≈
≈Ω=
γ
γ
(2)
where the average curvature RKc /2= for the
hemispherical surface of the catalyst nanoparticle and
RKs /1= for the side of the cylindrical nanowire, mΩ
is the atomic volume of silicon, and mγ is the specific
surface free energy for the catalyst ( cm = ) or for silicon
( sm = ), eq0n is the equilibrium concentration for the
corresponding flat surface, T is the gas temperature
near the surface of catalyst. Using the reaction rate
theory and mass-balance considerations [16-18] the
diffusion and reaction rate coefficients for our case may
be obtained in the form:
.)exp()
2
exp(
/)1(
BB
0eq02
Tk
W
Tk
K
vnnk
acccc
scccR
−⋅
Ω
−×
×⋅⋅Φ−Φ−Θ−=
γ . (3)
)/()2/( *2 δδπ McMD DNRDk ≡⋅= , (4)
where cΘ , cΦ , and c2Φ are the fractional coverages of
the catalyst surface by silicon and hydrogen adatoms and
( 2H )-complexes [11]. Here 0v is approximately the
thermal (or diffusion) velocity for an impinging silane
molecule ( 6000 ≈v m/s), acW is the barrier for
chemisorption, cN is the number of catalytic particles per
unit area, sn is the effective average silane
concentration near the solid surface, Nu/reactord=δ is
the thickness of diffusion layer [12], reactord is the
characteristic size of reactor, Nu is the Nusselt criterion
and MD is the molecular diffusion coefficient. The
particular case of small admixture of silane in gas
mixture with hydrogen is well studied both
experimentally [12] and theoretically [13, 14] and
1
total
75.1 −∝ PTD gM , where gT is the temperature of gas.
The approximate formulas that we used in calculations
[13, 14] give the similar results (difference did not
exceed 20 %). The input gas mixture temperature was
usually close to the room one, and the substrate was
maintained at the growth temperature Ts > 500 °C.
Therefore, there was a temperature gradient in the
direction perpendicular to the substrate surface.
According to direct experimental data [19], the thickness
of the region with variable temperature (thermal layer
[11]) may be close to the thickness δ of layer in the
CVD reactor. In this case, the thermodiffusion will result
in a small (≈ 15 %) additional counter flux of silane
molecules directed from the hot substrate to the bulk of
gas phase [12, 14]. On the other hand, the diffusion rate
constant Dk depending on MD should be averaged over
the temperature inside the diffusion layer [12].
Numerical estimations show that for totalP =10 Torr,
δ = 5 cm, R = 10−6 cm, Nc = 107 cm−2 we have
50≈MD cm2/s, δ* ≈ 3µm >> R, 5102 ⋅≈Dk cm/s. For
Rk at T = 640 °C and ≈Ω+=Δ 2/cccacac KWE γ
5.0≈ eV we have the value about of 200 cm/s. Only for
dense ensembles the diffusion delivery can limit the
process and detailed consideration of thermodiffusion is
wath-while.
Mass-transfer inside the nanowire ensemble
qualitatively depends on the ensemble density. For
quasi-isolated nanowires the silane concentration in the
vicinity of sidewall is the same as in the bulk gas phase.
For the moderate density of the wires on the substrate
when nnD − (Fig. 1) is about several free paths of asilane
molecule mλ , the mass-transfer may be treated yet as
molecular diffusion. However, the average concentration
of active gas inside the ensemble is determined by
cooperative consumption of silane by a group of nearest
neighbors. The steady-state flux on the sidewalls may be
described by relation (1) with gn replaced with eff
gn . In
this case, Rk is described by the formula (3) with
5.1≈acW eV. Using considerations similar to those in
[18] for ensemble of simultaneously growing pre-
cipitates, we may obtain the expression for sidewall of
cylindrical nanowires:
)2/ln( RDR
Dk
nn
Ms
D
−⋅
= and 111
eff
−−−
+= RD
ss kkk . (5)
At the high density of the wires when mnnD λ≤− , the
flux on sidewalls should be considered as Knudsen’s one
[13, 14] and the precise expression of the transport
coefficient depends on the peculiarities of the inside
arrangement of the ensemble. Direct Monte-Carlo
simulations of molecular trajectories would be
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
4
worthwhile here [15]. We will consider this problem in
detail in another work.
2.1.2. Processes in solid phase
In this model, we consider the following growth-related
processes in the solid phase.
(i) Single center adsorption of silane [11, 20] (on the
catalyst or on the side surface) accompanied by release
of silicon and hydrogen adatoms and subsequent
desorption as molecular hydrogen (empty arrows,
Fig. 1):
adad4 H4SiSiH +→ ,
↑→→ 2ad2ad H)(HH2 . (6)
Possible intermediate by-products (e.g., SiH3, SiH2,
and SiH) are not considered in the present model.
(ii) Bulk diffusion of silicon atoms towards the top of
the nanowire through the catalyst particle.
(iii) Surface diffusion of adatoms across the catalyst
nanoparticles to the catalyst/Si interface.
(iv) Diffusion of adatoms along the interface to form
an atomic step that propagates from the periphery to the
center of the nanowire.
(v) Adatom transport from the catalyst surface
toward and along the side of the nanowire.
(vi) Nucleation and growth of 2D nucleus both on the
sidewall and at the interface.
2.1.3. Migration of adatoms
In the considered problem, the two-component surface
diffusion of silicon and hydrogen having different local
surface mobility is of importance. In general, the
effective diffusion coefficient of each component
depends nonlinearly on surface site occupation by both
components. Besides, at coverages near percolation limit
a set of new nonlinear effects and instabilities caused by
topology peculiarities of atomic arrangement, e.g.,
surface flux anisotropy are predicted. All of these effects
are out of scope of this paper and will be considered in
another work. On the surface divided into cells [20], the
atomic migration (diffusion) along the surface (interface)
is considered as averaged spill over from cell-to-cell
with characteristic (mesoscopic) frequency of
transfer 2
loc / cm LDαν = , i.e., Einstein’s relation adopted
as valid, which is to be a case not very close to
percolation threshold. Here, τλ 4/2
loc =D is the local
diffusivity in the commonly used Arrhenius form, cL is
the size of cell, and α is the numerical coefficient,
depending on the shape of cell [12]. Local fluxes
between the cells are governed by the total number of
unoccupied sites in the destined cell. Exact analytical
solution for n-component lattice gas gives corresponding
multiplier as )1)...(1)(1( 21 nθθθ −−− [21] for probability
of a jump to the destine cell, valid however only for
small coverage. For this multiplier extrapolation we
adopt the approximate formula in the
form )...1( 21 nθθθ −−− . We will check it and defined
more exactly by MC experiments.
Respective “diffusion” terms in the balance equation
for coverage with silicon ( Θ ) and hydrogen ( 1Φ )
adatoms for some cell are presented in the model in
finite-difference form as follows:
,)1(
)1(
ˆ
21
Si
21
Si
2
Si
∑
∑
Θ⋅Φ−Φ−Θ−+
+Φ−Φ−Θ−⋅Θ−=
=Θ→Θ∇
m
mmm
m
mmmm
DD
ν
ν (7)
,)1(
)1(
ˆ
121
H
21
H
1
11
2
H
∑
∑
Φ⋅Φ−Φ−Θ−+
+Φ−Φ−Θ−⋅Φ−
=Φ→Φ∇
m
mm
m
mmmm
DD
ν
ν (8)
where summation is taken over nearest cells adjacent to
the considered one, 2Φ is the coverage with immobile
2H -complexes. Atomic migration along nanowire is
complicated by the energetic nonequivalence of different
parts of the surface, caused by varied parameter γK
where γ is the surface free energy and K is the
curvature. For nanowire with a cylindrical body and
hemispherical catalyst particle, it may only result in the
addition flux from catalyst surface to sidewall. However,
for nanowires with complicated shape we will have an
addition drift component of surface flux in the mass
balance throughout the surface. It may be presented in
the following form:
( )K
Tk
DJ
S
dr γσ ∇Θ
Ω
−=
B
Si , (9)
where Ω is the atomic volume, Kγ relates to the part of
the surface, belonging to the given cell, σ is the number
of sites per init area. We will touch the problem of
evolution of complicate forms in Discussion. The
alternative mechanism of silicon adatoms delivery to the
interface is the bulk diffusion through the catalyst
particle or droplet. Therefore, we consider the models
suitable for two kinds of catalysts: a gold-silicon alloy,
which is liquid during the nanowire growth, and TiSi2
(C49), which is solid during growth. For the gold-silicon
system, we take the diffusion of Si in a gold catalyst
droplet to be isotropic and consider a two-step process.
First, Si atoms accumulate in the bulk of the catalyst up
to a (temperature-dependent) solubility limit *C ; silicon
atoms then precipitate from the catalyst onto the top of
the nanowire and are incorporated there.
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
5
a b c
Fig. 2. Atomic arrangement at TiSi2 surface.
a – Primitive cell of C49 TiSi2; the lattice parameters are: da = 3.6 Å, db = 13.76 Å, dc = 3.62 Å. Silicon atom rows correspond to
the directions of easy diffusion (b). Map of the electron density ρ in the (110) plane; ρmax = 0.05 el/a.u.3 (a.u. = 0.529⋅10-8cm);
ρmin = 0.0005 el/a.u.3. Distance between lines corresponds to Δρ = 0.001 el/a.u.3 (c) Scanning-tunneling micrograph of TiSi2
island [23].
In order to determine the character of atomic transport
across the TiSi2 (C49) surface and through its bulk, we
computed the electronic structure for TiSi2 (C49). Its
crystalline cell is shown in Fig. 2a. The calculations
were done using the full-potential linearized augmented
plane-wave method based on the Kohn-Sham-
Hohenberg density-functional theory to account for the
exchange-correlation energy. A computational program
package WIEN-2k [23] was used. Fig. 2b shows a two-
dimensional map of the electronic density in the (110)
plane. This plane is the one observed on the top of the
most prevailing type of TiSi2 catalyst nanoparticles, as
well as the plane in contact with the (100) plane of
silicon at the interface. The space between two
crystallographic planes is the location of easiest
diffusion because the inter-atomic bonds are weak and
the electron density is very small in these spaces. Figure
2 shows that, for TiSi2, there are easy paths for direct
diffusion of adatoms from the external surface through
the bulk to the catalyst/silicon interface along 〈110〉
directions. Calculations show that activation energies for
diffusion of silicon through TiSi2 bulk is rather high for
the vacancy mechanism (2.72 eV), but is about 1 eV or
less for interstitial mechanism. Therefore, bulk diffusion
via this mechanism may be at least competitive channel
for atomic delivery to the growing interface.
2.1.4. Interface building up
Building up of catalyst/nanowire interface is limited not
only by atomic delivery itself, but also by interfacial
facet nucleation and growth [8]. The same process
should be on the sidewall. In addition to bulk diffusion
through the catalyst particle, we have considered
migration of Si-adatoms by first diffusing along the
catalyst surface and then diffusing along the
catalyst/nanowire interface from its periphery to its
center. Delivering Si atoms to the interface by bulk
diffusion does not introduce any qualitatively new
irregularities to the growth front; the axial growth rate is
determined by the steady-state value cΘ . It is worth to
note that the surface/interface diffusion mechanism
produces a propagating step, which results in time-
varying material consumption. The oscillations resulting
from the layer-by-layer propagation of the step at the
interface influence not only the instantaneous axial and
radial growth rates, but also the concentrations of all
silicon species, including the concentrations of adatoms
on the catalyst and even in gas phase near the surface.
Nucleation and growth for the sidewall and the interface
are included in the model as follows. When the
concentration of mobile atoms inside the cell exceeds
some equilibrium value eqΘ the primary nucleation
begins with the rate of solid-phase accumulation which
is equal to )( eqΘ−Θ⋅ g
mnβ , where nβ is the nucleation
rate constant, g
mΘ is normalized concentration of mobile
atoms (superscript “g”) on either sidewall (m = s) or
interface (m = i). Accounting for the Gibbs-Thomson
effect resulted from curvature of the boundary between a
2D-nucleus at the interface plane and the adjacent 2D-
sea of mobile atoms, we may present eqΘ as:
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
6
Fig. 3. Formation of near cylindrical nanowire with core-shell
structure.
)/exp( Blinelineeq0eq TkK⋅Ξ⋅γΘ=Θ , (10)
where eq0Θ is the equilibrium coverage by mobile atoms
in the presence of straight line atomic step, lineγ is the
line tension of the germ [8], lineK is the germ boundary
curvature (for single nucleus mode RK /1line ≈ ) and
iσ/1=Ξ is the effective area per one atom. 2D-solid-
phase, being formed at once continues to grow
irreversibly according to second-order reaction between
the solid germ and 2D-gas phase. Respective term is
s
m
g
mg ΘΘβ , where gβ is the growth rate constant,
superscript “s” relates to solid phase. Both for gβ and
nβ the simple Arrhenius form is adopted. In the model
we consider the simultaneous growth of three
monolayers at the interface and on sidewall. Besides the
jumps of mobile atoms from upper monolayer are
included in the form )1(1
s
i
g
i
g
i Θ−Θ−Θ +α . The real
elongation growth rate is calculated by direct accounting
for all atoms (irrespective of a delivery way)
incorporating at the interface region per unit area and
unit time.
2.2. Rate equations included in the model
Catalyst surface
ccccac DJt Θ+Θ⋅−=∂Θ∂ Siˆ// βσ (11)
cccasccac DkJt Φ+Φ−=∂Φ∂ H2 ˆ2/4/ σ (12)
cdescascc kkdtd 2
2
2 / Φ−Φ=Φ , (13)
RiiichssscRcccsciRc kkkkJ |||)(| Θ−Θ−Θ+= σσσ , (14)
sidewall (three monolayers)
)1()1(ˆ
)(//
111
Si
'
0
'
s
i
g
i
g
i
g
s
s
i
g
i
g
is
s
s
g
sg
g
snsa
g
s
D
Jt
−−+ Θ−Θ−Θ−Θ−Θ−Θ+Θ+
Θ⋅Θ−Θ−Θ−=∂Θ∂
αα
ββσ
(15)
s
s
g
sg
g
sn
s
s t Θ⋅Θ⋅+Θ−Θ⋅=∂Θ∂ '
0
' )(/ ββ , (16)
s
s
g
sg
g
sn
s
s t Θ⋅Θ⋅+Θ−Θ⋅=∂Θ∂ '
0
' )(/ ββ , (17)
h
g
ssscRcccshs kkJ ||| Θ⋅⋅−Θ⋅⋅= σσ , (18)
interface (three monolayers)
,)1(
)1(ˆ
)(/
11
1
s
i
g
i
g
i
s
i
g
i
g
i
s
i
g
ig
g
i
Si
i
eq
g
in
g
i
D
t
−−
+
Θ−Θ−Θ−
Θ−Θ−Θ+ΘΘ−Θ
+Θ−Θ⋅−=∂Θ∂
α
αβ
β
(19)
s
i
g
igeq
g
in
s
i dtd ΘΘ+Θ−Θ=Θ ββ )(/ , (20)
RiiicRccciRi kkJ ||| Θ−Θ= σσ , (21)
where cik , csk , sck , and ick are the rate coefficients for
different routes and directions of mass transfer
( sc ↔ and ic ↔ ) at the boundary, cσ , sσ and iσ are
the numbers of adsorption centers per unit area of
catalyst, sidewall surface, and interface, respectively.
The subscript “R” corresponds to cells both at the edge
of the dome-shaped catalyst and at the periphery of the
nanowire top, which are in contact with each other.
3. Results of simulation and discussion
To demonstrate the main features of the nanowire
growth, we present below results of numerical solution
of the system of kinetic equations (10)-(21) written for
each taken separately spatial cell on the external surfaces
or at the interface (Fig. 2). A set of dependences of the
elongation growth rate ),,( gsh PTRv of nanowires on
radius of the nanowire, temperature of the substrate and
partial pressure of silane in gas phase was calculated.
Kinetics of wire growth for different mechanisms of Si-
atom delivering is presented in Figs 3 and 4. Here the
work of the program for the growth simulation used in
the present paper is demonstrated. Kinetic dependences
for surface (interface) concentrations of various
components are shown at the left-hand side of the
window. While at the right hand side the animation of
wire growth is presented.
The time evolution of three upper monolayers just
below the moving interface is considered concurrently.
Initial increase of the concentration of mobile silicon
atoms at the interface is due to increase of Si-atom
delivery through the bulk of catalyst body and around
the catalyst external surface. Its following decrease is
caused by the mobile atoms attachment to the nucleating
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
7
Fig. 5. Dependences of the wire growth rate versus R at
sT = 913 K, eq0P = 20 mTorr and different pressure of
silane gP : 1 – 100, 2 – 75, 3 – 50, 4 – 40 mTorr. Bulk
diffusion.
Fig. 4. Formation of wire-like heterostructure with a cone-like
shell.
and growing facet. Fig. 3 shows the kinetics of nano-
wire growth, when diffusion of silicon adatoms across
the catalyst surface, interface and sidewall supplies
building blocks to the growing crystal. The nanowire
presents some heterostructure consisting of a shell and
core. It is worth to note that a thickness of the shell
depends, in particular, on the elongation growth rate.
Fig. 4 shows the growth of the nanowire, when all
the ways of silicon atom delivering including the direct
silane adsorption on the sidewall are involved into the
growth. This is a case of wire-like heterostructure with a
cone-like shell. The degree of tapering depends here not
only on relation between fluxes of substance towards the
catalyst surface and to the sidewall of the nanowire, but
also on details of behavior of mobile atoms upon the
sidewall.
The data taken for simulation consists of micropara-
meters presenting the used substances and macropara-
meters reflecting the growth conditions. To demonstrate
main peculiarities of the growth, we use micro
parameters that are close to those for bulk silicon, being
fully aware that they may be different from those for
nanoobjects. Due to the lack of the data and in order to
simplify the model, we assume all the activation
energies to be the same. Their exact values may be
estimated only from comparison with comprehensive
experiments. Nevertheless, qualitative conclusions based
on the results of simulation as well as recommendations
for the technologists of the way to control properties of
nanowires might be made.
The following microparameters were used to receive
the results presented below unless specified otherwise:
the elementary atomic volume 02.0=Ω nm3; specific
surface energy 24.6=γ eV/nm2; density of adsorption
centers (it is suggested to be equal to the density of the
surface atoms) =σ 13.57 nm−2; pre-exponent factors for
surface diffusion: across the catalyst
4
0 105 ⋅=cD nm2/ms, along the catalyst/nanowire
interface 4
0 105 ⋅=iD nm2/ms, across the sidewall
3
0 105 ⋅=sD nm2/ms; pre-exponent factors for the bulk
diffusion 4
0 102 ⋅=bD nm2/ms; activation energies
== aa EW 0.6 eV.
The simulations were carried out for the various
growth conditions that are indicated in the captions of
Figures. Instead of concentrations eq0, nng of silane in
gas phase and near the surface we give a partial
gP pressure and equilibrium eq0P pressure related to a
flat surface. Relations between them are defined by
conventional expression TkPn B/= . The total pressure
of the gas mixture is supposed to be equal to 10 Torr.
Fig. 5 shows the growth rate dependences versus the
wire radius that are corresponding to the simple case of
nanowire growth, when only one way of Si atom
delivery is accounted, namely, bulk diffusion through
the catalyst-body (arrow 7, Fig. 1). The varied parameter
for the curves is the partial pressure of silane.
This is a case when the wire grows in one direction
and in the form of homogeneous solid cylinder without
any shell.
To understand the mechanisms that are limiting the
growth, the same results are presented in coordinates v
and R/1 in Fig. 6. As can be seen from this figure, the
dependence of growth rate versus inverse radius have a
maximum at certain wire radius maxR that shifts to the
region of smaller values with an increase of the silane
pressure. Furthermore, both the left and right shoulders
of the curves indicate a linear relation between the
growth rate and the inverse wire radius. The left
shoulder of the curves maxRR ≥ is due to a limitation of
growth by diffusive delivering of Si atoms through bulk
of catalyst, while the right one maxRR ≤ taken into
account for by the Gibbs-Thompson effect. It is clearly
seen that there is a critical radius (indicated in Fig. 6 by
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
8
Fig. 6. Dependences of the wire growth rate versus R/1 at
sT = 913 K, eq0P = 20 mTorr and different pressure of silane
gP : 1 – 100, 2 – 75, 3 – 50, 4 – 40 mTorr. Bulk diffusion.
Fig. 7. Dependences of the wire growth rate versus R at
sT = 1073 K, eq0P = 20 mTorr and different pressure of
silane gP : 1 – 40, 2 – 30, 3 – 25 mTorr. Surface diffusion.
arrows), which depends on the partial pressure of silane,
i.e., on oversaturation. Furthermore, the simulation
shows that only nanowires with radii of restricted range
of values can grow at certain growth conditions. This
range is limited by the Gibbs-Thompson effect, on the
one hand, and diffusion delivering the building blocks,
on the other hand. This fundamental property of
nanowire (nanoobject) growth is of great importance for
controlling a main parameter of a nanoobject assembles
like the radius scattering.
Dependences of the growth rate with a peak shown in
Fig. 6 were experimentally observed in the works by
A. Schetinin with coauthors [10, 27-29]. The left hand
part of the curves was observed by Schubert with
coauthors [30]. An effect by Gibbs-Thompson with the
clear dependence of the critical radius on the value of
oversaturation (the right hand part of the curves) was
observed in the paper of E. Givargizov [32].
In contrast to the CVD growth considered in the
current paper, the authors [30] used MBE technology.
Nevertheless, we can also model the MBE growth and
explain these results, because CVD growth includes all
the processes involved into MBE growth. The left part of
the dependences for large oversaturations in the gas
phase is corresponding just to the case realized in [30].
In this case, the limiting stage of the wire growth is the
diffusion through catalyst. It leads to inversely
proportional dependence of the growth rate on the wire
radius. At the same time, the growth rate does not
depend on the growth time because diffusion direction
does not change during the growth. Both these features
were found experimentally in Ref. [30].
It is worth to note that an increase of the delivering
rate of Si atoms toward the growing crystal, for instance,
by increase of the diffusion coefficient or the substrate
temperature, gives rise to a quite different dependence of
the growth rate versus the wire radius. Fig. 8 shows such
dependence calculated at a higher temperature and larger
diffusion coefficient (surface diffusion). As can be seen
instead of a sharp decrease of the growth rate for large
radii (right hand part of the curves in Fig. 5), saturation
of the growth rate is observed. An experimental
conditions realized by J. Liu with coauthors [31] are
likely to fit just such case. These authors have grown the
silicon nanowires using the gas source molecular beam
epitaxy (GS-MBE) and have found that neither axial nor
radial growth rate depend on the wire radius.
An additional point to emphasize is that a character
of growth rate dependence on the wire radius may be
various. In the case studied by E. Givargizov, this
dependence were approximated by the following
formula (in our notation):
RTkP
P
v ccgn h
12
ln
Beq0
⋅
Ω
−∝
γ
, (25)
with 2≈n , whereas in our model we obtain a linear
relation between hv and R/1 .
Indeed, according to Eqs (1)-(3) in the case when the
growth is limited by a chemical reaction (it is the case of
quick Si atom diffusion), for low oversaturation we
should use the following simplified formula:
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
9
Fig. 8. Dependences of the wire growth rate versus sT/1 at
R = 5 nm, eq0P = 20 mTorr and different pressure of silane
gP : 1 – 200, 2 – 100, 3 – 75, 4 – 50, 5 – 40 mTorr. Surface
diffusion.
Fig. 9. Dependences of the wire growth rate versus pressure
of silane gP , wire radius R = 5 nm, 0eqP = 20 mTorr and
different temperatures of the substrate sT : top-to-bottom
973, 923, 873 K. Solid curves – bulk diffusion, doted curves −
surface diffusion. Arrows indicate the critical pressure of
silane, excess of which leads to the wire growth.
,)12(2
)(2
B
0
2
eq00
BB
RTk
J
ennevv
cc
c
TRk
g
Tk
E
ch
ccac
⋅
Ω
−Ω≈
≈−Ω=
ΩΔ
−
γξ
γ
0eq0
ln1
n
n
n
n g
eq
g ≈−=ξ (26)
where Tk
Eac
evnJ B
0eq00
Δ
−
= and 2/cccacac KWE Ω+=Δ γ .
So, we obtain the linear dependences of the growth rate
both on the oversaturation and inverse radii likely to the
found by simulation (Fig. 6). In the current model, we
consider the growth of nanowires, and so restrict
ourselves to a treatment of the growth based on one-
nucleation process at the catalyst-wire interface. The
dependence of the growth rate defined by the formula
(26) and found experimentally by E. Givargizov may
arise from a large radius of the wires under investigation
in that experiment and multiple two-dimensional nuc-
leations at the interface. The latter usually gives rise to
the dependence of the growth rate of the form (26) with
1≠n , because a number of nuclei, radii of which equal
to the critical one and which may grow simultaneously,
depends in its turn on oversaturation degree [25, 26].
In summary of this discussion, it should be also
pointed that there are experimental data [9] that obey the
linear relation between these parameters at least for low
oversaturations.
In Fig. 8, the temperature dependences of growth rate
are presented. These results show that nanowires of the
certain radius can grow only in a restricted region of the
temperatures. An upper limit (indicated by the vertical
doted line) is defined by the sharp increase of the growth
rate on the substrate, which prevents from the one-
dimensional growth of wires, while the most low limit
arises due to the Gibbs-Thomson effect. In a general
case, in accordance with Eq. (26), the different effective
activation energies are observed in the different
temperature intervals.
Fig. 9 demonstrates dependences of the growth rate
on the silane pressure for bulk (solid curves) and surface
(doted curves) diffusion delivering Si atoms to the
growing crystal. Both mechanisms give rise to saturation
of the growth rate at high pressures while the upper limit
of the rate is larger for larger temperatures. If we
compare these dependences with Eqs (25) and (26), we
can see some their resemblance as a whole with the
logarithmic law n
g
n
h PPv )()/(ln eq0 μΔ∝∝ , i.e.,
elongation growth rate likely depends only on chemical
potential difference. However, in fact, for small ξ we
have ξ∝hv in accordance with Eq. (26), and the whole
dependence is found to be more complicate.
All the above simulations where we consider both
the ways of building blocks delivering: surface and bulk
diffusion, lead to the growth of nanowires in the form of
solid cylinder, even if with a shell. The kinetics of such
growth may be seen in Fig. 3.
In the case when we take into account adsorption/
desorption and decomposition of silane on the sidewall
(Fig. 1), crystal grows in a shape of solid cone and
constitutes a heterostructure with a shell of the variable
thickness along the big axis of the nanowire. The kinetics
of this growth is presented in Fig. 4. The rate of a radial
growth depends on the rate of the wire elongation and the
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
10
density of the growing wires on the substrate. So, it is
evident that to suppress a cone-like growth of nanowires,
one have to prevent the processes on the nanowire side.
This may be done by using the selected dopants just as it
was done by T. Kamins with coauthors in [34]. They
introduce to the gas mixture (H2 + SiH4) additional
component HCl that gives rise to the growth of nanowires
in the form of a right cylinder.
Use of the dependences derived above can provide
the method to control the process, that is, a technique to
grow nanowires with the same length and a narrow
scatter of radii. This goal may be achieved, e.g., (Figs 5
and 6) by suppressing the bulk and surface diffusion of
Si adatoms using the specially selected dopants together
with appropriate T and P manipulation.
The model predicts that under commonly used
moderate oversaturation of the reactant gas, important
characteristics, such as the axial and radial growth rates
vh and vr, depend primarily on the reaction rate at the
surface of the catalyst or at the side of the nanowire and
only partially on the gas-phase delivery of reactant. Ho-
wever, simulations showed that delivery of Si adatoms
through the catalyst body or around its surface proves to
be an important stage. In the case when this stage begins
to limit the growth, we observe the dependences, which
are typical for limiting by gas-phase delivery.
According to the simulations, the growth rates are
also controlled by atomic hydrogen association and
desorption; i.e., by removal of the by-products of silane
decomposition from adsorption centers. We can
conclude that the catalytic features of a catalyst particle
can be caused not only by a low activation energy for
adsorption Wac but also low activation barriers for
atomic hydrogen association (Easc) and desorption
( desE ). Surface diffusion across the catalyst surface or
interface becomes the limiting step, for example, under
high oversaturation in the gas phase, or/and slow
hydrogen desorption. In this case, hydrogen-containing
species may occupy the noticeable part of diffusion sites
on catalyst surface and some kind of “hydrogen-induced
blockade” of silicon surface diffusion occurs. This effect
is masked, however, when transfer between catalyst
surface and the interface limits the delivery.
We note that two opposite processes (together with
faceting [8]) determine the shape of the nanowire body:
(i) lateral surface diffusion and (ii) surface drift induced
by the surface free energy gradient. The latter may be
caused, in turn, by the local inequality +⋅ dzdK ss /(γ
0)/ ≠⋅+ dzdK ss γ . Under steady-state conditions, the
axial distribution of mobile adatoms on the nanowire
side surface ( Siγγ =s = const) is governed only by the
local curvature:
)
)(
exp()(
B
0 Tk
zK
NzN sss
ad
Ω
−⋅=
γ
. (27)
This effect, of course, is important at moderate
temperatures. Therefore, nanowire surface regions with a
constant curvature (parts of straight cylinder or sphere)
will also have a uniform distribution of adatoms. As a
result, nanowire growth in the radial direction should
conserve the shape of the growing surface. Moreover, a
necklace-like shape consisting of a set of spheres
separated from each other by cylindrical segments with
2/sphcyl RR = has a constant curvature, and therefore,
at moderate temperatures is also a stable shape in good
agreement with the experiment [4]. In some cases, the
elastic part of the total free energy should be considered;
that may explain the tube-like microobjects [33]. We
conclude according to Eq. (27) that a conical shape is
unstable due to the curvature gradient along the axial di-
rection. The tendency to form this shape may be caused
primarily by gas adsorption and reaction on the side of
the wire. The portion of the nanowire near the bottom
will have a larger radius than the upper portion parts be-
cause it is formed earlier and is, therefore, exposed to the
incident gas for a longer period of time [34]. The flux of
adatoms from the nanowire tip (highest curvature K) to
its bottom (lowest K) also increases the tendency to form
a conical shape. In addition, the theory predicts that the
telescopic shape (with sections of different, constant
diameter) sometimes observed after heat treatments [35]
is more stable than a cylinder of the same volume.
The approach considered in this paper allows us to
predict the formation of core/shell nanostructure with
solid, compact shell. However, it is unlikely to be
applicable to the explanation of the nano-cellular
structure of the shell formed on the sides of nanowires
grown in closed tube [36, 37]. The nanocells observed in
those experiments share their facets and have hexagon or
pentagon cross-section. Dividing the total energy into
surface and bulk parts is questionable because of
nanoscale of the cells; in this case, ab initio calculations
of the structure are more appropriate.
4. Conclusions
A phenomenological model has been developed for
silicon nanowire growth on silicon substrates by CVD
using SiH4+H2 mediated by catalyst particles. The de-
pendence of the nanowire growth kinetics on radius,
substrate temperature, and partial pressure of Si contain-
ning gas has been demonstrated. Good qualitative agree-
ment between the simulations and published experiment-
tal data was obtained. The peculiarities of the nanowire
growth are discussed, and possible methods to control
the process and shape transformation are considered.
Acknowledgements
This work was performed in the framework of CRDF
Project # UE-5001-KV-03. The authors wish to express
their sincere gratitude to Prof. P.M. Tomchuk (Institute
of Physics, National Academy of Sciences of Ukraine)
for helpful discussions. The authors also thank Dr.
S. Sharma and Dr. R. Stanley Williams of Hewlett-
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2005. V. 8, N 3. P. 1-11.
© 2005, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
11
Packard for providing experimental data and for useful
discussions.
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