Radiation-stimulated processes in silicon structures with contacts based on TiN

The influence of irradiation on the structural properties of titanium nitride films deposited on silicon wafers has been considered. It has been shown that depending on the energy, fluence and type of irradiation ion, observed are the increase of accumulated damages with decreasing the grain size, t...

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Datum:2015
Hauptverfasser: Nasyrov, M.U., Ataubaeva, A.B.
Format: Artikel
Sprache:English
Veröffentlicht: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2015
Schriftenreihe:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/121149
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Radiation-stimulated processes in silicon structures with contacts based on TiN / M.U. Nasyrov, A.B. Ataubaeva // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 220-225. — Бібліогр.: 25 назв. — англ.

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spelling irk-123456789-1211492017-06-14T03:03:38Z Radiation-stimulated processes in silicon structures with contacts based on TiN Nasyrov, M.U. Ataubaeva, A.B. The influence of irradiation on the structural properties of titanium nitride films deposited on silicon wafers has been considered. It has been shown that depending on the energy, fluence and type of irradiation ion, observed are the increase of accumulated damages with decreasing the grain size, the grain size reduction with increasing the fluence, the increase of dislocation density and microstrains. 2015 Article Radiation-stimulated processes in silicon structures with contacts based on TiN / M.U. Nasyrov, A.B. Ataubaeva // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 220-225. — Бібліогр.: 25 назв. — англ. 1560-8034 DOI: 10.15407/spqeo18.02.220 PACS 61.80.-x http://dspace.nbuv.gov.ua/handle/123456789/121149 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description The influence of irradiation on the structural properties of titanium nitride films deposited on silicon wafers has been considered. It has been shown that depending on the energy, fluence and type of irradiation ion, observed are the increase of accumulated damages with decreasing the grain size, the grain size reduction with increasing the fluence, the increase of dislocation density and microstrains.
format Article
author Nasyrov, M.U.
Ataubaeva, A.B.
spellingShingle Nasyrov, M.U.
Ataubaeva, A.B.
Radiation-stimulated processes in silicon structures with contacts based on TiN
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Nasyrov, M.U.
Ataubaeva, A.B.
author_sort Nasyrov, M.U.
title Radiation-stimulated processes in silicon structures with contacts based on TiN
title_short Radiation-stimulated processes in silicon structures with contacts based on TiN
title_full Radiation-stimulated processes in silicon structures with contacts based on TiN
title_fullStr Radiation-stimulated processes in silicon structures with contacts based on TiN
title_full_unstemmed Radiation-stimulated processes in silicon structures with contacts based on TiN
title_sort radiation-stimulated processes in silicon structures with contacts based on tin
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2015
url http://dspace.nbuv.gov.ua/handle/123456789/121149
citation_txt Radiation-stimulated processes in silicon structures with contacts based on TiN / M.U. Nasyrov, A.B. Ataubaeva // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 1. — С. 220-225. — Бібліогр.: 25 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT nasyrovmu radiationstimulatedprocessesinsiliconstructureswithcontactsbasedontin
AT ataubaevaab radiationstimulatedprocessesinsiliconstructureswithcontactsbasedontin
first_indexed 2025-07-08T19:17:31Z
last_indexed 2025-07-08T19:17:31Z
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