Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields

It has been shown that the dependence between the parameters of materials of electronic equipment and external fields is determined by the distribution function of the corresponding random variable. The obtained results have been applied to the analysis of a number of physical phenomena.

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Bibliographic Details
Date:2015
Main Author: Milenin, G.V.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2015
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/121275
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Probabilistic approach to the analysis of regularities in behavior of material parameters of electronic equipment under action of external fields / G.V. Milenin // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2015. — Т. 18, № 4. — С. 456-459. — Бібліогр.: 10 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine