The influence of Cr concentration on time resolution of GaAs detectors

Investigated in this work were the influence of Cr dopant concentration and technological conditions of doping on photoconductivity (PhC) kinetics, dependence of PhC signal magnitude on voltage applied as well as the dynamic range of a photodetector based on semi-insulating GaAs:Cr. PhC relaxation w...

Повний опис

Збережено в:
Бібліографічні деталі
Дата:2006
Автори: Fedorenko, L.L., Linnik, L.F., Linnik, L.G., Yusupov, M.M., Solovyov, E.A., Sirmulis, E.
Формат: Стаття
Мова:English
Опубліковано: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2006
Назва видання:Semiconductor Physics Quantum Electronics & Optoelectronics
Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/121425
Теги: Додати тег
Немає тегів, Будьте першим, хто поставить тег для цього запису!
Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Цитувати:The influence of Cr concentration on time resolution of GaAs detectors / L.L. Fedorenko, L.F. Linnik, L.G. Linnik, M.M. Yusupov, E.A. Solovyov, E. Sirmulis // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 92-94. — Бібліогр.: 6 назв. — англ.

Репозитарії

Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-121425
record_format dspace
spelling irk-123456789-1214252017-06-15T03:03:55Z The influence of Cr concentration on time resolution of GaAs detectors Fedorenko, L.L. Linnik, L.F. Linnik, L.G. Yusupov, M.M. Solovyov, E.A. Sirmulis, E. Investigated in this work were the influence of Cr dopant concentration and technological conditions of doping on photoconductivity (PhC) kinetics, dependence of PhC signal magnitude on voltage applied as well as the dynamic range of a photodetector based on semi-insulating GaAs:Cr. PhC relaxation was measured using a broadband system of registration in the picosecond pulse range, which is based on the oscillograph C7-19, CCD camera and personal computer. Mechanisms of recombination that influence on fast and slow components of the PhC signal were studied. The shortest time of PhC relaxation τ ~ 2.10⁻¹⁰ s was observed in GaAs:Cr samples for the chromium dopant concentration NCr ~ 3.10¹⁷ cm−3. We have found a linear increase of the fast component of PhC with the intensity of excitation as well as a weak dependence at small levels and saturation at the high ones of excitation for the PhC slow component. 2006 Article The influence of Cr concentration on time resolution of GaAs detectors / L.L. Fedorenko, L.F. Linnik, L.G. Linnik, M.M. Yusupov, E.A. Solovyov, E. Sirmulis // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 92-94. — Бібліогр.: 6 назв. — англ. 1560-8034 PACS 73.50.Pz, 42.79.Pw, 61.72.Vv http://dspace.nbuv.gov.ua/handle/123456789/121425 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
description Investigated in this work were the influence of Cr dopant concentration and technological conditions of doping on photoconductivity (PhC) kinetics, dependence of PhC signal magnitude on voltage applied as well as the dynamic range of a photodetector based on semi-insulating GaAs:Cr. PhC relaxation was measured using a broadband system of registration in the picosecond pulse range, which is based on the oscillograph C7-19, CCD camera and personal computer. Mechanisms of recombination that influence on fast and slow components of the PhC signal were studied. The shortest time of PhC relaxation τ ~ 2.10⁻¹⁰ s was observed in GaAs:Cr samples for the chromium dopant concentration NCr ~ 3.10¹⁷ cm−3. We have found a linear increase of the fast component of PhC with the intensity of excitation as well as a weak dependence at small levels and saturation at the high ones of excitation for the PhC slow component.
format Article
author Fedorenko, L.L.
Linnik, L.F.
Linnik, L.G.
Yusupov, M.M.
Solovyov, E.A.
Sirmulis, E.
spellingShingle Fedorenko, L.L.
Linnik, L.F.
Linnik, L.G.
Yusupov, M.M.
Solovyov, E.A.
Sirmulis, E.
The influence of Cr concentration on time resolution of GaAs detectors
Semiconductor Physics Quantum Electronics & Optoelectronics
author_facet Fedorenko, L.L.
Linnik, L.F.
Linnik, L.G.
Yusupov, M.M.
Solovyov, E.A.
Sirmulis, E.
author_sort Fedorenko, L.L.
title The influence of Cr concentration on time resolution of GaAs detectors
title_short The influence of Cr concentration on time resolution of GaAs detectors
title_full The influence of Cr concentration on time resolution of GaAs detectors
title_fullStr The influence of Cr concentration on time resolution of GaAs detectors
title_full_unstemmed The influence of Cr concentration on time resolution of GaAs detectors
title_sort influence of cr concentration on time resolution of gaas detectors
publisher Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
publishDate 2006
url http://dspace.nbuv.gov.ua/handle/123456789/121425
citation_txt The influence of Cr concentration on time resolution of GaAs detectors / L.L. Fedorenko, L.F. Linnik, L.G. Linnik, M.M. Yusupov, E.A. Solovyov, E. Sirmulis // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 2. — С. 92-94. — Бібліогр.: 6 назв. — англ.
series Semiconductor Physics Quantum Electronics & Optoelectronics
work_keys_str_mv AT fedorenkoll theinfluenceofcrconcentrationontimeresolutionofgaasdetectors
AT linniklf theinfluenceofcrconcentrationontimeresolutionofgaasdetectors
AT linniklg theinfluenceofcrconcentrationontimeresolutionofgaasdetectors
AT yusupovmm theinfluenceofcrconcentrationontimeresolutionofgaasdetectors
AT solovyovea theinfluenceofcrconcentrationontimeresolutionofgaasdetectors
AT sirmulise theinfluenceofcrconcentrationontimeresolutionofgaasdetectors
AT fedorenkoll influenceofcrconcentrationontimeresolutionofgaasdetectors
AT linniklf influenceofcrconcentrationontimeresolutionofgaasdetectors
AT linniklg influenceofcrconcentrationontimeresolutionofgaasdetectors
AT yusupovmm influenceofcrconcentrationontimeresolutionofgaasdetectors
AT solovyovea influenceofcrconcentrationontimeresolutionofgaasdetectors
AT sirmulise influenceofcrconcentrationontimeresolutionofgaasdetectors
first_indexed 2025-07-08T19:52:43Z
last_indexed 2025-07-08T19:52:43Z
_version_ 1837109728232079360
fulltext Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 2. P. 92-94. © 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine 92 PACS 73.50.Pz, 42.79.Pw, 61.72.Vv The influence of Cr concentration on time resolution of GaAs detectors L.L. Fedorenko1, L.F. Linnik1, L.G. Linnik1, M.M. Yusupov1, E.A. Solovyov1, E. Sirmulis2 1V. Lashkaryov Institute of Semiconductor Physics, NAS of Ukraine, 45, prospect Nauky, 03028 Kyiv, Ukraine Phone: +380 (44) 525-64-77, +380 (44) 525-18-75, +380 (44) 525-59-39; e-mail: lfedor@isp.kiev.ua, ny@isp.kiev.ua, slv@isp.kiev.ua 2Semiconductor Physics Institute, 11, Gostauto, Vilnius Lt-01108, Lithuania; E-mail: sirmulis@delfi.lt Abstract. Investigated in this work were the influence of Cr dopant concentration and technological conditions of doping on photoconductivity (PhC) kinetics, dependence of PhC signal magnitude on voltage applied as well as the dynamic range of a photodetector based on semi-insulating GaAs:Cr. PhC relaxation was measured using a broadband system of registration in the picosecond pulse range, which is based on the oscillograph C7-19, CCD camera and personal computer. Mechanisms of recombination that influence on fast and slow components of the PhC signal were studied. The shortest time of PhC relaxation τ ~ 2.10−10 s was observed in GaAs:Cr samples for the chromium dopant concentration NCr ~ 3.1017 cm−3. We have found a linear increase of the fast component of PhC with the intensity of excitation as well as a weak dependence at small levels and saturation at the high ones of excitation for the PhC slow component. Keywords: GaAs, fast detector, picosecond YAG-laser, X-, γ-radiation, photo- conductivity. Manuscript received 07.02.06; accepted for publication 29.03.06. 1. Introduction Diagnostic of the pulse radiation process requires the development of ultra-fast X-ray, γ- and laser radiation detectors with nano- and picosecond times of relaxation. The detectors must precisely reproduce a pulse shape and measure its magnitude with well linearity within few orders. For such a purpose, used are semiconductor compounds with a high mobility of intrinsic charge carriers and high sensitivity to X-ray and γ-radiation, e.g. GaAs, InPCdTe, CdZnTe [1, 2]. Subnanosecond time resolution can be realized using detectors based on high resistive GaAs, InP [3, 4]. A short drop of relaxation can be obtained by decreasing the lifetime of photocarrier, e.g., Cr doping, neutron irradiation, or low temperature growing GaAs [5]. The best semi-insulating GaAs was grown with Cr doping concentration NCr ~ 1⋅1016 cm−3 and background impurities concentration Nph ≤ ≤ 5⋅1015 cm−3. Nevertheless, a short relaxation drop of the photoresponse usually takes place in the long-term component. The latter could be conditioned by the influence of both type charge carriers sticking to shallow centers, bending of the energy band in semi-insulating GaAs, low hole mobility or carrier diffusion in the field range. According to the well-known relation ne ΔΔ μσ ~ , (1), where τβkIn =Δ , σΔ − detector photoconductivi- ty, nΔ − concentration, μ − mobility, τ − lifetime of a photocarrier; σΔ decreases with τ . For the pulse shape to be reproduced, the criterion rττ << (where rτ is the characteristic time of process relaxation) should be satisfied. At the same time, the magnitude of τ must be sufficient to adjust the detector sensitivity. The aim of the paper was to determine the optimal degree of crystal doping for fast ( )ps200≤τ and highly sensitivity detectors based on GaAs doped with chromium. 2. Experimental To achieve the purpose mentioned above, the set-up for photoconductivity (PhC) kinetics measurements in semiconductor crystals under pulse laser excitation was Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 2. P. 92-94. © 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine 93 designed and adjust. The block scheme of the set-up is given in Fig. 1. The set-up consists of the YAG:Nd+3 laser with free mode-locking (1), microstrip circuit of photoconductivity signal detection (2), broad-band oscillograph (3), CCD camera (4), and PC with frame grabber (5). The train of picosecond pulses with the duration ps37=pt (tp being much less than the characteristic nonstationary relaxation time τnst) and ~16 ns pulse intervals was obtained using passive solid- state shutter based on polystyrene dye. The synch- ronization scheme of a trigger laser with oscillograph scanning and trigger of frame grabber was developed. We used semi-insulating GaAs samples with the various Cr concentrations NCr ~ 1715 103...101 ⋅⋅ cm−3, which were grown by the Czochralsky technique: using fluxing agent and horizontally oriented crystallization. To provide compensation, the GaAs:Cr crystals were grown in As vapor that ensure an electron type of conductivity when ρ ~ 109 Ohm.cm. The influence of the Cr dopant concentration on photoconductivity drop, the dependence of the PhC signal magnitude on the voltage applied and the dependence of the dynamic range of GaAs:Cr photodetectors on the radiation intensity were investigated. The samples possessed the bar-like shape with dimensions 2×2×5 mm. Their ohmic contacts were formed on the longer opposite sides, see insert in Fig. 1. Conductors had minimal length and were made of thin cooper foil μm10≤δ to reduce parasitic reactive resistance and skin-effect conjunctive. The samples were mounted in specially developed microstrip circuit adjusted with the impedance Ohm50=ρ . Typical oscillograms of GaAs:Cr PhC are shown in Fig. 2. Fig. 3 shows the dependence of GaAs photodetector signal magnitude on the voltage applied. Fig. 1. Block-scheme of the pulse PhC registration set-up with the subnanosecond duration of excitation: 1 – laser with free- mode locking, 2 – detecting semiconductor element, 3 – oscillograph C7-19, 4 – CCD camera GBC 500E, 5 – PC with video card Rage Fury Pro 32M, 6 – photodiode FD-256, 7 – lens, NG – filters. a b c Fig. 2. Typical oscillograms of PhC pulses of GaAs samples with the Cr concentration NCr: ~1.1015 cm−3 (a, b); ~ 3.1017 cm−3 (c, d). 3. Results and discussion We found that, with increasing the dopant concentration NCr, the magnitude of the long-term component of PhC relaxation is decreased, which is indicative of the extension of the fast recombination channel contribution. The highest rate τst/τnst > 10 (τst − stationary relaxation time) was observed at NCr ≅ 3⋅1017 cm−3 and responds consequently to the short relaxation time of PhC τ ≅ 2⋅10−10 s. The fact of increasing the Cr concentration does not simultaneously lead to the relaxation time Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 2. P. 92-94. © 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine 94 0 1x103 2x103 3x103 4x103 5x103 6x103 7x103 8x103 0 50 100 150 200 250 300 350 400 P ho to co nd uc tiv ity , V Electrical strengh, V/cm Fig. 3. Dependence of GaAs:Cr photodetector signal magnitude on voltage applied. decrease. The latter is caused by self-compensation of GaAs:Cr, which is specified by the system of energy levels in the bandgap. As a result of enlargement of the electron capture cross-section on deeper levels (placed close to the medium of the bandgap) that appear after doping, the probability of electron sticking on shallow centers, responsible for nonstationary drop of PhC, decreases but hole sticking still remains, and that is proved by the long-term component of PhC relaxation drop with the temperature decrease down to 150 K. Taking into account the fact that the time resolution of semi-insulating GaAs photoresistivity detectors is determined by the lifetime of nonstationary electrons: 0 1 SVN =τ , (2), where 0N = N – N– is the quantity of free sites in impurity centers that can capture electrons, S is the capture cross-section of electrons by impurity center, V is the electron velocity. As one can see [3], 0N depends not only on the impurity concentration N but on the degree of the dopant concentration, too. In the case of compensation centers with the concentration Ncomp, when almost linear growth together with the dopant concentration NCr takes place, the following rate dependence 1/τ ~ NCr [6] exists. In the case of pure compensation and N – N– ≈ N ≈ 0N , when N is close to the degree of Cr solubility in GaAs, the lifetime can reach a few picoseconds. The detail mechanism of the compensation effect influence on nonstationary component of PhC has not yet understood and requires special investigations. The linear dependence of the PhC signal magnitude on electric field applied (Fig. 3) testify to the possibility to increase the detector photosensitivity, if it is necessary up to the electric breakdown threshold Ebreak, kV/cm30break ≤E (for some samples the value of Ebreak was 50 kV/cm). Our investigation of the stationary photoconductivity magnitude ΔvPhC dependence on the laser radiation intensity I showed a linear growth of ΔvPhC in the range of six orders of I variation (GaAs:Cr samples with NCr ≥ 1.1017 cm−3). Nonstationary component of PhC approached to saturation for maximal I. An optimal ratio of fast and slow components (10:1) and photosensitivity was obtained when NCr ≅ 3.1017 cm−3 at the pulse laser intensity starting with І ~ 3⋅1022 cm−2s−1 until 1⋅1026cm−2s−1 (tp = 37 ps, λ = 1.06 μm). 4. Conclusions • It was found that, in semi-insulating GaAs:Cr, NCr = 3⋅1017 cm−3 ensure the relaxation time of photoconductivity τ ~ 2⋅10−10 s that corresponds to the bandwidth of the registration system Δf = 5 GHz and is optimal for fast detector development with a corresponding time of detection. • We found a linear growth of the fast component with the intensity increase and approachment to saturation of the slow component at high levels of excitation, which is connected with a full recharge of sticking centers at the laser intensity increase as well as growth of the chromium dopant concentration up to 1015… 3⋅1017 cm−3. • The possibility to control the behavior of PhC relaxation components in GaAs:Cr crystals by adjusting degree of doping and compensation has been shown. References 1. N. Lovergine, P. Prete, L. Tapfer, F. Marzo, and A.M. Mancini, Hydrogen transport vapour growth and properties of thick CdTe epilayers for RT X- ray detector applications // Cryst. Res. Technol. 40 (10–11), p. 1018 – 1022 (2005). 2. J.R. Macril, P. Dufour, L.A. Hamel, M. Julien, M.L. McConnell, M. McClish, J.M. Ryan and M. Widholm, Study of 5 and 10 mm thick CZT strip detectors // IEEE Nuclear Science Symposium Conference Record, p. 2316-2320 (2001). 3. A. Friant, C. Salou, R. Galli, S. Barday, Picosecond GaAs X- and gamma-ray photodetectors // Nucl. Instrum. and Meth. Phys. Res. A-283, p. 318-322 (1989). 4. D.R. Kania, R.G.Bartlett, R.S. Wagner, R.B. Ham- mond and P. Pianetta, Fast photoconductors for synchrotron radiation research // Nucl. Instrum. and Meth. Phys. Res. A 222 (1-2), p. 270-273 (1984). 5. Y.J. Chui, S.B. Fleischer, J.E .Bowers, High-speed low temperature-grown GaAs p-i-n traveling-wave photodetector // IEEE Photonics Technology Lett. 10 (7), p. 1012-1014 (1998). 6. Yu.A. Grigoriev, S.P. Grishina, K.P. Konin, V.B. Osvensky, L.F. Linnik, L.G. Linnik, E.A. Sal- kov, Investigation of recombination process at large level of injection in semi-insulating “unal- loyed” gallium arsenide // Kvantovaya elektronika 29, p.79-82 (1985) (in Russian).