Low temperature microhardness of Xe-intercalated fullerite C₆₀
The Vickers microhardness of Xe-intercalated polycrystalline fullerite C₆₀ (XexC₆₀, x ≃ 0.35) is measured in a moderately low temperature range of 77 to 300 K. A high increase in the microhardness of the material (by a factor of 2 to 3) as compared to that of pure C₆₀ single crystals is observed....
Збережено в:
Дата: | 2005 |
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Автори: | , , , , , , |
Формат: | Стаття |
Мова: | English |
Опубліковано: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
2005
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Назва видання: | Физика низких температур |
Теми: | |
Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/121467 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Цитувати: | Low temperature microhardness of Xe-intercalated fullerite C₆₀ / L.S. Fomenko, S.V. Lubenets1, V.D. Natsik, D. Cassidy, G.E. Gadd, S. Moricca, and B. Sundqvist // Физика низких температур. — 2005. — Т. 31, № 5. — С. 596-601. — Бібліогр.: 25 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of UkraineРезюме: | The Vickers microhardness of Xe-intercalated polycrystalline fullerite C₆₀ (XexC₆₀, x ≃ 0.35)
is measured in a moderately low temperature range of 77 to 300 K. A high increase in the microhardness
of the material (by a factor of 2 to 3) as compared to that of pure C₆₀ single crystals is observed.
It is shown that the step-like anomaly in the temperature dependences of the microhardness
of pure C₆₀ single crystals recorded under the orientational fcc-sc phase transition (Tc ≃ 260 K) is
also qualitatively retained for XexC₆₀, but its onset is shifted by 40 K towards lower temperatures
and the step becomes less distinct and more smeared. This behavior of ̅NV(T) correlates with x-ray
diffraction data, the analysis of which revealed a considerable influence of xenon interstitial atoms
on the peculiar features of fullerite thermal expansion due to orientational phase transitions (see
the paper by A.I. Prokhvatilov et al. in this issue). |
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