Speckle pattern formation in spatially limited optical systems

The dependences of statistical parameters inherent to speckle patterns on the object roughness and aperture size have been investigated. The experimental results that confirm theoretical dependence quality within the limits of errors were obtained. It has been shown that spatial finiteness of the op...

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Bibliographic Details
Date:2016
Main Authors: Kotov, M.M., Kurashov, V.N., Goloborodko, A.A.
Format: Article
Language:English
Published: Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України 2016
Series:Semiconductor Physics Quantum Electronics & Optoelectronics
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/121530
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Speckle pattern formation in spatially limited optical systems / M.M. Kotov, V.N. Kurashov, A.A. Goloborodko // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2016. — Т. 19, № 1. — С. 47-51. — Бібліогр.: 7 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine