Radar cross section study from wave scattering structures
Radar remote sensing deals with the extraction of object information from electromagnetic wave parameters. To fully exploit the potential of acquiring quantitative information requires a detailed description of the microwaves scattering. The research on this topic was mostly centered on far-field an...
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України
2006
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Цитувати: | Radar cross section study from wave scattering structures / S. Redadaa, A. Boualleg, N. Merabtine M. Benslama // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 4. — С. 71-76. — Бібліогр.: 9 назв. — англ. |
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irk-123456789-1216372017-06-16T03:03:17Z Radar cross section study from wave scattering structures Redadaa, S. Boualleg, A. Benslama, N. Merabtine M. Radar remote sensing deals with the extraction of object information from electromagnetic wave parameters. To fully exploit the potential of acquiring quantitative information requires a detailed description of the microwaves scattering. The research on this topic was mostly centered on far-field analysis that assumes an incident plane wave, computation of its scattered field, and evaluation of the radar cross section. However, under certain practical conditions, the far-field analysis is not valid and a near-field analysis is necessary. In this paper, we have given a full analysis of the near-field of a wedge structure due to an incident wave field from a line source or a plane wave. The far-field pattern, for the case of a line source exciting the structure, is also analyzed. 2006 Article Radar cross section study from wave scattering structures / S. Redadaa, A. Boualleg, N. Merabtine M. Benslama // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 4. — С. 71-76. — Бібліогр.: 9 назв. — англ. 1560-8034 PACS 84.40.Xb http://dspace.nbuv.gov.ua/handle/123456789/121637 en Semiconductor Physics Quantum Electronics & Optoelectronics Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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Radar remote sensing deals with the extraction of object information from electromagnetic wave parameters. To fully exploit the potential of acquiring quantitative information requires a detailed description of the microwaves scattering. The research on this topic was mostly centered on far-field analysis that assumes an incident plane wave, computation of its scattered field, and evaluation of the radar cross section. However, under certain practical conditions, the far-field analysis is not valid and a near-field analysis is necessary. In this paper, we have given a full analysis of the near-field of a wedge structure due to an incident wave field from a line source or a plane wave. The far-field pattern, for the case of a line source exciting the structure, is also analyzed. |
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Redadaa, S. Boualleg, A. Benslama, N. Merabtine M. |
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Redadaa, S. Boualleg, A. Benslama, N. Merabtine M. Radar cross section study from wave scattering structures Semiconductor Physics Quantum Electronics & Optoelectronics |
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Redadaa, S. Boualleg, A. Benslama, N. Merabtine M. |
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Redadaa, S. |
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Radar cross section study from wave scattering structures |
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Radar cross section study from wave scattering structures |
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Radar cross section study from wave scattering structures |
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Radar cross section study from wave scattering structures |
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Radar cross section study from wave scattering structures |
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radar cross section study from wave scattering structures |
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Інститут фізики напівпровідників імені В.Є. Лашкарьова НАН України |
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2006 |
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http://dspace.nbuv.gov.ua/handle/123456789/121637 |
citation_txt |
Radar cross section study from wave scattering structures / S. Redadaa, A. Boualleg, N. Merabtine M. Benslama // Semiconductor Physics Quantum Electronics & Optoelectronics. — 2006. — Т. 9, № 4. — С. 71-76. — Бібліогр.: 9 назв. — англ. |
series |
Semiconductor Physics Quantum Electronics & Optoelectronics |
work_keys_str_mv |
AT redadaas radarcrosssectionstudyfromwavescatteringstructures AT bouallega radarcrosssectionstudyfromwavescatteringstructures AT benslamanmerabtinem radarcrosssectionstudyfromwavescatteringstructures |
first_indexed |
2025-07-08T20:15:37Z |
last_indexed |
2025-07-08T20:15:37Z |
_version_ |
1837111170428829696 |
fulltext |
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 4. P. 71-76.
© 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
71
PACS 84.40.Xb
Radar cross section study from wave scattering structures
S. Redadaa, A. Boualleg, N. Merabtine, and M. Benslama
Electromagnetism and Telecommunications Laboratory LET
Department of Electronics, Faculty of Engineering
University of Constantine, Algeria
E-mail: {redasdz, bouadzdz}@yahoo.fr; {na_merabtine, malekbenslama}@hotmail.com
Abstract. Radar remote sensing deals with the extraction of object information from
electromagnetic wave parameters. To fully exploit the potential of acquiring quantitative
information requires a detailed description of the microwaves scattering. The research on
this topic was mostly centered on far-field analysis that assumes an incident plane wave,
computation of its scattered field, and evaluation of the radar cross section. However,
under certain practical conditions, the far-field analysis is not valid and a near-field
analysis is necessary. In this paper, we have given a full analysis of the near-field of a
wedge structure due to an incident wave field from a line source or a plane wave. The
far-field pattern, for the case of a line source exciting the structure, is also analyzed.
Keywords: electromagnetic wave, scattering, structure, radar cross section.
Manuscript received 04.05.06; accepted for publication 23.10.06.
1. Introduction
The problem of electromagnetic wave scattering is very
important in many applications, namely, remote sensing,
antennas design and especially in defense applications. The
research on this topic was mostly centered on far-field
analysis that assumes an incident plane wave, computation
of its scattered field due to the scatterer, and evaluation of
the radar cross section (RCS) of the scatterer. When the
transmitting and receiving antennas are far from the
scatterer, the incident wave can be approximated by a plane
wave and the scattered far-field can be regarded as the
radiation far-field due to the induced currents on the
scatterer, the far-field analysis thus applies. However, in
practical applications, there are many situations, when the
distance between the transmitting antenna and the scatterer
is not large enough to treat the field arriving the scatterer as
a plane wave, and the relative motion between the antennas
and scatterer will produce the Doppler frequency shift. In
these conditions, the far-field analysis is not valid and a
near-field analysis is necessary [1].
In calculating the radar cross section of complex
targets [2, 3], some parts of the structure can be modeled
using singly curved sheets as, for example, the wings of
an aircraft. For electrically large bodies, the geometrical
theory of diffraction (GTD) [4, 5] is a good high
frequency technique to compute the scattering from
those bodies. But, as is well known, that method is not
valid in the caustic of reflected rays, which occurs, for
example, when we illuminate a singly curved screen
with a plane wave. Physical optics (PO) has been largely
used in the last years to predict high frequency radar
cross section problems, because, unlike geometrical
optics and the GTD, it is valid in the transition regions
and at caustics. PO can be improved using the fringe
currents contribution of the edge currents of the physical
theory of diffraction (PTD) [6, 7].
This paper is organized as follows. Section 2
provides the scattering analysis; we present the RCS
formulae and possible approximations. We calculate
field expressions for the problem of scattering by a two-
dimensional perfect electric conduction wedge capped
with a dielectric cylinder. In Section 3, some numerical
results for various configurations of the wedge structure
are presented. Finally, a conclusion is given.
2. Scattering analysis
The RCS of a target characterizes its scattering property
that is defined as the area intercepting the amount of
power that, when scattered isotropically, produces in a
receiver a density that is equal to the density scattered by
the actual target. When the transmitter and receiver are
in the same location, the RCS is referred to as mono-
static (or backscattered), and it is referred to as bistatic
when these two ones are located at different positions.
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 4. P. 71-76.
© 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
72
For three-dimensional target, the RCS is given in
terms of incident power density, magnetic field, and
electric field [8]. The RCS in terms of electric field is
given by
⎥
⎥
⎥
⎦
⎤
⎢
⎢
⎢
⎣
⎡
πρ=σ
∞→ρ
− 2
2
2
3 4lim
i
s
D
E
E
, (1)
where ρ is the distance from the target to observation
point, sE and iE are the scattered and incident electric
field. Eq. (1) is valid when the target is illuminated by a
plane wave that in practice can be only approximated
when the target is placed in the far-field of the source, at
least λ=ρ 22D , where D is the largest dimension of
the target.
Consider a perfectly conducting rectangular thin-
flat plate in the yx − plane as shown in Fig. 1. For a
linearly polarized incident wave in the yx − plane, the
horizontal and vertical backscattered RCSs are, respecti-
vely, given by
( )
2
1
543
2
21
2
4cos
1
⎥
⎦
⎤
⎢
⎣
⎡
σσ+σ
σ
+
θ
σ−σ
π
=σ −
VVV
V
VVV
b ,
(2)
( )
2
1
543
2
21
2
4cos
1
⎥⎦
⎤
⎢⎣
⎡ σσ+σ
σ
−
θ
σ−σ
π
=σ −
HHH
H
HHH
b ,
(3)
where
( ) ( )
( )
( )
( )
( )
( )
( )
( )
( )
;
8
1
,
sin1
sin1
,
sin1
sin1
,
2
,
sin
sinsin
sincos
3
22
5
2
sin
4
2
sin
3
23
4
2
1
a
kj
V
jk
V
jk
V
a
kaj
V
a
aV
k
e
e
e
k
e
k
jk
a
a
a
π
−=σ
θ+
θ−
=σ
θ−
θ+
=σ
π
=σ
θ
θ
−θ=σ
π−
θ
θ−
π−
(4)
( )
( )
( )
( ) .
2
1
,
sin1
,
sin1
,
2
4
,)(
22
5
sin
4
sin
3
21
4
2
*
11
a
kj
H
jk
H
jk
H
a
kj
H
VH
k
e
ee
k
e
a
aa
a
π
−=σ
θ−
=σ
θ−
=σ
π
=σ
σ=σ
π+
θ−θ−
π+
(5)
Fig. 1. Coordinates for the rectangular flat plate.
Here akka 0= , 0k is the free space wave number.
Eqs (2) and (3) are valid quite accurate for the aspect
angles °≤θ≤ 800 . For the aspect angles near 90°, Ross
[9] obtained an empirical expression for the RCS by
extensive fitting of measured data. It is given by
( )
( )
.
5
32cos
22
1
22
1
,0
2
2
⎪⎭
⎪
⎬
⎫
⎟
⎠
⎞
⎜
⎝
⎛ π
−
⎥
⎥
⎦
⎤
⎢
⎢
⎣
⎡
λ
π
−+
⎪⎩
⎪
⎨
⎧
+
⎥
⎥
⎦
⎤
⎢
⎢
⎣
⎡
λ
π
+
λ
=σ
→σ
a
V
H
k
a
a
ba (6)
The backscattered RCS for a perfectly conducting
thin rectangular plate for incident waves at any θ , ϕ
can be approximated by
( )
( ) ( ) .cos
cossin
cossinsin
cossin
cossinsin4
2
2
0
0
0
0
2
22
θ⎟⎟
⎠
⎞
ϕθ
ϕθ
×
×⎜⎜
⎝
⎛
ϕθ
ϕθ
λ
π
=σ
kb
kb
ka
kaba
(7)
Eq. (7) is independent of the polarization, and it is
only valid for the aspect angles °≤θ 20 . Fig. 2 shows
the backscattered RCS of a rectangular flat plate, for
both vertical and horizontal polarizations.
The goal of analysis is to find the field expressions
for the problem of scattering by a two-dimensional (2-D)
perfect electric conduction (PEC) wedge capped with a
dielectric cylinder as shown in Fig. 3. Using the
cylindrical coordinates system, the excitation due to an
electric line current of amplitude eI located at ( )00, ϕρ
result in transverse magnetic (TM) incident field with
the electric field expression given by
x
y
z
-a
+a
+b -b
θ
radar
ϕ
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 4. P. 71-76.
© 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
73
Fig. 2. Backscattered RCS for a rectangular flat plate of
vertical (a) and horizontal (b) polarizations.
( )( )00
2
0
0
4
ρ−ρ
μω
−= kHIE e
i
z , (8)
where ( )2
0H is the Hankel function of the second kind of
order zero.
The problem is divided into three regions I, II, and
III. The field expressions may be assumed to take the
following forms:
( ) ( ) ( )
( ) ( )( )( ) ( ) ( )
( )( ) ( ) ( ) ,sinsin
,sinsin
,sinsin
0
00
2III
0
00
2
0
II
0
01
I
∑
∑
∑
∞
=
∞
=
∞
=
α−ϕα−ϕρ=
α−ϕα−ϕρ+ρ=
=
α−ϕα−ϕρ=
n
vnz
n
vnvn
z
n
vnz
vvkHdE
vvkHckJb
E
vvkJaE
(9)
where 1k is the wave number inside the dielectric,
x
y
III
II
I
( )00 ,ϕρ
α
β
00 ,με
0,με
a
PEC
eI
Fig. 3. Capped wedge structure.
β−α−π
π
=
2
nv (10)
while ( )xJv and ( )2
vH are the Bessel and Hankel
functions of order v and argument x . From the
Maxwell equations, the magnetic field component ϕH
is related to the electric field component zE for a TM
wave by
ρ∂
∂
μω
=ϕ
zE
j
H 1 . (11)
Thus, the magnetic field component ϕH in the
various regions may be written as
( ) ( ) ( )
( ) ( ) ( )
( ) ( )
( ) ( ) ( ) ( ) ,sinsin
,sinsin
,sinsin
0
00
'2
0
0III
0
0
0
'2
0
'
0
0II
0
01
'
0
1I
∑
∑
∑
∞
=
ϕ
∞
=
ϕ
∞
=
ϕ
α−ϕα−ϕρ
μω
=
α−ϕα−ϕ
⎟
⎠
⎞
⎜
⎝
⎛ ρ+ρ
μω
=
α−ϕα−ϕρ
μω
=
n
vn
n
vnvn
n
vn
vvkHd
j
k
H
vv
kHckJb
j
k
H
vvkJa
j
kH
(12)
where the prime indicates derivatives with respect to the
full argument of the function. The boundary conditions
require that the tangential electric field components
vanish at the PEC surface. Also, the tangential field
components should be continuous across the air-
dielectric surface and the virtual boundary between the
regions I and II, except for the discontinuity of the
magnetic field at the source point. Thus,
0=zE at β−πα=ϕ 2, , (13)
⎪⎩
⎪
⎨
⎧
=
=
ϕϕ
III
III
HH
EE zz at a=ρ , (14)
⎪⎩
⎪
⎨
⎧
=
=
ϕϕ
IIIII
IIIII
HH
EE zz at 0ρ=ρ . (15)
The current density eJ may be given in the Fourier
series expansion as
( )
( ) ( ) .sinsin
2
2
0
0
0
0
0
∑
∞
=
α−ϕα−ϕ×
×
ρβ−α−π
=ϕ−ϕδ
ρ
=
n
ee
e
vv
II
J
(16)
The boundary condition on the PEC surface is
automatically satisfied by the ϕ dependence of the
electric field Eq. (9). From the boundary conditions in
Eq. (14)
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 4. P. 71-76.
© 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
74
( ) ( ) ( )
( ) ( )( )( ) ( ) ( ) ,sinsin
sinsin
0
0
2
0
01
∑
∑
∞
=
∞
=
α−ϕα−ϕ+=
=α−ϕα−ϕ
n
avnavn
n
avn
vvkHckJb
vvkJa
(17)
( ) ( ) ( )
( ) ( ) ( ) ( ) ( ) .sinsin
sinsin
0
0
'2'
0
0
0
01
'
0
1
∑
∑
∞
=
∞
=
α−ϕα−ϕ⎟
⎠
⎞
⎜
⎝
⎛ +
μω
=α−ϕα−ϕ
μω
n
avnavn
n
avn
vvkHckJb
j
k
vvkJa
j
k
(18)
From the boundary conditions in Eq. (15), we have
( ) ( )( )( ) ( ) ( )
( ) ( ) ( ) ( ) ,sinsin
sinsin
0
000
2
0
00
2
00
∑
∑
∞
=
∞
=
α−ϕα−ϕρ=
α−ϕα−ϕρ+ρ
n
vn
n
vnvn
vvkHd
vvkHckJb
(19)
( ) ( ) ( )
( ) ( )
( ) ( ) ( ) ( )
( ) ( ) .sinsin
2
2
sinsin
sinsin
0
0
0
0
000
'2
0
0
0
00
'2
00
'
0
∑
∑
∑
∞
=
∞
=
∞
=
α−ϕα−ϕ
ρβ−α−π
−
−α−ϕα−ϕρ
μω
=
=α−ϕα−ϕ×
×⎟
⎠
⎞
⎜
⎝
⎛ ρ+ρ
μω
n
e
n
vn
n
vnvn
vv
I
vvkHd
j
k
vv
kHckJb
j
k
(20)
Since Eqs (17) and (20) hold for all ϕ , the series of
the left and right hand sides are equal term by term,
more precisely,
( ) ( ) ( )( )avnavnavn kHckJbkJa 2
1 += , (21)
( ) ( ) ( ) ( )⎟
⎠
⎞⎜
⎝
⎛ += avnavnavn kHckJbkkJak '2'
1
'
1 , (22)
( ) ( )( ) ( )( )00
2
00
2
00 ρ=ρ+ρ kHdkHckJb vnvnvn , (23)
( ) ( ) ( )
( ) ( ) ,
2
2
0
0
0
'2
0
'2
0
'
ρβ−α−π
η
−ρ=
=ρ+ρ
e
vn
vnvn
IjkHd
kHckJb
(24)
where 0η is the characteristic impedance of free space.
From Eqs (21) and (23), we have
( ) ( ) ( )( )[ ]avnavn
av
n kHckJb
kJ
a 2
1
1
+= , (25)
( )
( )( )00
2
00
ρ
ρ
+=
kH
kJ
bcd
v
v
nnn . (26)
After some mathematical operations, we get
( )( )00
20
2
ρ
β−α−π
μωπ
−= kH
I
b v
e
n . (27)
Substituting nb in Eqs (21) and (22) and solving
for nc yield
( )( ) ( ) ( ) ( ) ( )
( ) ( ) ( ) ( )( ) ( )⎥
⎥
⎦
⎤
⎢
⎢
⎣
⎡
−
−
ρ×
×
β−α−π
μωπ
=
avavavav
avvavav
v
e
n
kJkHkkJkHk
kJkaJkkJkJk
kH
I
c
1
'2
11
'2
0
1
'
11
'
00
2
0
2
.
(28)
From Eqs (26) through (28), nd may be given by
( )( ) ( ) ( ) ( ) ( )
( ) ( ) ( ) ( )( ) ( )
( )⎥
⎦
⎤
ρ
−
⎢
⎢
⎣
⎡
−
−
ρ×
×
β−α−π
μωπ
=
00
1
'2
11
'2
1
'
11
'
0
00
2
0
2
kJ
kJkHkkJkkH
kJkJkkJkJk
kH
I
d
v
avavavav
avavavav
v
e
n
(29)
with these closed form expressions for the expansion
coefficients na , nb , nc and nd , the field components
zE and ϕH can be determined from Eqs (9) and (12),
respectively. Alternatively, the magnetic field
component ρH can be computed from
ϕ∂
∂
ρμω
−=ρ
zE
j
H 11 . (30)
Thus, the ρH expressions for the three regions
defined in Fig. 3 become
( ) ( ) ( )
( ) ( )( )( ) ( ) ( )
( )( ) ( ) ( ) .sincos
1
,sincos
1
,sincos
1
0
00
2
III
0
00
2
0
II
0
01
I
∑
∑
∑
∞
=
ρ
∞
=
ρ
∞
=
ρ
α−ϕα−ϕρ×
×
ρμω
−=
α−ϕα−ϕρ+ρ×
×
ρμω
−=
α−ϕα−ϕρ×
×
ρμω
−=
n
vn
n
vnvn
n
vn
vvkHvd
j
H
vvkHckJbv
j
H
vvkJva
j
H
(31)
In the region III, the far scattered field may be
found as the difference between the total and incident
field. Thus, using Eqs (8) and (9) and considering the
far-field condition ( )∞→ρ we get
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 4. P. 71-76.
© 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
75
Fig. 4. Total far-field pattern of a line source near a con-
ducting wedge with conducting-capped (a) and dielectric-
capped edges (b).
( ) ( ) .sinsin
2
0
0
0
III
∑
∞
=
ρ−
α−ϕα−ϕ×
×
ρπ
=+=
n
v
n
kjs
z
i
zz
vvjd
e
k
jEEE
(32)
For the plane wave excitation ( )∞→ρ0 , the
expressions in Eqs (27) and (28) reduce to
00
00
0 2
2
ρ−
ρπβ−α−π
μωπ
−= kjve
n e
k
jj
I
b , (33)
( ) ( ) ( ) ( )
( ) ( ) ( ) ( )( ) ( )
,
2
2
1
'2
11
'2
0
1
'
11
'
0
00
0 00
avavavav
avavavav
kjve
n
kJkHkkJkHk
kJkJkkJkJk
e
k
jj
I
c
−
−
×
×
ρπβ−α−π
μωπ
= ρ−
(34)
a
b c
Fig. 5. Near-field patterns of a line source near a conducting
wedge with a conducting-capped edge zE (a), ρH (b), ϕH (c).
where the complex of the incident plane wave, 0E , can
be given by
00
0
0
0
2
4
ρ−
ρπ
μω
−= kj
e e
k
jIE (35)
in this case, the field components can be evaluated in the
regions I and II only.
3. Numerical results and discussion
Fig. 2 presents the radar cross section of a rectangular
flat plate for the vertical and horizontal polarizations,
compared with the classical formulae. The parameters of
structure are cm16.10== ba and MHz300=f .
Fig. 4 presents the far-field of a capped wedge in
the presence of an electric line source field. We clearly
show how the cap parameters affect the maximum
radiation of the line source in the presence of wedge.
The distribution of the components of the fields on the
near-field of two cases (conducting capped edge,
dielectric capped edge) is computed and shown in Figs 5
and 6. The near-field distribution for an incident wave
field of these two types of wedges is also computed and
shown in Figs 7 and 8. These near-field distributions
clearly demonstrated the effect of cap parameters in
altering the sharp edge singular behaviour. We have
used the following wedge structure parameters:
a= 0.15 cm, 0ρ = 0.5 cm, o30=β=α , γε = 3, Ie = 1 mA.
a
b c
Fig. 6. Near-field patterns of a line source near a conducting
wedge with a dielectric-capped edge zE (a), ρH (b), ϕH (c).
Semiconductor Physics, Quantum Electronics & Optoelectronics, 2006. V. 9, N 4. P. 71-76.
© 2006, V. Lashkaryov Institute of Semiconductor Physics, National Academy of Sciences of Ukraine
76
a
b c
Fig. 7. Near-field patterns of the plane wave incident on a
conducting wedge with a conducting-capped edge zE (a),
ρH (b), ϕH (c).
a
b c
Fig. 8. Near-field patterns of the plane wave incident on a
conducting wedge with a dielectric-capped edge zE (a),
ρH (b), ϕH (c).
4. Conclusion
In this paper, we have presented a full analysis of
electromagnetic scattering. We have presented a case of
backscattered radar cross section for a rectangular flat
plate. The analysis of the far- and near-field patterns for
a wedge structure shows the effect of cap parameters on
the maximum radiation of the line source. We have also
examined the effect the cap parameters on the sharp
edge behavior for an incident plane wave.
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