Synthesis of charged silica films of porous structure

A new technique has been proposed to obtain thin charged dielectric silica films with porous structure on a Si surface. The film composition and charge state of the dielectric/semiconductor system obtained have been studied. Thickness and porosity degree of the synthesized films have been estimated....

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Bibliographic Details
Date:2008
Main Authors: Zharkikh, Yu.S., Lysochenko, S.V., Pylypenko, O.A., Tretyak, O.V.
Format: Article
Language:English
Published: НТК «Інститут монокристалів» НАН України 2008
Series:Functional Materials
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Online Access:http://dspace.nbuv.gov.ua/handle/123456789/137233
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Synthesis of charged silica films of porous structure / Yu.S. Zharkikh, S.V. Lysochenko, O.A. Pylypenko, O.V. Tretyak // Functional Materials. — 2008. — Т. 15, № 1. — С. 127-130. — Бібліогр.: 10 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine