Investigation of (100) In₄Se₃ crystal surface nanorelief

The crystallography and topography of the (100) cleavage surfaces of layered semiconductor In₄Se₃ crystal have been studied by low energy electron diffraction (LEED), scanning tunnelling and atomic-force microscopy (STM, AFM) in ultrahigh vacuum (UHV). The structure of surface LEED patterns, shape a...

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Datum:2009
Hauptverfasser: Galiy, P.V., Ciszewski, A., Dveriy, O.R., Losovyj, Ya.B., Mazur, P., Nenchuk, T.M., Zuber, S., Fiyala, Ya.M.
Format: Artikel
Sprache:English
Veröffentlicht: НТК «Інститут монокристалів» НАН України 2009
Schriftenreihe:Functional Materials
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Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/138900
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:Investigation of (100) In₄Se₃ crystal surface nanorelief // P.V. Galiy, A. Ciszewski, O.R. Dveriy, Ya.B. Losovyj, P. Mazur, T.M. Nenchuk, S. Zuber, Ya.M. Fiyala // Functional Materials. — 2009. — Т. 16, № 3. — С. 279-285. — Бібліогр.: 11 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Zusammenfassung:The crystallography and topography of the (100) cleavage surfaces of layered semiconductor In₄Se₃ crystal have been studied by low energy electron diffraction (LEED), scanning tunnelling and atomic-force microscopy (STM, AFM) in ultrahigh vacuum (UHV). The structure of surface LEED patterns, shape and dimensions of subsequent STM- and AFMprofiles agree well with the lattice parameters derived from the bulk crystal structure obtained by X-ray diffraction. The local density of states and band gap for (100) In₄Se₃ have been obtained by scanning tunnelling spectroscopy and point to the same integral gap value as for bulk crystal. The STM/STS results evidence the stability of interlayer cleavage surface and confirm that anisotropic striated low conductive cleavage surfaces might be suitable as matrices/templates in formation of surface nanowires or nanostructures.