Foreign phase inclusions in Ti-sapphire grown in a carbon-containing medium
The effect of carbon-containing growth medium on the character and formation features of foreign phase inclusions in Тi-sapphire has been studied. The crystals so grown may include both micrometer-sized (2 to 17 µm) and submicrometer-sized (about 100 nm) inclusions. The specifically cut micro...
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| Date: | 2006 |
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| Main Authors: | , , |
| Format: | Article |
| Language: | English |
| Published: |
НТК «Інститут монокристалів» НАН України
2006
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| Series: | Functional Materials |
| Online Access: | http://dspace.nbuv.gov.ua/handle/123456789/140067 |
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| Journal Title: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Cite this: | Foreign phase inclusions in Ti-sapphire grown in a carbon-containing medium / S.D. Vyshnevskiy, Ye.V. Kryvonosov, L.A. Lytvynov // Functional Materials. — 2006. — Т. 13, № 2. — С. 238-244. — Бібліогр.: 25 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| Summary: | The effect of carbon-containing growth medium on the character and formation features of foreign phase inclusions in Тi-sapphire has been studied. The crystals so grown may include both micrometer-sized (2 to 17 µm) and submicrometer-sized (about 100 nm) inclusions. The specifically cut micrometer-sized inclusions have been shown to be pores. The shape and orientation of submicrometer-sized inclusions in Тi-sapphire have been studied. А formation mechanism has been suggested for submicrometer-sized inclusions containing excess aluminum ant its suboxides. The inclusions are formed in solid phase in the course of phase transition at the crystallization front as a result of the crystal lattice supersaturation with anionic vacancies. Those defects are collapsed under the crystal high-temperature heat treatment due to uniaxial compressive stresses. |
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