α-particle induced forward-backward electron emission from titanium nitride

The electronic yields of forward and backward secondary ion-induced electron emission from titanium nitride bombarded by α-particles from a radioisotope source were experimentally measured. It was shown that the ratio of forward and backward electronic yields was approximately 1.79, which agrees w...

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Datum:2018
Hauptverfasser: Zhurenko, V.P., Kononenko, S.I., Kalantaryan, O.V., Mysiura, I.N., Avotin, S.S., Rokhmanov, N.Ja.
Format: Artikel
Sprache:English
Veröffentlicht: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2018
Schriftenreihe:Вопросы атомной науки и техники
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Online Zugang:http://dspace.nbuv.gov.ua/handle/123456789/147668
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Назва журналу:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Zitieren:α-particle induced forward-backward electron emission from titanium nitride / V.P. Zhurenko, S.I. Kononenko, O.V. Kalantaryan, I.N. Mysiura, S.S. Avotin, N.Ja. Rokhmanov // Вопросы атомной науки и техники. — 2018. — № 4. — С. 293-296. — Бібліогр.: 25 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Zusammenfassung:The electronic yields of forward and backward secondary ion-induced electron emission from titanium nitride bombarded by α-particles from a radioisotope source were experimentally measured. It was shown that the ratio of forward and backward electronic yields was approximately 1.79, which agrees well with the results obtained earlier for other materials and fast light ions. It was found that this ratio increased slightly with increasing specific ionization loss of the ion