α-particle induced forward-backward electron emission from titanium nitride
The electronic yields of forward and backward secondary ion-induced electron emission from titanium nitride bombarded by α-particles from a radioisotope source were experimentally measured. It was shown that the ratio of forward and backward electronic yields was approximately 1.79, which agrees w...
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Datum: | 2018 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | English |
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Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2018
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Schriftenreihe: | Вопросы атомной науки и техники |
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Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/147668 |
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Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
Zitieren: | α-particle induced forward-backward electron emission from titanium nitride / V.P. Zhurenko, S.I. Kononenko, O.V. Kalantaryan, I.N. Mysiura, S.S. Avotin, N.Ja. Rokhmanov // Вопросы атомной науки и техники. — 2018. — № 4. — С. 293-296. — Бібліогр.: 25 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of UkraineZusammenfassung: | The electronic yields of forward and backward secondary ion-induced electron emission from titanium nitride
bombarded by α-particles from a radioisotope source were experimentally measured. It was shown that the ratio of
forward and backward electronic yields was approximately 1.79, which agrees well with the results obtained earlier
for other materials and fast light ions. It was found that this ratio increased slightly with increasing specific ionization loss of the ion |
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