α-particle induced forward-backward electron emission from titanium nitride

The electronic yields of forward and backward secondary ion-induced electron emission from titanium nitride bombarded by α-particles from a radioisotope source were experimentally measured. It was shown that the ratio of forward and backward electronic yields was approximately 1.79, which agrees w...

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Bibliographic Details
Date:2018
Main Authors: Zhurenko, V.P., Kononenko, S.I., Kalantaryan, O.V., Mysiura, I.N., Avotin, S.S., Rokhmanov, N.Ja.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2018
Series:Вопросы атомной науки и техники
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Online Access:http://dspace.nbuv.gov.ua/handle/123456789/147668
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:α-particle induced forward-backward electron emission from titanium nitride / V.P. Zhurenko, S.I. Kononenko, O.V. Kalantaryan, I.N. Mysiura, S.S. Avotin, N.Ja. Rokhmanov // Вопросы атомной науки и техники. — 2018. — № 4. — С. 293-296. — Бібліогр.: 25 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
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Summary:The electronic yields of forward and backward secondary ion-induced electron emission from titanium nitride bombarded by α-particles from a radioisotope source were experimentally measured. It was shown that the ratio of forward and backward electronic yields was approximately 1.79, which agrees well with the results obtained earlier for other materials and fast light ions. It was found that this ratio increased slightly with increasing specific ionization loss of the ion