α-particle induced forward-backward electron emission from titanium nitride
The electronic yields of forward and backward secondary ion-induced electron emission from titanium nitride bombarded by α-particles from a radioisotope source were experimentally measured. It was shown that the ratio of forward and backward electronic yields was approximately 1.79, which agrees w...
Збережено в:
| Дата: | 2018 |
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| Автори: | , , , , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
2018
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| Назва видання: | Вопросы атомной науки и техники |
| Теми: | |
| Онлайн доступ: | http://dspace.nbuv.gov.ua/handle/123456789/147668 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Цитувати: | α-particle induced forward-backward electron emission from titanium nitride / V.P. Zhurenko, S.I. Kononenko, O.V. Kalantaryan, I.N. Mysiura, S.S. Avotin, N.Ja. Rokhmanov // Вопросы атомной науки и техники. — 2018. — № 4. — С. 293-296. — Бібліогр.: 25 назв. — англ. |
Репозитарії
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Резюме: | The electronic yields of forward and backward secondary ion-induced electron emission from titanium nitride
bombarded by α-particles from a radioisotope source were experimentally measured. It was shown that the ratio of
forward and backward electronic yields was approximately 1.79, which agrees well with the results obtained earlier
for other materials and fast light ions. It was found that this ratio increased slightly with increasing specific ionization loss of the ion |
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