The microwave measurements of (N₂)хАr₁₋x solid solutions
A full range of solid solutions (N₂)хАr₁₋x (0 < x <1) have been examined with an x-band microwave dielectrometer. The real part of the permittivity e' versus temperature T for this non-polar system has been measured with a high accuracy (10⁻⁶) at temperatures between 1.5-75 K. A comparati...
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| Datum: | 1995 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Фізико-технічний інститут низьких температур ім. Б.І. Вєркіна НАН України
1995
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| Schriftenreihe: | Физика низких температур |
| Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/175104 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | The microwave measurements of (N₂)хАr₁₋x solid solutions / W. Kempinski, J. Stankowski // Физика низких температур. — 1995. — Т. 21, № 1. — С. 97-101. — Бібліогр.: 41 назв. — англ. |
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Digital Library of Periodicals of National Academy of Sciences of Ukraine| Zusammenfassung: | A full range of solid solutions (N₂)хАr₁₋x (0 < x <1) have been examined with an x-band microwave dielectrometer. The real part of the permittivity e' versus temperature T for this non-polar system has been measured with a high accuracy (10⁻⁶) at temperatures between 1.5-75 K. A comparative (x, T) phase diagram is constructed with a β-α structural phase transition and the problem of transition to the orientational glass is discussed. |
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