Possibilities of improving paraxial brightness in rf ion sources

The paraxial brightness in rf ion sources can be improved by redistributing the beam phase density, increasing the beam current density and using beam extraction systems with low aberrations. Experimental data are presented for the central region of a hydrogen or helium ion beam extracted from a...

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Bibliographic Details
Date:2005
Main Authors: Mordyk, S.M., Shulha, D.P., Miroshnichenko, V.I., Storizhko, V.E., Voznyy, V.I.
Format: Article
Language:English
Published: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2005
Series:Вопросы атомной науки и техники
Subjects:
Online Access:http://dspace.nbuv.gov.ua/handle/123456789/81234
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Journal Title:Digital Library of Periodicals of National Academy of Sciences of Ukraine
Cite this:Possibilities of improving paraxial brightness in rf ion sources / S.M. Mordyk, D.P. Shulha, V.I. Miroshnichenko, V.E. Storizhko, V.I. Voznyy // Вопросы атомной науки и техники. — 2005. — № 6. — С. 81-86. — Бібліогр.: 14 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine