Development of NSC KIPT nuclear microprobe
Development of the microanalysis methods is stimulated by investigations of actual materials. Their properties depend not only on an atomic structure, but also on imperfections of this structure, phase composition, areas of impurity accumulation, various kinds of microinclusions etc. Characteristic...
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| Datum: | 1999 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | English |
| Veröffentlicht: |
Національний науковий центр «Харківський фізико-технічний інститут» НАН України
1999
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| Schriftenreihe: | Вопросы атомной науки и техники |
| Online Zugang: | http://dspace.nbuv.gov.ua/handle/123456789/81507 |
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| Назва журналу: | Digital Library of Periodicals of National Academy of Sciences of Ukraine |
| Zitieren: | Development of NSC KIPT nuclear microprobe / V.N. Bondarenko, A.V. Goncharov, V.Ya. Kolot // Вопросы атомной науки и техники. — 1999. — № 4. — С. 98-101. — Бібліогр.: 23 назв. — англ. |
Institution
Digital Library of Periodicals of National Academy of Sciences of Ukraine| Zusammenfassung: | Development of the microanalysis methods is stimulated by investigations of actual materials. Their properties depend not only on an atomic structure, but also on imperfections of this structure, phase composition, areas of impurity accumulation, various kinds of microinclusions etc. Characteristic sizes of these objects are usually ranged from a few parts of micron to several tens of micron. So, there is need for methods which provide the analysis of chemical elements in samples with the corresponding level of spatial resolution. |
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