Experimental research of ICP reactor for plasma-chemical etching

The results of systematic experimental researches of plasma-chemical etching reactor in the inductive mode are presented in this paper. Measurements of the integral discharge parameters (inductor voltage, gas pressure, input power) have been carried out as well as probe measurements of spatial d...

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Дата:2006
Автори: Dudin, S.V., Zykov, A.V., Dahov, A.N., Farenik, V.I.
Формат: Стаття
Мова:English
Опубліковано: Національний науковий центр «Харківський фізико-технічний інститут» НАН України 2006
Назва видання:Вопросы атомной науки и техники
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Онлайн доступ:http://dspace.nbuv.gov.ua/handle/123456789/82289
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Цитувати:Experimental research of ICP reactor for plasma-chemical etching / S.V. Dudin, A.V.Zykov, A.N.Dahov, V.I. Farenik // Вопросы атомной науки и техники. — 2006. — № 6. — С. 189-191. — Бібліогр.: 3 назв. — англ.

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Digital Library of Periodicals of National Academy of Sciences of Ukraine
id irk-123456789-82289
record_format dspace
spelling irk-123456789-822892015-05-28T03:02:21Z Experimental research of ICP reactor for plasma-chemical etching Dudin, S.V. Zykov, A.V. Dahov, A.N. Farenik, V.I. Low temperature plasma and plasma technologies The results of systematic experimental researches of plasma-chemical etching reactor in the inductive mode are presented in this paper. Measurements of the integral discharge parameters (inductor voltage, gas pressure, input power) have been carried out as well as probe measurements of spatial distribution of local plasma parameters (plasma density, temperature and electron energy distribution function) and radial profiles of ion current to processed surface. The measured dependences differ essentially for atomic (Ar) and molecular (O₂,N₂,CF₄) gases. As the range of working pressure covers diffusive and collisionless modes of charged particles movement, radial distribution of ion current density and its absolute value change significantly. Comparison of the obtained results with the calculations executed using “Global” spatially averaged model and 2D-fluid model is carried out. 2006 Article Experimental research of ICP reactor for plasma-chemical etching / S.V. Dudin, A.V.Zykov, A.N.Dahov, V.I. Farenik // Вопросы атомной науки и техники. — 2006. — № 6. — С. 189-191. — Бібліогр.: 3 назв. — англ. 1562-6016 PACS: 52.77.Bn http://dspace.nbuv.gov.ua/handle/123456789/82289 en Вопросы атомной науки и техники Національний науковий центр «Харківський фізико-технічний інститут» НАН України
institution Digital Library of Periodicals of National Academy of Sciences of Ukraine
collection DSpace DC
language English
topic Low temperature plasma and plasma technologies
Low temperature plasma and plasma technologies
spellingShingle Low temperature plasma and plasma technologies
Low temperature plasma and plasma technologies
Dudin, S.V.
Zykov, A.V.
Dahov, A.N.
Farenik, V.I.
Experimental research of ICP reactor for plasma-chemical etching
Вопросы атомной науки и техники
description The results of systematic experimental researches of plasma-chemical etching reactor in the inductive mode are presented in this paper. Measurements of the integral discharge parameters (inductor voltage, gas pressure, input power) have been carried out as well as probe measurements of spatial distribution of local plasma parameters (plasma density, temperature and electron energy distribution function) and radial profiles of ion current to processed surface. The measured dependences differ essentially for atomic (Ar) and molecular (O₂,N₂,CF₄) gases. As the range of working pressure covers diffusive and collisionless modes of charged particles movement, radial distribution of ion current density and its absolute value change significantly. Comparison of the obtained results with the calculations executed using “Global” spatially averaged model and 2D-fluid model is carried out.
format Article
author Dudin, S.V.
Zykov, A.V.
Dahov, A.N.
Farenik, V.I.
author_facet Dudin, S.V.
Zykov, A.V.
Dahov, A.N.
Farenik, V.I.
author_sort Dudin, S.V.
title Experimental research of ICP reactor for plasma-chemical etching
title_short Experimental research of ICP reactor for plasma-chemical etching
title_full Experimental research of ICP reactor for plasma-chemical etching
title_fullStr Experimental research of ICP reactor for plasma-chemical etching
title_full_unstemmed Experimental research of ICP reactor for plasma-chemical etching
title_sort experimental research of icp reactor for plasma-chemical etching
publisher Національний науковий центр «Харківський фізико-технічний інститут» НАН України
publishDate 2006
topic_facet Low temperature plasma and plasma technologies
url http://dspace.nbuv.gov.ua/handle/123456789/82289
citation_txt Experimental research of ICP reactor for plasma-chemical etching / S.V. Dudin, A.V.Zykov, A.N.Dahov, V.I. Farenik // Вопросы атомной науки и техники. — 2006. — № 6. — С. 189-191. — Бібліогр.: 3 назв. — англ.
series Вопросы атомной науки и техники
work_keys_str_mv AT dudinsv experimentalresearchoficpreactorforplasmachemicaletching
AT zykovav experimentalresearchoficpreactorforplasmachemicaletching
AT dahovan experimentalresearchoficpreactorforplasmachemicaletching
AT farenikvi experimentalresearchoficpreactorforplasmachemicaletching
first_indexed 2025-07-06T08:47:42Z
last_indexed 2025-07-06T08:47:42Z
_version_ 1836886696938962944
fulltext Problems of Atomic Science and Technology. 2006, 6. Series: Plasma Physics (12), p. 189-191 189 EXPERIMENTAL RESEARCH OF ICP REACTOR FOR PLASMA-CHEMICAL ETCHING S.V. Dudin1, A.V.Zykov1, A.N.Dahov2, V.I. Farenik2 1 V.N. Karazin Kharkiv National University, 31 Kurchatov ave., 61108, Kharkiv, Ukraine; 2Scientific Center of Physical Technologies, 6 Svobody Sq., 61007, Kharkiv, Ukraine The results of systematic experimental researches of plasma-chemical etching reactor in the inductive mode are pre- sented in this paper. Measurements of the integral discharge parameters (inductor voltage, gas pressure, input power) have been carried out as well as probe measurements of spatial distribution of local plasma parameters (plasma density, temperature and electron energy distribution function) and radial profiles of ion current to processed surface. The measured dependences differ essentially for atomic (Ar) and molecular (O2,N2,CF4) gases. As the range of working pressure covers diffusive and collisionless modes of charged particles movement, radial distribution of ion current den- sity and its absolute value change significantly. Comparison of the obtained results with the calculations executed using “Global” spatially averaged model and 2D-fluid model is carried out. PACS: 52.77.Bn 1. INTRODUCTION Last years ICP became the conventional basis for creation of various plasma technological devices, in par- ticular for plasma-chemical etching in microelectronics [1]. By the present moment great progress have been achieved both in the field of basic research of ICP physics and in the field of practical reactor design, and focus of ICP application is shifted to development of the techno- logical devices optimized for specific micro- and nanotechnologies with high requirements to the device parameters. It is impossible to satisfy these requirements without detailed experimental researches and improve- ment of ICP mathematical models. This paper reports the results of systematic ex- perimental researches of the universal module of plasma- chemical and ion-plasma etching based on ICP reactor with additional RF electrode biasing developed in the Kharkiv National University. 2. EXPERIMENTAL SETUP A schematic diagram of the experimental setup used in our investigation is shown in Fig. 1. The discharge ves- sel has a radius R = 7 cm and height L = 6 cm. The side- wall of the vessel is made of metal. The glass top cover and the inductive coil is cooled by air flow created by a fan. The vessel is evacuated by a turbomolecular pump down to a base pressure of about 10-6 Torr. The ex- periments were performed using argon in the pressure range 0.3…300 mTorr. The RF eld is induced by a three-turn spiral copper coil cooled by air. The capacitive coupling is damped by a grounded electrostatic shield. RF power in the range 50…500 W at 13.56 MHz is coupled to the coil via a matchbox. Measurement of the ion current density j was carried out adjacent to the grounded work surface, here a sub- strate holder, using a at probe of 1×1 cm with 5mm mica guard ring around added to avoid edge effects. We as- sume here that the probe current in mA represents the ion current density in mA/cm2. The probe could be moved in the radial direction by a coordinate drive. Second probe of the same design was mounted stationary on the chamber side wall (see Fig.1) allowing j measurement during etch- ing process. The ion saturation regime was used. In the power range of interest the thickness of the near-probe layer is negligible in comparison with the probe dimen- sions, and is justi ed by excellent probe current saturation at probe potentials lower than -15 V. On the other hand, much more negative potentials may cause ionization cur- rent gain under high pressures. Thus, in all experiments a negative probe bias of -25 V in respect to the chamber was used. 3. EXPERIMENTAL RESULTS 3.1. ARGON Typical radial pro les of the ion current density j at the substrate holder are presented in Fig. 2 at various ar- gon pressures. Measurements were carried out at RF power of 200 W. It has been found, that in the power range 50-500W j is proportional to the power, and shape of radial profile j (r) practically does not change. As shown in Fig. 2, for pressure p < 20 mTorr the ra- dial pro le of j is convex, maximizing at the discharge axis. For p < 5 mTorr, the pro le remains practically un- changed with further pressure decrease, only its magni- tude changes. For p > 20 mTorr, the j pro le becomes concave, with off-axis maximums. In this range the ratio of the peak density to the axis density increases with the pressure. There is relatively high uniformity of j in the region r < 0.8R for p 200 mTorr. Fig. 1. Schematic diagram of the ICP reactor 190 The dependence of j at r = 0 on the neutral gas pres- sure is shown in Fig. 3, in comparison with theoretical results. In the figure two regions are clearly seen: 1) low pressure region where mean free path of the charged par- ticles is comparable or higher then the plasma dimen- sions, so the particle motion is mostly collisionless; 2) high pressure region where the mean free path is lower, particle motion is collisional, and diffusive approach is more appropriate. It is also found that the magnitude of j is proportional to the RF power absorbed by plasma and the shape of the j radial pro le has weak dependence on the power value. 3.2. MOLECULAR GASES On Fig. 4, 5 dependences of the ion saturation current of the wall probe j, amplitude of the inductor RF voltage Uind on pressure of working gas at RF power = 200W for different gases are presented. Apparently from the graphs the dependences are essentially different for argon and for the molecular gases. We have monotonic j in- crease and Uind decrease with pressure growth for argon, whereas for molecular gases both at high and at low pres- sures the ion saturation current Iprobe monotonously de- creases. For argon ion current is always higher, Uind is always lower, and the range of effective ionization is more then order higher at pressure scale. 3.3. LANGMUIR PROBE MEASUREMENTS For measurement of local plasma parameters a Lang- muir probe was used. The probe was placed on the cham- ber axis approximately 2 cm higher the substrate holder. Measuring of the probe traces and the probe data process- ing was done using the “PLASMAMETER” device. All the presented here results are measured with pure argon feeding at RF power 200W. Fig. 6 shows evolution of electron energy distribution 0 10 20 30 40 50 60 0 5 10 15 20 25 30 Argon 2.8·10-4 3.5·10-3 7·10-3 1.7·10-2 p = 3.3·10-2 Torr 8·10-2 1.7·10-1 2.7·10-1 j, m A /c m 2 R, mm Fig. 2. Radial distributions of the ion current density to the chamber bottom (P = 200W) 10-4 10-3 10-2 10-1 100 0 3 6 9 12 15 Ar CF 4 N2 O 2 j, m A /c m 2 p, Torr Fig. 4. Ion current to the wall probe vs. pressure for different gases (P = 200W) 0 10 20 30 40 50 60 10-5 10-4 10-3 10-2 10-1 Electron energy, eV EE PF , a rb . u ni ts 10 9 8 7 6 5 4 3 2 1 10 987 65 1) p = 5·10-2 Torr 2) p = 2·10-2 Torr 3) p = 1.3·10-2 Torr 4) p = 7·10-3 Torr 5) p = 4·10-3 Torr 6) p = 2·10-3 Torr 7) p = 1·10-3 Torr 8) p = 7·10-4 Torr 9) p = 5·10-4 Torr 10) p = 4·10-4 Torr 4 321 Fig. 6. Evolution of electron energy spectrum versus pres- sure change 10-4 10-3 10-2 10-1 0 5 10 15 20 25 30 35 wall probe Collisonal limit Argon bottom probe j, m A /c m 2 p, Torr 2-D fluid model Global model Collisonless limit Fig. 3. Ion current to the bottom and the side wall probes on argon pressure in comparison with theoretical data 10-4 10-3 10-2 10-1 100 0.0 0.5 1.0 1.5 2.0 2.5 O2 N2 CF 4 Ar U in d, k V p, Torr Fig. 5. Inductive coil voltage vs. pressure for different gases (P = 200W) 191 10-4 10-3 10-2 10-1 100 1010 1011 1012 1013 0 1 2 3 4 5 6 7 8 9 Global model 2-D fluid model Ne T e El ec tro n de ns ity , c m -3 Argon pressure, Torr E le ct ro n te m pe ra tu re , e V Fig. 7. Electron density Ne and temperature Te in the chamber center vs. argon pressure. Bold lines – experi- mental results with pressure change. On can see the monotonic decrease of mean electron energy with the pressure growth. At pressures below 2 mTorr the electron energy spectrum became clearly two-temperature, at higher pressures it is Maxwellian with damped tail, and at highest pressures it have Druevestain-like shape. Electron density Ne and temperature Te in the chamber center vs. argon pressure are shown in Fig. 7. Experimen- tal results presented with bold lines. As one can expect from general gas discharge theory, we have monotonic decrease of the electron temperature and increase of the electron density with the pressure growth in the whole researched pressure range. 4. COMPARISON TO THEORY In Fig. 3 and 7 the described above experimental data are shown in comparison to theoretic results. The well known spatially averaged “Global” model [2] was used as well as 2-D fluid model described in detail in [3]. Ob- viously the Global model matches the experimental data at low pressures (excluding the lowest pressures near the discharge distinction where power loss grows in the in- ductive coil decreasing the power absorbed by plasma), whereas the fluid model is good for high pressures ac- cording to the validity condition of the diffusive ap- proach. ACKNOWLEDGEMENT This work was supported by Ministry of Industrial Policy of Ukraine, Project 92373/60. REFERENCES 1. J. Reece Roth. Industrial plasma engineering. Institute of Physics Publishing, Bristol, UK, 2001. 2. M. A. Lieberman and A. J. Lichtenberg. Principles of Plasma Discharges and Materials Processing. New York: Wiley, 1994. 3. I.Denysenko, S.Dudin, A.Zykov, N.Azarenkov. Ion flux uniformity in inductively coupled plasma sourses// Physics of Plasmas. 2002, v.9, N11, p. 4767-4775. . , . , A. . , . - - . ( , , ), ( , ) . (Ar) (O2,N2,CF4). , . . , . , . , . - - . ( , , ), ( , - , ) - . (Ar) (O2,N2,CF4). , - .