Локализация неисправных подсхем в линейных и нелинейных схемах электронных устройств
Diagnosing the operational state of electronic devices (ED) for various purposes is an important technical task. In the production plan and in the process of implementation, this task is significantly complicated by the need to obtain estimates of the state of the diagnosed object directly in the co...
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| Datum: | 2017 |
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| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | rus |
| Veröffentlicht: |
Kamianets-Podilskyi National Ivan Ohiienko University
2017
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| Online Zugang: | http://mcm-tech.kpnu.edu.ua/article/view/121748 |
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| Назва журналу: | Mathematical and computer modelling. Series: Technical sciences |