APA (7th ed.) Citation

Sun, H., Ma, X., & Hu, C. (2016). Stamp stress analysis with low temperature nanoimprint lithography. НТК «Інститут монокристалів» НАН України.

Chicago Style (17th ed.) Citation

Sun, Hongwen, Xiaochao Ma, and Chenhui Hu. Stamp Stress Analysis with Low Temperature Nanoimprint Lithography. НТК «Інститут монокристалів» НАН України, 2016.

MLA (8th ed.) Citation

Sun, Hongwen, et al. Stamp Stress Analysis with Low Temperature Nanoimprint Lithography. НТК «Інститут монокристалів» НАН України, 2016.