Shybiko, Y., Shaykevich, I., & Melnichenko, L. (2006). Angular dependences of ellipsometric parameters of thin Cr and Ti films under surface polariton excitation. НТК «Інститут монокристалів» НАН України.
Chicago Style (17th ed.) CitationShybiko, Ya.A, I.A Shaykevich, and L.Yu Melnichenko. Angular Dependences of Ellipsometric Parameters of Thin Cr and Ti Films Under Surface Polariton Excitation. НТК «Інститут монокристалів» НАН України, 2006.
MLA (8th ed.) CitationShybiko, Ya.A, et al. Angular Dependences of Ellipsometric Parameters of Thin Cr and Ti Films Under Surface Polariton Excitation. НТК «Інститут монокристалів» НАН України, 2006.
Warning: These citations may not always be 100% accurate.