APA (7th ed.) Citation

Aliev, R., Mukhtarov, E., & Olimov, L. (2010). A non-destructive method for measuring the depth of occurrence of the p-n junction of semiconductor photoelectric structures.

Chicago Style (17th ed.) Citation

Aliev, R., E. Mukhtarov, and L. Olimov. A Non-destructive Method for Measuring the Depth of Occurrence of the P-n Junction of Semiconductor Photoelectric Structures. 2010.

MLA (8th ed.) Citation

Aliev, R., et al. A Non-destructive Method for Measuring the Depth of Occurrence of the P-n Junction of Semiconductor Photoelectric Structures. 2010.