APA (7th ed.) Citation

Tatyanenko, N. P., Roshchina, N. N., Gromashevskii, V. L., Svechnikov, G. S., Zavyalova, L. V., & Snopok, B. A. (2018). Semiconductor surface spectroscopy using transverse acousto-electric effect: Role of surface charge in photo-processes at ZnS/Si interface.

Chicago Style (17th ed.) Citation

Tatyanenko, N. P., N. N. Roshchina, V. L. Gromashevskii, G. S. Svechnikov, L. V. Zavyalova, and B. A. Snopok. Semiconductor Surface Spectroscopy Using Transverse Acousto-electric Effect: Role of Surface Charge in Photo-processes at ZnS/Si Interface. 2018.

MLA (8th ed.) Citation

Tatyanenko, N. P., et al. Semiconductor Surface Spectroscopy Using Transverse Acousto-electric Effect: Role of Surface Charge in Photo-processes at ZnS/Si Interface. 2018.