Liashuha, Y. (2016). Information technology and patent-licensing of the National Scientific Center "Institute of Metrology".
Chicago Style (17th ed.) CitationLiashuha, Yu. Information Technology and Patent-licensing of the National Scientific Center "Institute of Metrology". 2016.
MLA (8th ed.) CitationLiashuha, Yu. Information Technology and Patent-licensing of the National Scientific Center "Institute of Metrology". 2016.
Warning: These citations may not always be 100% accurate.