Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy
Збережено в:
| Дата: | 2016 |
|---|---|
| Автори: | , , |
| Формат: | Стаття |
| Мова: | English |
| Опубліковано: |
2016
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| Назва видання: | Semiconductor Physics, Quantum Electronics and Optoelectronics |
| Онлайн доступ: | http://jnas.nbuv.gov.ua/article/UJRN-0000714433 |
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| Назва журналу: | Library portal of National Academy of Sciences of Ukraine | LibNAS |
Репозитарії
Library portal of National Academy of Sciences of Ukraine | LibNAS| id |
open-sciencenbuvgovua-52155 |
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open-sciencenbuvgovua-521552024-02-29T13:04:54Z Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy S. S. Ponomaryov V. O. Yukhymchuk Ya. Valakh 1560-8034 2016 en Semiconductor Physics, Quantum Electronics and Optoelectronics http://jnas.nbuv.gov.ua/article/UJRN-0000714433 Article |
| institution |
Library portal of National Academy of Sciences of Ukraine | LibNAS |
| collection |
Open-Science |
| language |
English |
| series |
Semiconductor Physics, Quantum Electronics and Optoelectronics |
| spellingShingle |
Semiconductor Physics, Quantum Electronics and Optoelectronics S. S. Ponomaryov V. O. Yukhymchuk Ya. Valakh Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy |
| format |
Article |
| author |
S. S. Ponomaryov V. O. Yukhymchuk Ya. Valakh |
| author_facet |
S. S. Ponomaryov V. O. Yukhymchuk Ya. Valakh |
| author_sort |
S. S. Ponomaryov |
| title |
Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy |
| title_short |
Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy |
| title_full |
Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy |
| title_fullStr |
Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy |
| title_full_unstemmed |
Drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning Auger microscopy |
| title_sort |
drift correction of the analyzed area during the study of the lateral elemental composition distribution in single semiconductor nanostructures by scanning auger microscopy |
| publishDate |
2016 |
| url |
http://jnas.nbuv.gov.ua/article/UJRN-0000714433 |
| work_keys_str_mv |
AT ssponomaryov driftcorrectionoftheanalyzedareaduringthestudyofthelateralelementalcompositiondistributioninsinglesemiconductornanostructuresbyscanningaugermicroscopy AT voyukhymchuk driftcorrectionoftheanalyzedareaduringthestudyofthelateralelementalcompositiondistributioninsinglesemiconductornanostructuresbyscanningaugermicroscopy AT yavalakh driftcorrectionoftheanalyzedareaduringthestudyofthelateralelementalcompositiondistributioninsinglesemiconductornanostructuresbyscanningaugermicroscopy |
| first_indexed |
2025-07-17T22:57:52Z |
| last_indexed |
2025-07-17T22:57:52Z |
| _version_ |
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